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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic: ]' J* X0 Q' m1 C/ w
devices in plastic luminaires& ]% k* U; @7 ]
The test applies only to luminaires with a thermoplastic housing not fitted with an extra- i$ t8 K5 \6 g% F" [
mechanical temperature-independent device as per 4.15.2.6 K4 J& a9 i9 S8 k* D5 p
' ~" S! ^7 o$ Q) W
12.7.1 Test for luminaires without temperature sensing controls" p, W% f; A, L
The luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of" w @6 F' P# S4 H/ s) |. {9 j) _
12.4.1. In addition, the following also applies.
$ j' Y5 V1 B6 S- z' G0 i20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be& v! V, L% L& @9 _
subjected to abnormal conditions (see item a) of 12.5.1).
r$ w! C0 N) H( [( R2 ^' yThe circuits which have the most thermal influence on the fixation point and exposed parts
. r$ e. N; y; Z* n6 U- o+ x0 Yshall be chosen and other lamp circuits shall be operated at rated voltage under normal
$ Q( W9 o- F0 z0 v. C7 ~conditions.
( R6 M/ F# {0 K( H: T! P3 lThe circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
' ]! u& y- J9 @8 l8 U" {or the maximum of the rated voltage range). When conditions are stable, the highest winding
0 J9 F" i& N, O0 @3 A7 ^% Stemperature and highest temperature of fixing points and most thermally influenced exposed9 X5 \ M9 p- {
parts shall be measured. It is not necessary to measure the temperature of small wound5 J0 D+ `* i; }" I& K) I
devices that are incorporated within electronic circuits.
! r% h N+ M3 D- ^& x# iCompliance) V+ d$ f. ]/ V0 `% Z/ b
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
3 k/ O& E4 }# o2 p) Nvoltage or the maximum of the voltage range) are used for the linear regression formula in9 @2 L P( U, X& U$ ^
calculating the temperature of fixing points and other exposed parts in relation to a
5 h- g* g, u' {( {0 E/ Y# h7 u5 L5 M. Cballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
8 M2 r$ t" H" k/ otemperature of the deflection under load of the material in accordance with method A as+ ~8 R8 m3 M! O$ B( S& H
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection1 @* A- H7 n- f& e
under load.
7 @# a9 ^* q2 r7 D; o0 N12.7.2 Test for luminaires with temperature sensing controls internal/external to the- A% O' g- n( z9 Y) _
ballast or transformer
7 T" C, f0 }& k" r9 {& r4 jThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.. [ x% A& N; n2 a4 `
* e# X' p% S, [' IThe circuits subjected to abnormal conditions shall be operated with a slowly and steadily
2 F% M( O% }5 k( ~$ Y0 J) ]increasing current through the windings until the temperature sensing control operates.
1 |6 n u# h* c3 j1 S2 oTime intervals and increments in current shall be such that thermal equilibrium between
' p/ K8 ]# m$ u2 q1 W! dwinding temperatures and temperature of fixing points and most thermally influenced exposed
c( j4 N$ |- V9 N. oparts is achieved as far as is practicable. During the test, the highest temperature of the spots
% I7 O6 r( q! `& _. G4 stested shall be continuously measured.0 S( y+ T, g9 e6 f1 x
For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
- y8 c- i g ztimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out
" V& U; y) D! E2 |5 J4 G% A3 j: q/ Ushall be reset.
: t2 a, ~: L" X+ p/ RFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a" u: }& M5 j' P
stable temperature is achieved.1 O$ U5 T. r8 F! r4 i
Compliance3 ?5 h$ I7 e6 k- X
The highest temperature of the fixing points and most thermally influenced exposed parts,: V8 N; y8 v. P g
shall not exceed the temperature of deflection under load of the material according to the; p- @1 t9 Y% S. m
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
) }2 N* I5 Q6 ^. S( Sthermal cut-outs, and auto-reset thermal cut-outs.
' |' z x5 e1 B' u- F. }2 gIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
9 p( Y8 H$ p7 U6 INOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the2 ?9 k/ S1 g) M+ f7 u( S( g
mounting surface.' c9 P6 {9 ]; q) W% v& l# b, U4 e
6 Z, A! ?# \+ q- ~ n8 tNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.- o7 ~" L8 Y4 v$ G2 u
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or# a+ _* c" B9 l; U" q" g- G# y
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this! v0 S( d; d. G; ]! t8 b: {6 {8 t
standard.
. Z( p% s+ w. H. A: r) fNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on
) B% F# O6 m: T" H) J3 athe internal surface of a luminaire enclosure not the outer surface.
: f) _& [% `1 yNOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
$ O+ i. y/ m" B4 {; \$ b* X/ vmechanical load and no mechanical load.
. X w+ {4 S' u. s6 A- f+ v1 ]0 [0 TNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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