|
|
NMX-J-191
* i2 k8 `; m4 ~# e/ O) i# b/ `Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
( U4 I7 @5 b8 @0 o ~' ? M* tConductors – Test Method5 I* X, R" W2 `8 a+ a- Q, A; X
1 t6 ?7 R4 `9 O7 W; f
1 c1 }4 ]0 u! y; \& ^# C1 S
5.1.3 Deformation: |6 c7 G* A5 h; X! d! r5 B
5.1.3.1 Insulation9 g# d6 W& c9 m+ }0 c
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of' ?, R A/ e- [0 u0 w/ ]+ F6 m2 p
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a% O' e `5 T- V/ S5 O5 W
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.) Q( [" s+ q/ W* n/ z
5.1.3.2 Jacket
( r$ m- H; h2 Z6 xSmoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
8 k6 |& M4 F/ U* i3 r- a' ythickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
7 m$ d9 o, J) z5 G! `3 pshown in Table 40 for 1 h.' j& w3 T) q5 V4 {
5.1.3.3 Method
8 ~/ i" u3 [% d) Y, h; Q' {3 g1 lCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
; x! n) f7 C7 d$ t! z. p3 z4 F$ pdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
; r& i9 ~( v( h3 ?# u; I5 c% Z& C
; ]3 d& [# G5 i2 R8 Y+ QUL62里有要求做此测试的电线型号里,没有SVOO的型号! |
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 )
窥视卡
雷达卡
发表于 2007-8-4 15:15
显身卡
楼主
发表于 2007-8-9 10:58
