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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic/ L0 W- N: J$ y! w% T
devices in plastic luminaires U4 }! a2 T* u+ r
The test applies only to luminaires with a thermoplastic housing not fitted with an extra0 i& [- X b% K: i! C* l. _& \
mechanical temperature-independent device as per 4.15.2.
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/ F$ J" x- J& z12.7.1 Test for luminaires without temperature sensing controls
* K+ P; N2 @" P# u7 nThe luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of) y5 K% P8 P% [' N |
12.4.1. In addition, the following also applies.# Y2 Z" o8 w3 K/ ]8 F$ r6 B
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be- M1 a0 T' D4 Z+ H6 k/ D
subjected to abnormal conditions (see item a) of 12.5.1).! h; \$ A& A6 V
The circuits which have the most thermal influence on the fixation point and exposed parts' j/ g# }. d" E
shall be chosen and other lamp circuits shall be operated at rated voltage under normal
! H& _( ^7 S$ F8 ~ B( u: Uconditions.
8 T8 G5 f- R2 xThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
, `+ T" L' S' d8 Q9 w$ t9 Wor the maximum of the rated voltage range). When conditions are stable, the highest winding& p5 M. {+ ]+ B Z7 Y" B( A7 Y
temperature and highest temperature of fixing points and most thermally influenced exposed
' A6 \' {0 [" m4 ?6 aparts shall be measured. It is not necessary to measure the temperature of small wound4 R3 `0 v5 _( N8 r) u/ \% L
devices that are incorporated within electronic circuits.( g# W/ ?% j1 |$ v6 ~3 E6 c! t% ]
Compliance
0 I5 {0 x4 T' w% FThe values of the ambient temperature and the temperature measured at 1,1 times (the rated& k, K( m# [. u# z: x6 w2 g% E
voltage or the maximum of the voltage range) are used for the linear regression formula in
" ]6 E& m5 \! g( j% ]3 Fcalculating the temperature of fixing points and other exposed parts in relation to a
7 {1 b E$ ]9 f* rballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the# x4 ^$ _2 L: A* p, X) F
temperature of the deflection under load of the material in accordance with method A as4 z* N8 o! r) p" n2 G
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection# j9 u$ H4 Z. k0 K+ l' j+ p
under load.
1 A- f3 W$ w1 q! N. U12.7.2 Test for luminaires with temperature sensing controls internal/external to the
" H% F# Z4 W8 j, dballast or transformer* }' ?' j+ M- T, L9 Z0 N4 {2 G
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.
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The circuits subjected to abnormal conditions shall be operated with a slowly and steadily* Y8 c# G/ i: m. h1 {# A
increasing current through the windings until the temperature sensing control operates.
1 }4 v( \6 C# f! l/ L, VTime intervals and increments in current shall be such that thermal equilibrium between
* W) }3 V' F" ]/ Y; b! l5 pwinding temperatures and temperature of fixing points and most thermally influenced exposed
$ ?* W! [0 b( |2 K9 K- F% s8 Jparts is achieved as far as is practicable. During the test, the highest temperature of the spots
, C' Y3 m! P+ r2 @tested shall be continuously measured.. t V! y/ [) H2 g. [2 [
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six: M( R4 c$ b, h& f4 }. g0 `% X, p W
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out, g$ q1 ?; r, I3 w! v" l6 \
shall be reset.
; G' `8 m$ b( P1 K% C, B6 xFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a8 q8 c0 d- E0 o4 A' d
stable temperature is achieved.
& w% K9 x& J5 y% V5 {' K9 h1 gCompliance( c; M3 N2 C7 @
The highest temperature of the fixing points and most thermally influenced exposed parts,
" o/ y+ g/ X( F2 B/ Y1 x- [2 Yshall not exceed the temperature of deflection under load of the material according to the! \( q1 m: f+ s. g* A
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
) _ }- {: W" q2 f. h2 y. Othermal cut-outs, and auto-reset thermal cut-outs.& X5 b$ W* y" e, n% k- P9 a& M% o
In applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
' \' @6 D! x, h, K; `NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the, _: ~% }, s0 z/ _5 A* `$ w% F) j
mounting surface.' V- |$ x% k. ]! C% q
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NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
1 |. J! j6 g a2 @, C) e9 j8 ?NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
4 V0 {' U, M* c- sparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
5 x7 K7 \' A9 e$ H! A" Xstandard., r$ J: i5 M* M9 t5 s
NOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on9 H7 x# A9 l! i3 m8 h; A) U
the internal surface of a luminaire enclosure not the outer surface.% F& z2 C7 z: W) `. z: J0 w+ a B
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both, ~- p/ E( b1 o
mechanical load and no mechanical load.
5 }2 f7 D8 F- w- E- u7 gNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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