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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic, M( K8 p% h. f2 u- I
devices in plastic luminaires$ o6 U0 j c& @) Y# m+ ^$ D5 ?1 u
The test applies only to luminaires with a thermoplastic housing not fitted with an extra$ |. N9 p, Z g! s! }: X0 j
mechanical temperature-independent device as per 4.15.2.
I1 @3 l; ^6 i; m( L% C$ D! ?! C- k) T
1 U! ?4 z/ ]8 ~& O3 E7 k, a8 w12.7.1 Test for luminaires without temperature sensing controls+ B! k& y* h. D) C( x
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of# v' J* ^5 z6 B9 Y! b% k
12.4.1. In addition, the following also applies.8 l- u: p8 M0 ?9 w
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be% L7 U7 Q6 P6 b' o( Z( r6 Z
subjected to abnormal conditions (see item a) of 12.5.1).5 l# A% c5 Z3 E
The circuits which have the most thermal influence on the fixation point and exposed parts: _8 q/ C w, _
shall be chosen and other lamp circuits shall be operated at rated voltage under normal
# n8 w) x& Q$ K( \9 |+ xconditions.
3 }0 O0 c* ?/ _' S8 ~; pThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
0 N" l4 J9 Y ~5 N1 w: vor the maximum of the rated voltage range). When conditions are stable, the highest winding
$ A/ d) C3 ]% ktemperature and highest temperature of fixing points and most thermally influenced exposed9 U Z: d" `" z! g; O" A
parts shall be measured. It is not necessary to measure the temperature of small wound
9 H; _# p& f6 c( i9 o' p# V. ~devices that are incorporated within electronic circuits.
+ e5 H& V9 ]- \2 |Compliance) O4 ~, _0 C% w% h0 R- q2 E
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
$ L& k J1 U$ ]; K, ?voltage or the maximum of the voltage range) are used for the linear regression formula in& l5 A, R3 r' a4 c) W: y3 Z9 n
calculating the temperature of fixing points and other exposed parts in relation to a$ J1 p- `8 `- ], _" ~3 `: b0 ^( a
ballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
# L2 `) o: [5 w' C. Rtemperature of the deflection under load of the material in accordance with method A as* E/ A% M) a# `3 B
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection% f' E7 E+ t( {; K, V5 Z
under load.
* |. \' S( o4 g$ Z9 z12.7.2 Test for luminaires with temperature sensing controls internal/external to the
7 F; }" |2 I4 Z8 i1 r# N2 k8 \ballast or transformer
: `; d/ p4 f% n1 C7 S+ kThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1." ~, ?1 _" g/ c/ N' J, t
2 `+ e9 ^8 b' c/ Z3 E \0 z
The circuits subjected to abnormal conditions shall be operated with a slowly and steadily
) V( W* u- @/ _& v, u0 nincreasing current through the windings until the temperature sensing control operates.4 G3 G. ^" Q5 f" w; F' i3 F- c2 S
Time intervals and increments in current shall be such that thermal equilibrium between
) ~ t# r- x6 Hwinding temperatures and temperature of fixing points and most thermally influenced exposed8 J7 Q9 d4 }. n
parts is achieved as far as is practicable. During the test, the highest temperature of the spots
3 y: {2 C- X$ U5 `8 Ptested shall be continuously measured.
8 {" |2 h; B' Y" ?3 F: rFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
3 Y' t, u1 c7 x/ X5 L/ ftimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out0 Q0 Y/ D4 v% ]7 @" {# C0 l
shall be reset.
6 E- x! v* A* {- OFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a
/ E- Y: P3 u rstable temperature is achieved.& b$ }0 L7 @+ S& \: M* z
Compliance
, L5 ^7 {# r1 q: P9 Q7 }/ u7 AThe highest temperature of the fixing points and most thermally influenced exposed parts,
1 ?$ U( r: w1 y& f" e2 n+ M/ lshall not exceed the temperature of deflection under load of the material according to the
; o" O1 Q2 a- e( i! y4 |method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset; N& ^5 D5 C4 E5 c5 G5 F2 ~- W/ l
thermal cut-outs, and auto-reset thermal cut-outs.6 r* I1 p+ w. @0 g" X+ ]
In applying the requirements of 4.15 and 12.7 the following notes are to be referred to:' B/ d! F# |- L( u& f9 G" e( A% r: ^
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the
) k8 r- S5 S9 u9 nmounting surface.1 {/ }3 m4 T) u( U E
9 \6 \, J. k$ o- e% j& @, h7 JNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
' H$ g- ^7 q- Z4 I! ?$ TNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or: B5 w: B! B1 l, H9 b
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this& y/ O' n5 o3 b$ b+ [- E
standard.
! y/ b7 n" } j) _- pNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on$ ^1 M* X- C: w6 x
the internal surface of a luminaire enclosure not the outer surface.( x2 y8 B8 P" t5 k, @
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both9 g; j7 _4 F* k( m$ h
mechanical load and no mechanical load.
! O2 `( p7 ] I5 C y0 b. }' C( g$ mNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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