|
|
12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic
4 s& g# ]& U. v; c# y. }devices in plastic luminaires, |- b" O2 n- @& w6 `+ e
The test applies only to luminaires with a thermoplastic housing not fitted with an extra# K h! [+ h. d# [" {! T3 C. \% W
mechanical temperature-independent device as per 4.15.2.
$ ]5 S, K4 W! L( T$ h! O) X3 H! z! }; x' W! @) S
12.7.1 Test for luminaires without temperature sensing controls9 u' H, S. P* @; Q
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
( d6 J# i5 s) w6 b( g, _% W12.4.1. In addition, the following also applies.* u/ V4 C" R' S& R' O) M0 o
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be, k, b1 q) T6 a7 O0 p i( _8 ?
subjected to abnormal conditions (see item a) of 12.5.1).3 n4 I9 v' b6 i
The circuits which have the most thermal influence on the fixation point and exposed parts
. b6 d/ d' V9 @$ m0 Tshall be chosen and other lamp circuits shall be operated at rated voltage under normal
5 d8 U) v1 G2 dconditions.
' s+ L( F& a. D j( RThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage5 Y% u# K D; _# y4 C4 v
or the maximum of the rated voltage range). When conditions are stable, the highest winding- T$ B& [& x4 d/ z
temperature and highest temperature of fixing points and most thermally influenced exposed/ Q3 o: ?) ^( t8 u5 q1 p2 Q
parts shall be measured. It is not necessary to measure the temperature of small wound
! q6 H f/ [% F- t- Odevices that are incorporated within electronic circuits.
7 ~3 D3 I* y/ v$ f! i: o- h- b3 ZCompliance
4 h$ {4 t+ ~& H: V! `: c! x7 @The values of the ambient temperature and the temperature measured at 1,1 times (the rated
) Z" W) T, n4 s; u9 o6 a$ T. Qvoltage or the maximum of the voltage range) are used for the linear regression formula in
! c3 L( A$ ?+ |calculating the temperature of fixing points and other exposed parts in relation to a
9 j- l" F& V1 x$ i+ N* U- Eballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the% J8 G' O1 x0 d$ y5 k
temperature of the deflection under load of the material in accordance with method A as' I/ U9 ]" D6 ^+ V
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection
; U4 d2 U, q: munder load.) [9 l( {1 S3 S* t% X6 l7 n
12.7.2 Test for luminaires with temperature sensing controls internal/external to the* R8 D: v- N! s M7 {5 H( S7 [
ballast or transformer V+ s* q- E$ M( _5 f6 D8 w/ a4 M
The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.8 X# O0 R' E& J2 q8 B! I7 | [8 o
/ n" p# Z9 @, N) _1 _9 JThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily- D% S6 \9 I7 @! I P) S" ]0 s! \6 x
increasing current through the windings until the temperature sensing control operates.% @) r/ O4 z" r: W. |. ]2 ]/ l& _1 E
Time intervals and increments in current shall be such that thermal equilibrium between* V! ^; C( f9 Z, A: Z7 Y! C
winding temperatures and temperature of fixing points and most thermally influenced exposed3 @! M6 n l* m2 C7 s
parts is achieved as far as is practicable. During the test, the highest temperature of the spots
0 \+ ~' l% H( i8 m) K9 h/ D8 U& G+ Dtested shall be continuously measured.
, e" Q+ | d$ M0 fFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six8 ^8 W0 T0 }; K1 \
times allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out+ Q% F5 U9 c0 z+ b1 z8 t
shall be reset.
+ F# Q" K5 r" Z7 X$ lFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a( S6 ~1 j0 n# U0 @- d
stable temperature is achieved.5 @% }" h+ }9 m& f/ [
Compliance
# t2 {0 u6 \7 P+ `0 t8 kThe highest temperature of the fixing points and most thermally influenced exposed parts,
7 f) z* [; [/ ?' {; G( Tshall not exceed the temperature of deflection under load of the material according to the1 z2 } O, w1 ^ N
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset- v: a% x. U" u8 z. O
thermal cut-outs, and auto-reset thermal cut-outs.
& E! Y4 C7 i! P4 M p: @In applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
2 k( T) L/ n% ^; a+ wNOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the4 t" Y2 ]) Z5 O$ ?) t
mounting surface.4 \: ?0 ^0 s4 ~8 H+ ~2 Q" K
' U+ N1 X4 |4 o4 k7 QNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.
1 F- F4 g" ~0 UNOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
% S3 Z: c l3 ^( s7 [/ Sparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
, p2 N; W) t% e) z" j9 bstandard.
( t! F$ `$ h/ T& A5 jNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on
- a. ]4 G/ q# j# L6 o3 bthe internal surface of a luminaire enclosure not the outer surface.
8 ]5 T# X) e$ ]* B$ E- F2 h7 ^NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both3 [9 A: U. R9 s: Z
mechanical load and no mechanical load.
$ j7 x+ p9 w, p- g( RNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
|
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 ) 
窥视卡
雷达卡
发表于 2008-8-26 11:09
显身卡
楼主