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NMX-J-191
" G' k2 e2 L! Q5 F( F/ YHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
7 ]) Z+ b5 x7 tConductors – Test Method. Q7 P c# Z; R8 v! C
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# A1 d* Z4 U) B/ U' x9 G( o# k4 |/ ~5.1.3 Deformation5 m% T% k, v5 ~" L& u' n! n
5.1.3.1 Insulation
. D; D. ^3 |6 D+ w. c; M% w: z0 ^The insulation on single-conductor wires, and on the individual conductors (separated, in the case of' g: _9 H) ~: q" r- B$ m* F
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a F( w0 d9 n& ?& n" o
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.$ E: O7 O! y1 k% e7 [
5.1.3.2 Jacket' [# R9 \ f: ~# g* R# F7 X5 L- o
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in! m3 h u0 m) Q6 |% Z) ~
thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature: {, T( |- O) I; O1 v. \2 f
shown in Table 40 for 1 h.
: f* @$ Q' j+ s5.1.3.3 Method
( T) l8 U: H: g( X# \4 N: DCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method' A8 V/ l& X3 X" \* i* @( Y
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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