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NMX-J-191
- l$ ~4 Y/ o! N! ?: w& \& l( rHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical+ A9 X* e2 O8 _3 O, F" m7 ?
Conductors – Test Method0 A5 t! d. [9 a6 D1 b+ u) m0 m; `
9 d# W0 a$ y4 o8 d
1 Z+ Q9 Z( l2 v8 |5.1.3 Deformation% Z# \& C0 P" ?. z2 r
5.1.3.1 Insulation1 Y. O' }4 B8 B$ O( G; o
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
8 ^% C0 T. W* k( nparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
( C- s( O, T, zmass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.
& P+ G9 E" I' T) z; f5.1.3.2 Jacket4 e3 O# d( G* u% _
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
3 @* |2 D. D+ J; [thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
1 P2 `, ]; _9 Y$ eshown in Table 40 for 1 h.% W$ M1 Z" d- a/ T" {- y0 n
5.1.3.3 Method
4 c5 d7 B4 W9 z0 z6 Q/ KCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
/ Y7 ~3 ^5 k' L+ Fdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.( P- T, i f& j. v" J
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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