|
|
12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic
- X# q* n3 a0 G" _devices in plastic luminaires8 ]1 j& [$ e6 [
The test applies only to luminaires with a thermoplastic housing not fitted with an extra
?6 B4 T8 N6 {0 `; u' t3 Amechanical temperature-independent device as per 4.15.2.. Q2 ]' [, Y; K. V
1 A4 B8 @# A7 {5 Q12.7.1 Test for luminaires without temperature sensing controls
S5 _" u9 l' U) o5 gThe luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
1 r q, H* \1 x12.4.1. In addition, the following also applies.& M, k' F, b2 H. A
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be
! `9 i+ G* E* A9 Qsubjected to abnormal conditions (see item a) of 12.5.1).
3 u5 `& P/ p; \1 yThe circuits which have the most thermal influence on the fixation point and exposed parts
- o2 r$ I3 W* f4 nshall be chosen and other lamp circuits shall be operated at rated voltage under normal7 V( {# |3 F2 @' ]3 ]7 i5 n
conditions.
6 R P+ A/ ]* P2 pThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
3 f8 \& S! W3 o- r" Lor the maximum of the rated voltage range). When conditions are stable, the highest winding
8 M% I4 I+ y5 k' P( N! etemperature and highest temperature of fixing points and most thermally influenced exposed
& e0 e7 s7 a% q7 `0 wparts shall be measured. It is not necessary to measure the temperature of small wound) V# H7 C7 b9 O3 T
devices that are incorporated within electronic circuits.
( v; k; U1 o1 OCompliance
6 c! K3 t: Q( [$ `9 ?8 p: ]! XThe values of the ambient temperature and the temperature measured at 1,1 times (the rated2 W# F( [! p2 X
voltage or the maximum of the voltage range) are used for the linear regression formula in
/ V/ H) K( `( G; @calculating the temperature of fixing points and other exposed parts in relation to a
" w4 w4 S# H% yballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
( c- d* ~$ S+ q9 `6 Xtemperature of the deflection under load of the material in accordance with method A as
4 Z7 X3 J/ K4 U. Z* P# x. N f7 Edefined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection, a& V) K+ b- e) o* u! Y- D) E- A
under load.
9 B$ J- g7 v F) ]; ], Y+ ?) U12.7.2 Test for luminaires with temperature sensing controls internal/external to the
* ~, P; V) B; D+ Zballast or transformer
2 Q4 Y! ~6 } d5 L& HThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.
& ?; w# C2 H2 t4 x1 p" s) ~' _. B
/ l: i$ f) z# S8 J% hThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily( [! O% a: J& _" r, N
increasing current through the windings until the temperature sensing control operates.
% |8 v# i) Q$ ]) V6 [. h/ N, uTime intervals and increments in current shall be such that thermal equilibrium between+ x8 \% s: J* P+ ?, E; e
winding temperatures and temperature of fixing points and most thermally influenced exposed
. {4 q2 Y Y; C4 j$ nparts is achieved as far as is practicable. During the test, the highest temperature of the spots: y, B' v8 d6 a! y1 m1 I. T
tested shall be continuously measured.; A" Y) [1 n# e
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six( h, D- }0 e1 v
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out& @9 g' r! c' O( W" W$ w4 b9 W
shall be reset.
4 U4 @) u& Z' s" C( T! M' lFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a$ }3 u* H7 \' J8 l0 n' Z; W( i
stable temperature is achieved.+ X2 z. h) K* A1 n, N* l1 d
Compliance$ q( b/ D! @2 }" E
The highest temperature of the fixing points and most thermally influenced exposed parts,0 W2 e! k! Q/ R5 B+ V
shall not exceed the temperature of deflection under load of the material according to the. A# x, ~* i: I2 k( N
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset. o$ b: T, b' ]) g# ?7 I
thermal cut-outs, and auto-reset thermal cut-outs.7 ]! d3 n9 y; y
In applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
! r9 @9 ?& y O; X8 `* ]8 l9 u' mNOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the
4 v& e7 | O }3 p, Zmounting surface.7 d4 Y& d' a9 R+ t
6 m0 H7 S1 J( B) ^5 }! a/ g1 Q' O
NOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
! V! @, x' i0 V; CNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or* t) p% j) I2 ]7 u8 T
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
2 P1 [( p/ ]' S/ y$ y3 m1 jstandard.
4 t; f2 w9 M, NNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on' W# M, V8 y8 N0 a% }
the internal surface of a luminaire enclosure not the outer surface.
3 N+ ]% a" h* J$ aNOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
2 Q; ~! U+ E' K7 i) Smechanical load and no mechanical load.
4 e( D* R1 r/ q, q c0 xNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 )
窥视卡
雷达卡
发表于 2008-8-26 11:09
显身卡
楼主