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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic
, f4 R6 f( g# O" x% odevices in plastic luminaires6 _ _3 F9 M; B: M
The test applies only to luminaires with a thermoplastic housing not fitted with an extra# t. r9 W5 F9 d
mechanical temperature-independent device as per 4.15.2.
( d- ~: N& p2 c* P( |2 |3 C# s, o" e# @
12.7.1 Test for luminaires without temperature sensing controls: f H- d7 x! A, S9 Q7 r8 `4 k1 v
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of" k# y8 y! [* b/ M f$ [
12.4.1. In addition, the following also applies.
6 c! t( Y! w, b4 f/ c' [20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
" X3 b0 |' Y9 O: z/ O* jsubjected to abnormal conditions (see item a) of 12.5.1).8 h2 A# F7 U/ f# Z; Z* S8 @
The circuits which have the most thermal influence on the fixation point and exposed parts
. @1 ~" F! R( V% P' M) \+ R Rshall be chosen and other lamp circuits shall be operated at rated voltage under normal. M! q; `1 P9 u& r6 S. \! N
conditions. ?% t% k6 Y3 Z5 I5 W; x
The circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage8 K/ Y# ^! o1 s
or the maximum of the rated voltage range). When conditions are stable, the highest winding% O! X5 `$ v, S3 I% q5 [- O
temperature and highest temperature of fixing points and most thermally influenced exposed
. w. o. ~9 S3 Q% [parts shall be measured. It is not necessary to measure the temperature of small wound
, y! R" h$ u( C6 ] ]% q+ Zdevices that are incorporated within electronic circuits.8 j' D" p+ w! H2 f. R; a
Compliance4 C. d9 g" m* g1 |9 o
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
# v- B5 P' X3 h/ ~4 k4 Evoltage or the maximum of the voltage range) are used for the linear regression formula in7 m# e3 _/ \9 t @) j$ f* E6 P" t
calculating the temperature of fixing points and other exposed parts in relation to a9 n3 h% t: n# ^' E! @
ballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the, J* D# p; s% J4 L2 i, X. K
temperature of the deflection under load of the material in accordance with method A as0 ?$ Y. S2 {4 m& w7 N2 B
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection9 k, B' F1 ]. z6 i$ \; \
under load.
) h) ?% Z% m& h2 _12.7.2 Test for luminaires with temperature sensing controls internal/external to the
, j- k, K r2 H, y4 @' B2 Vballast or transformer
& h4 a0 k- F5 {5 FThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1. A$ I& V g9 w
: |5 o/ ^3 D+ g- j2 W( W8 t, B2 MThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily
, D* h/ J' ^ Z+ g# |increasing current through the windings until the temperature sensing control operates.$ C7 \% U: H5 d
Time intervals and increments in current shall be such that thermal equilibrium between# C( y n# r& S
winding temperatures and temperature of fixing points and most thermally influenced exposed% E7 o" m+ U5 Z8 b6 y2 T
parts is achieved as far as is practicable. During the test, the highest temperature of the spots
7 J. M+ n/ T, o0 qtested shall be continuously measured.
. K( [* y1 x" t7 q/ d( x) O+ XFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
/ m3 b4 c& t2 H2 \8 O0 ]: }0 otimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out/ P. J$ u6 n$ O, F) u* `
shall be reset.
1 y/ k! B1 N% v z; J' t0 J' M8 gFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a7 \6 T; e0 x: U% r
stable temperature is achieved.2 b0 @6 p# t- b, T! }7 M" \
Compliance, [& Q1 V0 ? ~
The highest temperature of the fixing points and most thermally influenced exposed parts,
+ v: l5 h2 ^8 S. O! @/ c# m* Yshall not exceed the temperature of deflection under load of the material according to the
) B3 ~. D1 t2 d" M/ [method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
- C4 t2 N* _- }' Ithermal cut-outs, and auto-reset thermal cut-outs.' M4 t% t. n9 ~- P/ _# w. v1 R
In applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
1 f& f1 O! n/ q8 PNOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the! h# N* p" x3 |' o! Z# C
mounting surface.
, i' y! f! c# J1 X. x3 {+ R1 {( d
! a8 P/ S& B" |2 G! g. S6 ], ENOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
' p6 I1 i) l# i. YNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
$ ^" l0 |* r* \. _7 E" N2 cparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
) D+ y. c& Q. mstandard.
6 R9 Y+ X- D7 n( y, U) yNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on% {9 d T6 i5 {. f" `
the internal surface of a luminaire enclosure not the outer surface.
& m1 ~! n# @& q* e" @3 h! A8 lNOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
$ m. G; W) V' [0 ~& N/ ]; v" N jmechanical load and no mechanical load.% A% v2 \3 h( ~7 K3 m* |
NOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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