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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic
Z9 y3 b; K, W8 Mdevices in plastic luminaires' ?" m. k9 a+ u; t; f
The test applies only to luminaires with a thermoplastic housing not fitted with an extra3 w0 }( g& v2 b
mechanical temperature-independent device as per 4.15.2.% v# ?( |9 `' |
3 U* Q5 l h* g2 X
12.7.1 Test for luminaires without temperature sensing controls
0 A' d7 L3 Q6 _* y. a- l# |The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
2 V& ]. D3 J: s0 G12.4.1. In addition, the following also applies.
6 K) t) K0 z4 ?8 c m20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
: p* E/ K5 q) m: h* h& |3 ^+ Wsubjected to abnormal conditions (see item a) of 12.5.1).8 s2 w/ Q/ p/ M: Z( `6 V
The circuits which have the most thermal influence on the fixation point and exposed parts
2 |& n- S5 T" g0 S9 \$ Ishall be chosen and other lamp circuits shall be operated at rated voltage under normal8 d/ P7 N. S3 i2 ~
conditions.
4 p6 e2 d: w5 p9 N; gThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
" S5 `4 R5 ~5 _1 e4 t8 Bor the maximum of the rated voltage range). When conditions are stable, the highest winding
( F% a3 I# P, L) `- B! Jtemperature and highest temperature of fixing points and most thermally influenced exposed* ^: [4 y8 J9 H: _
parts shall be measured. It is not necessary to measure the temperature of small wound
5 u: U" a9 V4 W$ J- u( Gdevices that are incorporated within electronic circuits.
+ B7 e+ J' D) ]$ L5 h1 d2 m7 P# BCompliance7 m" B4 |9 t1 D7 ^5 _
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
- I3 i5 ]. O3 }; j0 l) Z Mvoltage or the maximum of the voltage range) are used for the linear regression formula in
4 c- y5 q: H* D+ Dcalculating the temperature of fixing points and other exposed parts in relation to a
% G7 f! _! f9 m4 Dballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the" I# y7 t8 `2 f. U
temperature of the deflection under load of the material in accordance with method A as t0 h+ c8 I9 f8 Y' y
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection
# ^8 Z; x; h) B7 n# aunder load.6 D8 I. \& `: n
12.7.2 Test for luminaires with temperature sensing controls internal/external to the
2 p0 G1 U8 @3 ~8 t# O+ Hballast or transformer6 N6 Q0 ]' ?% Z4 k n
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.! Y+ m! |- A; @6 }) V* l
6 n8 V8 w1 L. @: H3 s: IThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily
! g& L# [. C+ k2 Q7 n2 t6 Y- jincreasing current through the windings until the temperature sensing control operates.
# m, D( d: S, {7 HTime intervals and increments in current shall be such that thermal equilibrium between3 y. E4 l3 ]+ e3 w
winding temperatures and temperature of fixing points and most thermally influenced exposed' G1 y) h" `, ^. c4 e
parts is achieved as far as is practicable. During the test, the highest temperature of the spots, C c- H) U: }3 _9 z% j1 Q1 a# Y
tested shall be continuously measured.* ?3 q; e! k/ C7 j$ o
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six) N. l9 u( F+ C$ l: f* X$ h$ h
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out; d7 V: A( X. T9 Q) h4 F
shall be reset.
; {* M6 f1 }/ i$ F8 {' d% nFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a, \, R4 k7 V' I) V
stable temperature is achieved.1 w) c% c4 @* G6 Z
Compliance2 P' J; X: G) S# i/ ~
The highest temperature of the fixing points and most thermally influenced exposed parts,
; O0 I" b) n% w( N& gshall not exceed the temperature of deflection under load of the material according to the
1 i5 y! h' Y$ x& O% S9 F% \method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset, V+ x( X" F) l' \4 ?
thermal cut-outs, and auto-reset thermal cut-outs.
" S$ e3 `0 Y+ n) E- e/ Q, yIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:! ^7 d0 K( W- ?" e! z+ G
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the1 q4 R: h. E) j; y1 U+ I# G
mounting surface.
! l& E6 I g) o, M4 X: \; z6 s, @8 w& W. u( J
NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
0 d9 ~- `1 \$ S1 M6 {: p% yNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
/ }5 \2 h6 u- s* w" Zparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
6 ~1 E; U# d- q! i; m! J# G0 Ustandard.
& s) A& [, N8 @, h9 l T) |NOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on
x8 e1 f( p* ~! G8 e3 Pthe internal surface of a luminaire enclosure not the outer surface.
. c8 d' N# U) P) y# M/ xNOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
, a9 L7 ~. H+ g7 ]) c# y1 omechanical load and no mechanical load.. @+ ^) W, |8 {% U9 ~) K6 h% m" L
NOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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