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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic
" ]! I- t1 }, Ldevices in plastic luminaires
$ w* y; p# D8 l3 C3 T5 RThe test applies only to luminaires with a thermoplastic housing not fitted with an extra1 L% _% k; K4 r) C, c' Q: ? b
mechanical temperature-independent device as per 4.15.2.
- [* e: m1 Q$ B/ I7 P: D% o3 g& u" G- R- i
12.7.1 Test for luminaires without temperature sensing controls3 t# P" }' a0 Q$ K1 P2 u$ C
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of: ]4 ?7 {1 V5 }2 e2 d: C5 I
12.4.1. In addition, the following also applies.9 O: \$ Y7 p& Z; S8 e
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be, a L' \: f3 b0 M
subjected to abnormal conditions (see item a) of 12.5.1).
- d- Q/ x! S, V& hThe circuits which have the most thermal influence on the fixation point and exposed parts" ~" T2 V5 M* M: h$ T4 e- Z5 V
shall be chosen and other lamp circuits shall be operated at rated voltage under normal
8 _- _: z0 d8 l% w" y/ Yconditions.# G. k/ o: y0 f' S
The circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage+ n% G. o- M3 q7 Z
or the maximum of the rated voltage range). When conditions are stable, the highest winding
! v8 m* W* b4 o: H/ @8 t! }3 vtemperature and highest temperature of fixing points and most thermally influenced exposed$ v! g4 j% v9 w) K
parts shall be measured. It is not necessary to measure the temperature of small wound
G$ r# L1 d- z1 n: N* ^9 `devices that are incorporated within electronic circuits.
/ p0 P; W; q7 j2 }! RCompliance
_8 L$ K- {) C, g; kThe values of the ambient temperature and the temperature measured at 1,1 times (the rated, }* d! p4 c$ ^6 z
voltage or the maximum of the voltage range) are used for the linear regression formula in0 ~3 t' d6 C( w6 d9 u' ]
calculating the temperature of fixing points and other exposed parts in relation to a
! v. t5 r% r6 d) ?# F/ D0 Rballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the" H/ a" ~2 D* ~( t+ k( H
temperature of the deflection under load of the material in accordance with method A as
% W! t- {! t5 m E7 ydefined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection1 ?7 @5 P- W) R) j R
under load.
. P. G$ N5 h- y7 J2 g12.7.2 Test for luminaires with temperature sensing controls internal/external to the
7 D Q9 g4 u8 u6 c+ Kballast or transformer7 x$ h% R9 l' w9 ?( Z Y
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.4 p* }) v5 ]4 b
( K3 ^# V+ [5 g7 W) {& S
The circuits subjected to abnormal conditions shall be operated with a slowly and steadily
5 p3 ^0 A' {, }5 {! ]! x$ P- bincreasing current through the windings until the temperature sensing control operates.
/ e$ ]7 A8 N0 GTime intervals and increments in current shall be such that thermal equilibrium between% j7 N; c# ], K- @4 M7 C
winding temperatures and temperature of fixing points and most thermally influenced exposed1 {1 P; K0 P8 K4 j2 S, ]% _
parts is achieved as far as is practicable. During the test, the highest temperature of the spots6 I# x5 ]8 H0 q; r3 i) [
tested shall be continuously measured.& w9 @6 L5 M! f6 x: r" t% x9 ^+ a
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six5 G% I# u3 L- N0 m! H0 f% g, e7 z
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out2 n" q7 T- `6 X2 b. f3 c) U
shall be reset.
* o8 A, e- M) a" @For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a
4 z* m! _: M0 S; ?! S7 y7 ustable temperature is achieved.; p( o6 u* I% O% `6 Z* N+ g- c5 L" H
Compliance3 i q3 v0 ]/ z8 a5 H' Z( H! J
The highest temperature of the fixing points and most thermally influenced exposed parts,7 I' [7 J4 X* t/ L+ I
shall not exceed the temperature of deflection under load of the material according to the- ?! w- C% H$ X X$ [& x9 s. M2 J( i
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
( s2 h) U- l4 Qthermal cut-outs, and auto-reset thermal cut-outs.
! I& G" N: Y! D! \- p& d0 oIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
6 T+ p. q+ l3 W( N. \3 VNOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the
9 ~, _) L% A, u1 _9 Y2 |3 emounting surface." q( b, a z% o- M9 j0 K. y
/ j% a! ?8 T. ]& T
NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.$ q- C; ~3 j/ X, J
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or0 C6 R7 [- s7 w! z
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this/ y) ~# H2 |+ F
standard.
r6 o$ |+ ?5 J( w: l, n( t# vNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on9 ~9 D3 B8 i4 E7 g; k- f
the internal surface of a luminaire enclosure not the outer surface.+ E) N) R* x. |
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both' v( P. Z2 J2 M% k/ ^/ {' D; t
mechanical load and no mechanical load.
& n( N: m; d5 ANOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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