本帖最后由 jjlamshushushu 于 2013-10-9 08:15 编辑 $ p" f4 U( B6 ^, G8 k2 z
地瓜 发表于 2013-10-8 09:01 
, T) P8 p! f3 s4 y4 o' |1.能摸到的定义指的是用实验指可触碰到的% b, A% D; f; O: }
2.对于一类器具使用到的探棒有:test probe B and test probe 1 ... - o* j! y6 X. V0 P3 D) [; _
, ?8 l; [* ^6 W0 |. `" Q0 u对于一类器具使用到的探棒有:test probe B --------地瓜,你说这句话的依据在哪?7 T y9 @2 s$ ]) |7 r+ N
------(IEC 60335-1 8.1.1)里没找到哪句话说探棒B能用于I类。。。
7 J6 L9 A5 t( i Y 8.1.2 Test probe 13 of IEC 61032 is applied with a force not exceeding 1 N through openings in class 0 appliances, class II appliances and class II constructions, except for those giving access to lamp caps and live parts in socket-outlets. NOTE Appliance outlets are not considered to be socket-outlets. The test probe is also applied through openings in earthed metal enclosures having a non-conductive coating such as enamel or lacquer. It shall not be possible to touch live parts with the test probe
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