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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic, V" d/ @( t+ K1 y
devices in plastic luminaires4 e, `- w- X' [& v+ B- h4 y
The test applies only to luminaires with a thermoplastic housing not fitted with an extra q! V- K& C* e+ P& T
mechanical temperature-independent device as per 4.15.2.6 }) F5 X' M+ N0 F6 h
' X& g5 W T" i/ c5 }, ?, f7 d5 q
12.7.1 Test for luminaires without temperature sensing controls+ T, T, }4 X. {3 p& @$ f. s; k- g
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
; a0 j0 k# {5 g( ]" P12.4.1. In addition, the following also applies.& w0 _" O1 @8 ^% J3 a# \
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be# s; p: b+ K* u. O
subjected to abnormal conditions (see item a) of 12.5.1).
@5 I5 c- _" p( b7 lThe circuits which have the most thermal influence on the fixation point and exposed parts
) {4 Z5 Z+ R3 R9 qshall be chosen and other lamp circuits shall be operated at rated voltage under normal
$ {% V" ]% z+ \' x+ N& U* `conditions.
p" I$ [! t& S+ EThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
' ` m; v1 p; x6 Aor the maximum of the rated voltage range). When conditions are stable, the highest winding
* ]; ~1 s' Q1 z" G. J. {) u1 e8 \4 x( xtemperature and highest temperature of fixing points and most thermally influenced exposed
0 o% u1 o& R9 o4 t8 aparts shall be measured. It is not necessary to measure the temperature of small wound
$ n+ ]* w9 h4 _- I) _2 \devices that are incorporated within electronic circuits.8 }: i/ z+ p5 J' ]; T& B* p
Compliance2 e9 z7 Z0 C* H0 U+ L8 k
The values of the ambient temperature and the temperature measured at 1,1 times (the rated" |6 ~: o+ W1 w7 L
voltage or the maximum of the voltage range) are used for the linear regression formula in
$ B# g' b) v' m+ z! i: K, jcalculating the temperature of fixing points and other exposed parts in relation to a& q; z* D3 ~- V; G% Q
ballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the' E) w8 i N+ g0 z0 _
temperature of the deflection under load of the material in accordance with method A as% ]8 B- a0 X1 z0 {: t/ d. r
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection
3 {" r* u7 R1 U0 dunder load." X& |8 k. `/ J7 s- ?9 ]
12.7.2 Test for luminaires with temperature sensing controls internal/external to the
1 X2 c, K" J& J8 x: h7 A, Z, b. tballast or transformer6 Q' M' s7 R& c. h9 z
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.# q0 H8 O8 M% R/ m& k
1 F/ x3 w; L" l4 z6 A! @' aThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily
* Z+ z+ ]4 @: `5 [increasing current through the windings until the temperature sensing control operates.
4 K$ K5 X6 O0 n! f& v7 |Time intervals and increments in current shall be such that thermal equilibrium between- p5 x1 b* \& n% C7 L
winding temperatures and temperature of fixing points and most thermally influenced exposed
' a6 g, q# T8 a+ T) |parts is achieved as far as is practicable. During the test, the highest temperature of the spots
# `2 B1 N# f' h1 ?0 P# Otested shall be continuously measured.
, z8 b1 W/ A8 U; B) vFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six6 L7 M2 n; }8 N4 @; D
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out2 a7 r2 c5 W/ l1 a0 L2 Y- H
shall be reset.; f' Z. e4 y& H* `/ e& L3 ^
For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a( b$ B ?3 z$ {' o
stable temperature is achieved.
3 i3 y6 K! [+ d; A, qCompliance
8 Y& Q$ y1 g+ {: yThe highest temperature of the fixing points and most thermally influenced exposed parts,
$ G' `4 H# n+ @- z6 rshall not exceed the temperature of deflection under load of the material according to the& m0 p- `7 k9 |" A9 Y
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
" P( M j8 E; \thermal cut-outs, and auto-reset thermal cut-outs.
0 }+ N9 P' w* OIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
% p! m& `' N" d8 f3 ANOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the
2 U' Z# U d8 B" K, Tmounting surface.
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NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.2 a( L$ q3 K& P' X- L% n
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
3 z- d2 c. v! z8 l2 d rparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
0 x" N4 d/ [6 ]+ ] ?standard.! |: n5 ~% F6 [. t
NOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on
- U1 k+ ]( g# F O' w7 U: \the internal surface of a luminaire enclosure not the outer surface.* Y# _5 a* k% D, I
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
: |0 q. s$ \4 X# Dmechanical load and no mechanical load.
) g; Q0 l* s }4 U: }NOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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