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NMX-J-191; f5 ?; U7 `% I! e/ D
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
# O0 ]0 \6 | Y. @' b! dConductors – Test Method+ q1 A" [3 n2 ]% m0 [
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5.1.3 Deformation5 F# E( Q g' c" G' f; o3 B
5.1.3.1 Insulation S+ t0 R4 @9 h: G. _
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of% R+ s* q" d2 w2 L- ]5 ?2 f
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a' [1 T6 l2 \) a1 U" _
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.$ t$ d ` f s8 \$ c
5.1.3.2 Jacket
4 i. ?* u( H$ X6 u0 k0 m, {" b ~Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in4 D; R- Y4 k! [5 [% ?9 V
thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
& E" q5 Z" }4 N4 m, m* Fshown in Table 40 for 1 h.
2 f! C2 G6 N# F9 M: U5.1.3.3 Method
# n* e. D$ f* L) p0 o( s" hCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method" c3 s( O* V V( B, s; N/ b2 D* |
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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