本帖最后由 jjlamshushushu 于 2013-10-9 08:15 编辑
& ^2 O! {# G3 P2 r地瓜 发表于 2013-10-8 09:01 1 K* [( p6 k+ `$ o
1.能摸到的定义指的是用实验指可触碰到的6 w, A9 [0 I" Q9 v v9 `
2.对于一类器具使用到的探棒有:test probe B and test probe 1 ... , k* L9 I8 E/ V* s
7 q+ m" P8 x7 @+ O1 ]- w( e对于一类器具使用到的探棒有:test probe B --------地瓜,你说这句话的依据在哪?
/ p0 l, Z: T3 V% h2 E! [------(IEC 60335-1 8.1.1)里没找到哪句话说探棒B能用于I类。。。 |& i, y+ F8 h) {5 E
8.1.2 Test probe 13 of IEC 61032 is applied with a force not exceeding 1 N through openings in class 0 appliances, class II appliances and class II constructions, except for those giving access to lamp caps and live parts in socket-outlets. NOTE Appliance outlets are not considered to be socket-outlets. The test probe is also applied through openings in earthed metal enclosures having a non-conductive coating such as enamel or lacquer. It shall not be possible to touch live parts with the test probe
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