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NMX-J-191 L$ w; r" Q+ Y1 ?; M! ^
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical2 ~; u% K9 z1 {( Z
Conductors – Test Method/ G% q+ S0 |' c1 i _2 U- }
9 ~6 T. H @; Y9 h9 _/ p
! K* T& P5 H3 B, K- O
5.1.3 Deformation- f- |' x/ W7 l; J1 w9 g! y; v
5.1.3.1 Insulation1 i2 z* A) Q$ N7 ~* b
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of, g, [/ B1 h5 @" M- I
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
7 t) j& |& _1 g# m4 p! |- @- Jmass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h./ j- a, a1 ^( P) f8 ?" C3 A
5.1.3.2 Jacket8 j* v4 l8 n- r$ Y4 Z1 r
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
* ]# t, f8 M S8 H% kthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
5 |) j; {" J' sshown in Table 40 for 1 h.
) K; c+ t% O: [5.1.3.3 Method
7 E# ^& \& [6 F3 ^- e% S: q( R: t% uCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
8 \6 D4 m5 e8 _( i7 {described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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5 a9 \ O7 E1 J) b2 MUL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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