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NMX-J-191
4 c) P$ k+ D* c6 b- D1 EHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical! [7 ^6 s$ P# h, v# n( t: u3 m7 ^$ y9 m
Conductors – Test Method
* b: g! b/ B2 O( `* s6 ~
" d* [( L' t& x G3 S+ J. U' }' T
5.1.3 Deformation
) \+ H6 p5 h9 l* @: d6 w, Z5.1.3.1 Insulation
: K8 ^1 r6 d& t7 E. L. a3 ~The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
% e6 h* b s+ y h. tparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a( M1 W1 h7 n4 ?$ j
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.' p6 G5 W$ C/ b7 |4 C. V8 v# S+ B
5.1.3.2 Jacket) x: @/ m: [% k4 ]1 ]% d4 W
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
^4 g& E0 Z8 p- Z2 @7 @thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature: q9 K7 e' t6 t5 Y6 z3 N/ A) G
shown in Table 40 for 1 h.
$ _5 B" x7 y) h5.1.3.3 Method" P, q T6 `8 M2 ~; ~/ g Z
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method X: p u U& u, O7 g/ O
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.0 k7 D# E( _! \; r; R* J4 d: P: E
, @/ b/ q* v" DUL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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