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NMX-J-191
6 S7 |, _3 O& NHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical7 P4 O( T8 _ D: _; h7 } y
Conductors – Test Method' E% j, J% K& z0 r
2 `7 r( l K4 U$ m# _- ]
# U; u a8 s4 O2 d/ a8 I: a) J5.1.3 Deformation
% B: E" v+ K5 S4 v5 o' r5.1.3.1 Insulation9 Y# ^5 E2 M p8 z9 ?0 r" ?
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
7 L- U* a0 @3 P+ C T# dparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
: \9 ]" p* T1 h3 M7 a, @mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.
0 f+ y& c2 j X5.1.3.2 Jacket. L0 J: T! _0 I1 m( L5 M4 q
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
0 n" X2 k" D- }6 P, {; R9 i, J3 o) pthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature1 V8 o0 a" O$ u5 F3 g6 Z( x) y4 y
shown in Table 40 for 1 h.% X7 M5 j$ _5 g& q* ~
5.1.3.3 Method
8 B, k- C; B! ^Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
) m; t+ b' f; F9 K, Y4 O3 Rdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.# Q! w4 v& m8 K! D
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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