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由于我的标准上有公司名字，就不直接贴上了，差异部分如下- w: p5 `4 ], z
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1 Scope and object
. t3 {& ?, z6 KReplace the title of this clause by “Scope”9 Z Q# E5 v9 M* O9 |
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
8 x8 P; x5 S* Q" I6 q/ MPage 11
- w/ Q6 h+ O0 L& Y2 O9 s4 M2 P" x2 Normative references" p% u& p0 B {9 W8 D% o
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The following referenced documents are indispensable for the application of this document.
0 U# V) z. |- b3 zFor dated references, only the edition cited applies. For undated references, the latest edition6 g* c% W* X" l2 n& t
of the referenced document (including any amendments) applies.& @7 }! N# V% F' K- N( R) v: C U
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:3 V. x0 e* [& u" ]& C1 A. L6 p
Electromagnetic compatibility
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3 S( K! X& ~6 p6 P! J1 [5 N+ R" P9 _ {5 v; A- }; |
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
( Y( { K" v5 c( E% h. Y( ?2 JIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and$ l) x! Q2 r5 `) D8 D8 A" r
measurement techniques – Electrostatic discharge immunity test$ {: f( S4 W) d: N- j
Amendment 1:19984 y" \0 a( M0 S _ s( E
Amendment 2:20001
6 K- F9 Q. f) UIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and" O7 {8 G- c. Z
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
3 I8 W% R7 r6 I5 d% m1 ^/ aAmendment 1:20072
5 f1 I- o* S- t0 tIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
5 D X9 R! E3 p7 S9 {measurement techniques – Electrical fast transient/burst immunity test8 S9 w, y* l7 T8 n4 o# }' e' [; m- m
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
* A! A) s$ H; nmeasurement techniques – Surge immunity test- \% r! j/ r4 X/ k) Y4 }
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
0 B6 _! U+ A+ Q% a6 u" l, pmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency- Y( Z) N/ X% w0 J3 h( ?
fields
# @* g+ M+ z; X. n Q m$ `6 Q& VAmendment 1:2004
1 H2 A4 p. z u5 g1 N6 uAmendment 2:20063
8 F0 T* Q( E$ Z. P9 hIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and. S3 g/ Q) z, [! m% C5 ?$ H. r
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
4 J" q- i, s8 w5 I# VCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,- L7 a x. Y/ ?. w* s# v9 q, o4 X
electric tools and similar apparatus – Part 1: Emission: x, h0 C: K5 N6 f" J
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3 Definitions8 X! T8 O- k! Z3 Q: h& G
Replace the title of this clause by “Terms and definitions”.. W. d0 C1 g, ^- Y; W% @0 F. U
Replace the first paragraph by the following:" f5 e0 }( N; h+ f( N
For the purposes of this document, the terms and definitions related to EMC and related
X' Y3 \5 `5 D+ R. Z# { C* hphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
* B7 Q1 g, Y& }* O, C7 FAdd the following new definition:
a0 Y" i/ r9 H* \& d* Y" o4 O5 V3.18+ W6 R- H" k s7 Z0 \
clock frequency: u5 [( ?; b* r: B0 D
fundamental frequency of any signal used in the device, excluding those which are solely
& `$ l/ A, [4 Z7 I6 ` G3 Zused inside integrated circuits (IC), n) p. R7 q3 Y3 z, |& p
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits! ?% J$ J3 ? O, Z* m M
from lower clock oscillator frequencies outside the IC.
