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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic. d7 s7 `% \6 X- k% b' o; h" ?0 _
devices in plastic luminaires
( y. O1 x" [" ^; D4 FThe test applies only to luminaires with a thermoplastic housing not fitted with an extra
) V, c* t# u) y; O$ x ]mechanical temperature-independent device as per 4.15.2.0 l; L H" `2 [+ F+ j/ Z& c) [( }; b
; z( T+ [ L2 W) E
12.7.1 Test for luminaires without temperature sensing controls# S h0 ~1 J2 z! C1 x
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
! K2 g" h$ e+ @2 M9 |1 p' T12.4.1. In addition, the following also applies.5 R% u3 q) p [7 e0 _: K
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
$ r! d$ o5 L( B6 d bsubjected to abnormal conditions (see item a) of 12.5.1).
* r* M" e) Q, {1 I. O/ H/ nThe circuits which have the most thermal influence on the fixation point and exposed parts0 D( x# a" d- y+ r1 Q# }4 \4 ?
shall be chosen and other lamp circuits shall be operated at rated voltage under normal2 {5 g" j6 t- c! ]5 R' n7 D$ |! d5 W
conditions.
2 w9 ~( \7 Z* b5 e1 w6 w# O% ]. vThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage7 |' Y j. ~" W2 F- n, P" l) [
or the maximum of the rated voltage range). When conditions are stable, the highest winding
! E j q9 m$ a; `temperature and highest temperature of fixing points and most thermally influenced exposed7 t) h8 ]" C7 h, V
parts shall be measured. It is not necessary to measure the temperature of small wound8 M9 }5 _- H% y! k' L, t' H; p
devices that are incorporated within electronic circuits.
n! u j E. P3 ?* L v( h4 |Compliance' {1 } e' k1 F% m( h
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
" m+ j! {& _0 W6 Evoltage or the maximum of the voltage range) are used for the linear regression formula in3 R( O8 @, x/ G4 t
calculating the temperature of fixing points and other exposed parts in relation to a
# }: P, N, f+ P5 r1 ]# Uballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
+ W! s2 s; c( f$ Z- [% ]temperature of the deflection under load of the material in accordance with method A as/ `% S, x( J7 g2 [; r, C
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection. o% m/ d! K, L' U: l
under load.8 p7 Y8 H& T7 C7 D3 r+ U9 S
12.7.2 Test for luminaires with temperature sensing controls internal/external to the
& a1 W3 P3 Q% Q' cballast or transformer$ O6 e; i+ d' [- T
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.
/ n& b6 ?& o/ X" }) X$ R
7 [- {5 p/ E! _/ f8 X+ P. I' n2 Y% HThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily# E0 g! ~& m/ g' K+ e7 h$ `; K
increasing current through the windings until the temperature sensing control operates.
# V% @0 B9 ~% \! R( T8 t9 NTime intervals and increments in current shall be such that thermal equilibrium between
7 V! D" r U+ _% c: a4 M2 [1 X8 t; swinding temperatures and temperature of fixing points and most thermally influenced exposed
& Y; h x7 D2 vparts is achieved as far as is practicable. During the test, the highest temperature of the spots
" L% _1 W9 a htested shall be continuously measured.
% X6 ~0 z1 U- b& w& |1 c. {( QFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
- C t% } ]! \: htimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out
& X: ~" o8 z5 Q [% eshall be reset.' v( P' V" n6 Z1 A {
For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a
0 [ @- d; D. P/ P! J( K9 Vstable temperature is achieved.) B0 H* H% o6 k) S- p1 g k+ g8 K
Compliance, K% U" j0 F0 c; {, a/ n9 z% @
The highest temperature of the fixing points and most thermally influenced exposed parts,: n0 K% B* ~) d0 e% z+ c- s
shall not exceed the temperature of deflection under load of the material according to the' h n! q0 ~( q) J3 \6 [$ F; i. I
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
3 O& z9 }; ]) p5 u& hthermal cut-outs, and auto-reset thermal cut-outs.
* `5 D" N% B% v: Q: a2 EIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:' K: e6 g" }' O
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the( o% a6 x0 J W: k; l2 P1 K
mounting surface.* \; \3 \, J) l
0 Q! H$ n% s% ~; K9 mNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.2 L8 V& O( I- ^5 i% L, `1 U
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
* X! ], ?& E+ ~# |* Jparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this: A$ o% d9 Z, o8 {% t. e/ U. R
standard.
2 M4 W& z% p* }: kNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on, U# l8 C' }- n
the internal surface of a luminaire enclosure not the outer surface.
1 r$ | d# V1 l7 W6 UNOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both3 K7 Z0 S, u ~
mechanical load and no mechanical load.
3 M9 ?+ B* ^2 {! _. m( pNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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