本帖最后由 jjlamshushushu 于 2013-10-9 08:15 编辑
# ?+ g& S* Q9 k O' Z$ L/ q地瓜 发表于 2013-10-8 09:01 1 S( P( [/ S f4 A8 V2 H! L
1.能摸到的定义指的是用实验指可触碰到的8 X, m" l$ F( X$ P8 y7 S
2.对于一类器具使用到的探棒有:test probe B and test probe 1 ...
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对于一类器具使用到的探棒有:test probe B --------地瓜,你说这句话的依据在哪?
/ ]: `6 `& f; y% c7 u; G' w------(IEC 60335-1 8.1.1)里没找到哪句话说探棒B能用于I类。。。* g+ Q v9 b. N( f$ R/ F
8.1.2 Test probe 13 of IEC 61032 is applied with a force not exceeding 1 N through openings in class 0 appliances, class II appliances and class II constructions, except for those giving access to lamp caps and live parts in socket-outlets. NOTE Appliance outlets are not considered to be socket-outlets. The test probe is also applied through openings in earthed metal enclosures having a non-conductive coating such as enamel or lacquer. It shall not be possible to touch live parts with the test probe
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