+ v, a3 ~* }1 a$ S% h' m. M___________2 b b* Y* m' \
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.$ q# j4 F7 R. l5 R8 Z
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.) ~+ e: c. s* B) E) K
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
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– 4 – CISPR 14-2 Amend. 2 © IEC:2008( b X" P5 y5 }" w1 V% Z
Page 13
+ t0 w* j; `: P# Q1 D: n4 Classification of apparatus. a$ |: Q4 Y# N
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.* W5 }. j0 ^2 |
Page 15
' z2 z$ J7 H( q. P. R5 Tests
0 l' T+ {9 L) K v& h5 ~Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
4 O! A! a8 `9 p$ x- M$ {Page 21
- a0 D' f: n* l2 w0 Q+ `4 o5.6 Surges
9 z; R3 e% s8 uTable 12 – Input a.c. power ports
+ Y; P7 ?. H* ?) W# @7 M, zIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add5 M, v% ]# F* v6 ~' N# d
"Line-to-Line with 2 Ω Impedance".$ U( `2 G+ `7 q, O' S
After Table 12, add the following paragraph as a new second paragraph:
5 P, w+ p7 k2 N2 I2 ?% W4 i8 W" {The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
- X5 W. r& b) m$ d/ B% Nequipment under test, and the negative pulses are applied 270° relative to the phase angle of- N, h. ^. w: i# F
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
8 @ Z+ ^# U0 z& l" r; ]given in Table 12 are not required./ \0 r4 H g5 H+ f$ Z
5.7 Voltage dips and interruptions
; |( n1 t% c- X; O* e0 b7 l8 u& _Table 13 – Input a.c. power ports; V# G0 x% P N( D$ Z
Replace the existing Table 13 by the following new Table 13:! X# H5 C! D+ y4 @! \- e
Table 13 – Input a.c. power ports
4 P. L) s: X% j& V. UDurations for voltage dips% D2 H; ?" S( A% y8 i. ?( }
Environmental Test set-up
( [1 [& X6 l! m: X& Vphenomena
. Y2 N7 e: N* Z' F5 @Test level
& ~7 b ]' r) t' qin % UT" V1 g- @/ s3 I# i) @9 z5 |/ C) p
50 Hz 60 Hz6 [ V' T" W' L" h% ~
Voltage dips" Q6 |& s3 P. M! K% B3 e
in % UT( F0 P! X- ?' `. }! g1 }* U& p0 N% n
100, U& e, T4 S: }, C* x7 ~
60# e8 R# a7 H- V
30! E+ W7 `, ?; |, e, f
0/ {+ @, I' B4 O! q1 O
40& K+ i* C1 {: v7 a* a' \! `
70
. `4 I$ q" Y- x0,5 cycle5 T: c4 F+ P- T9 n
10 cycles: j+ l3 o% W9 a( ]; f: {
25 cycles
# p: q% W6 t1 O# R0,5 cycle) Q2 r+ T" M4 Z
12 cycles" @4 j5 Y: R8 \% b) ]
30 cycles7 K8 Z# m$ |8 u' m7 s
IEC 61000-4-11% u5 O i d2 w( b/ d
Voltage change shall
0 Q0 A- Q% [2 d! d Q; L8 ?, ?$ n2 ]occur at zero crossing
7 ^) a8 b. U: J2 xUT is the rated voltage of the equipment under test.
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# X- w4 T! H* A/ s( ]CISPR 14-2 Amend. 2 © IEC:2008 – 5 –# X8 B$ L4 @3 D% s* {# w
Page 27
7 r8 z( a/ V/ C1 c: x- J; L8 J* l8 Conditions during testing" q7 X3 h% b2 i3 R5 C# V8 ~
8.1 Replace the first paragraph by the following paragraph:" b( d# ?* O- C' K, @9 T" z
Unless otherwise specified, the tests shall be made while the apparatus is operated as/ `: ~3 x# K3 I, ~
intended by the manufacturer, in the most susceptible operating mode consistent with normal5 U6 E7 ^: j" W- u
use.
; W- t8 }0 c* \8.4 Delete the second sentence.1 y* X" Y4 `! Q4 u
8.7 Delete this subclause., X! D" Y( Z# z1 t7 f5 y) U
8.8 Renumber this subclause as 8.7
$ [2 G( A- @: H9 N( P' g4 w; tPage 29
1 M5 U. Q4 f6 `/ @& g6 r# A+ P9 Assessment of conformity/ Y4 b' A' B' v$ z% \
9.2 Statistical evaluation
; ]# ]9 F8 Y' Q$ V, o. [Replace the existing Note by the following:
/ ?7 B6 N; t$ W/ P6 e/ D9 e- TNOTE For general information on the statistical consideration in the determination EMC compliance, see
/ N0 a3 R1 N) r- r# N1 k6 Q0 YCISPR/TR 16-4-3.) t- j" V- ]3 p5 J! s
Page 317 O, _* U1 n0 j! J" {7 k7 S
10 Product documentation
! a/ b" i2 M. jDelete this clause.
% N/ J, X* E* |5 kBibliography
; Q: ^- n2 D! `: |# r% E, IReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
3 c! i' G- L, f: V% x* w, cCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and) |( N _3 z, U1 n
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in/ } {( L( t4 L$ Z4 F$ _
the determination of EMC compliance of mass-produced products (only available in English) |
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