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NMX-J-1912 z6 W) @. r4 }) I3 k
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical9 i7 f# ]" B/ X0 Y8 _; r
Conductors – Test Method
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5.1.3 Deformation
0 I q" l3 B2 g# Z2 c* Y5.1.3.1 Insulation! i7 i7 t6 u5 _4 X) l' s1 `
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of1 s3 Q( ~8 \4 R
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a ~ S7 |8 _2 u. Z
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.6 ?6 i8 z# y, M9 w, c: J) L
5.1.3.2 Jacket% @! o3 [( F) J2 A' k1 k
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in \( J" d! v2 c6 d5 [5 t
thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature6 d( P: x. G, D; X ]) G. T
shown in Table 40 for 1 h.
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Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method, \- F8 U4 k* Y
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE." j @* s0 R: ~' N( e# o. ]+ O& p$ V
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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