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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic" Q8 ~; K: \3 v& S/ O! o
devices in plastic luminaires# [2 X5 i' \, O$ }* X, k0 M
The test applies only to luminaires with a thermoplastic housing not fitted with an extra
- \( h( R6 e9 `6 D5 v; w/ J; nmechanical temperature-independent device as per 4.15.2.
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12.7.1 Test for luminaires without temperature sensing controls& S3 k5 P% b* w5 o/ s! `
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of6 L3 Y3 S7 ~7 l4 x6 Q9 U
12.4.1. In addition, the following also applies.3 `. n }5 a# Q) z6 x0 ~
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
" T* @+ Z) L$ h+ t( nsubjected to abnormal conditions (see item a) of 12.5.1).
! ?, P, u4 L8 a! I7 B& dThe circuits which have the most thermal influence on the fixation point and exposed parts
+ o2 {7 R! G4 H! fshall be chosen and other lamp circuits shall be operated at rated voltage under normal6 S: }' T, \0 o4 ]
conditions.
: S: P$ F$ L& t" jThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
- a3 {6 K) X, w5 K3 Bor the maximum of the rated voltage range). When conditions are stable, the highest winding5 w+ a+ u2 i! _$ M$ |7 s
temperature and highest temperature of fixing points and most thermally influenced exposed7 i8 ?. Z' o1 I: s; ?7 q
parts shall be measured. It is not necessary to measure the temperature of small wound
( B1 g# h5 F* R5 }# Rdevices that are incorporated within electronic circuits.* s0 u4 s1 Q6 d' }% [% t9 ~
Compliance$ X& ^* `% W( j9 E+ \, V
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
8 Q3 l" e6 C7 j. W; R: l9 E3 jvoltage or the maximum of the voltage range) are used for the linear regression formula in
+ O! E% V+ Y( @, j/ Ncalculating the temperature of fixing points and other exposed parts in relation to a
* |( i' S/ b5 \; w$ Z) Hballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the5 F2 w- @& s! Y8 i8 C
temperature of the deflection under load of the material in accordance with method A as
" `, z$ G7 y4 T8 Wdefined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection
. C! ^9 Z6 P2 C$ wunder load.
9 o3 S; B Z/ U1 }12.7.2 Test for luminaires with temperature sensing controls internal/external to the! S C* a+ O* |: |( X! r
ballast or transformer
9 ?0 O# @! F$ w. _5 qThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1." ~9 X' J! z Y2 r" \+ N1 Y
+ F5 z- d& s) j3 ?; \0 a' P3 V9 jThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily
8 x& V* [8 o- Y5 Dincreasing current through the windings until the temperature sensing control operates.
+ g- _- G/ i+ U3 |2 YTime intervals and increments in current shall be such that thermal equilibrium between2 |* |" r, L8 c! h; } v" J
winding temperatures and temperature of fixing points and most thermally influenced exposed" J- P n. L* ]- w/ u; i- l2 S. Y4 d
parts is achieved as far as is practicable. During the test, the highest temperature of the spots5 `3 T) c+ M, q# ~
tested shall be continuously measured.3 X( H4 W$ a- d# n1 o
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
, |4 S" ~9 e, J1 ]8 k$ ztimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out
7 V% A% ]- N1 _7 P: g+ m( Tshall be reset.% [) z6 `; B" A1 c3 T' z
For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a! X1 s" d, |$ i$ F5 @
stable temperature is achieved." o4 Q, O$ I3 P6 d! @ x5 N
Compliance0 D4 z8 p8 g% {1 f4 Q
The highest temperature of the fixing points and most thermally influenced exposed parts,; W4 r f1 E- n. g. H
shall not exceed the temperature of deflection under load of the material according to the$ B" \4 G8 d% s3 f
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
" Q+ G; x# t' f9 u& s9 H0 ^- uthermal cut-outs, and auto-reset thermal cut-outs.
- s& D2 j' n S3 C LIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:! E& G" b- W: A+ q; n6 ?
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the# b, o1 v. S; s7 P' |) n! Q/ V
mounting surface.& F% [" b4 M; b5 l+ R
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NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.$ G0 ?0 G: N9 A5 H8 j4 v( y3 K
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or9 R3 P7 C6 K" W e
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this5 D3 s) I' g( S$ C6 B5 L
standard.
& o0 K% O) q9 INOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on: e* f$ I2 k5 n% p0 P
the internal surface of a luminaire enclosure not the outer surface.: i4 C0 v7 L! [, S/ M( s8 @- F
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
! `" P$ `4 Y& Q% r% pmechanical load and no mechanical load.( n' Y& a0 U" M: O9 F
NOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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