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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic4 P, z5 c/ h3 P$ @
devices in plastic luminaires
: B% s7 t$ v3 nThe test applies only to luminaires with a thermoplastic housing not fitted with an extra
8 J4 M4 R: x( g, @; C7 S, c3 _mechanical temperature-independent device as per 4.15.2.5 M2 ?' B" r0 L: t- S1 \3 G/ k
+ S8 i& @- _# V" Y
12.7.1 Test for luminaires without temperature sensing controls% e2 [6 P# f/ e
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
+ V6 O: N6 N7 i9 U" f* z3 r6 L12.4.1. In addition, the following also applies." w# K% A+ q* F# K4 J/ L
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
6 \' I* M% f0 O% {# P( lsubjected to abnormal conditions (see item a) of 12.5.1).- t8 n* {, H- e0 O& H% _+ C! z
The circuits which have the most thermal influence on the fixation point and exposed parts
( N( v+ V, ^0 b8 C4 k& X/ Ishall be chosen and other lamp circuits shall be operated at rated voltage under normal
+ P% K' }& X, P. Lconditions.* T' e0 e* f- h0 ^; }: m
The circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
" U( R; Z. G ]$ l2 Q' `1 eor the maximum of the rated voltage range). When conditions are stable, the highest winding9 L) @( w5 }/ j' E: T6 X
temperature and highest temperature of fixing points and most thermally influenced exposed+ O1 ^; A/ l4 _( Z, f
parts shall be measured. It is not necessary to measure the temperature of small wound
, s @& Z; y: ^9 O3 [7 Idevices that are incorporated within electronic circuits.
" y' n. H: r G, o ]& MCompliance
5 N0 u0 Z) }2 i/ [. z& tThe values of the ambient temperature and the temperature measured at 1,1 times (the rated
# z3 h& T. ~* Z8 E% B, h/ `4 Pvoltage or the maximum of the voltage range) are used for the linear regression formula in
% |# q. `$ K" F9 q& a- h. `calculating the temperature of fixing points and other exposed parts in relation to a
( `8 {4 X' b& r+ o3 G) Xballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
/ J* @: t3 h) F7 g$ ]temperature of the deflection under load of the material in accordance with method A as! ?" e9 F' _' X) R
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection
& K, {4 @/ \( M$ l2 u% Junder load.
* m d7 B0 n! e12.7.2 Test for luminaires with temperature sensing controls internal/external to the( m) T1 _$ l( m
ballast or transformer
0 e6 ?9 `( c3 Z0 J# D- RThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.0 g. R$ X# f, P' v) H
) f4 I4 J$ F5 ^- Z2 AThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily1 \/ f9 N0 n6 i; H; R# \5 X" s) }
increasing current through the windings until the temperature sensing control operates.
* e* o, Y9 Z# i8 c8 y/ pTime intervals and increments in current shall be such that thermal equilibrium between
0 c/ g0 {) L0 o1 O5 ewinding temperatures and temperature of fixing points and most thermally influenced exposed
! m- V/ U' ~6 Z, O% W1 {parts is achieved as far as is practicable. During the test, the highest temperature of the spots4 W9 c; o& M0 P- l# \" }
tested shall be continuously measured.
+ A- m/ V2 u' RFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six* b0 P9 d) a: H3 f" U8 f
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out9 V3 s% a1 u0 R8 r6 `6 m: g# Z+ M
shall be reset.1 M. r' F( Y0 j1 Z$ z) a6 h2 X
For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a
4 @, \6 G5 J8 U! Y9 dstable temperature is achieved.
- Z7 I0 ]: I3 X7 H% VCompliance* h+ f' s% R! p, b3 T' r+ D
The highest temperature of the fixing points and most thermally influenced exposed parts,+ r. R; V5 l' x, X9 q I7 l
shall not exceed the temperature of deflection under load of the material according to the6 J) C8 p( G8 n) k8 Q+ n( N
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset" a0 `6 G9 u# D
thermal cut-outs, and auto-reset thermal cut-outs.
. [, W+ v- z1 i% a8 GIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:+ G- h/ G, a0 Z
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the( b3 i3 r; C5 C' S9 D
mounting surface.
! Y9 |/ G! U) Y) \
* B1 J( |% D' `$ e$ GNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
, M: \5 E J G7 X& X( w# LNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or5 A6 O7 q% q/ K% l. l% s
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
$ J/ T i8 d2 {1 Vstandard.
1 P1 x3 p5 M+ O! v7 k' GNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on
5 j4 S+ F! z" q* M, V8 Gthe internal surface of a luminaire enclosure not the outer surface.: D" p. K3 j6 y$ I% B4 f
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
; B7 l# e5 r9 F, |2 q3 e7 b4 L& l$ bmechanical load and no mechanical load.
9 W1 ]! S' y( c& a( `3 WNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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