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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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0 H# E8 U }4 J5 | I, V& g/ i4 `Page 9! n7 _+ D& O2 V
1 Scope and object, V$ P2 Q) _1 ]
Replace the title of this clause by “Scope”/ d/ N5 f; y& \& ]$ E3 Y
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.3 T" A- h2 i7 H+ e% k- M; i
Page 11
0 f, M. ] u' k; M" r, T2 Normative references
' S( T" i& ^( v7 y& I" ZReplace the text by the following:0 ~( h7 A+ ~ E' @5 B
The following referenced documents are indispensable for the application of this document.+ @) n. M z# F- w. g$ C) B' i
For dated references, only the edition cited applies. For undated references, the latest edition
8 Q: W- ~; ?* ?5 ?" i8 l8 Hof the referenced document (including any amendments) applies.
- q7 |+ y. d1 U% F4 ~IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
! b) @! z7 v: |- H; fElectromagnetic compatibility* e/ e$ c9 m7 R5 s, h. E
2 R1 D$ t- {- t! ^/ f7 K
2 l' h, t! n& b, }CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
/ P. J/ O( M% k0 g/ w: I! R* h& WIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and$ \. ]; _. U% N! H
measurement techniques – Electrostatic discharge immunity test
% O: ^7 w2 |8 }+ K+ xAmendment 1:1998% |9 T' h+ I6 {* Z- {0 Q' f" q: J
Amendment 2:20001: J5 r. T1 S! D$ G
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and) |% s+ _& @8 P. c$ n/ I2 c
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
8 v2 h3 x) |3 W- f7 S$ b! pAmendment 1:200721 {) {1 E6 Y3 x/ U7 D+ g5 b# c; M
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
" J/ g! G5 r( } ?4 Z$ Bmeasurement techniques – Electrical fast transient/burst immunity test
, ~ _& U2 k9 a$ oIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
* f" d6 u6 I. T, K( d. E+ s# ]2 |measurement techniques – Surge immunity test: S$ ] z# H- i/ L8 P! z! H3 k" X
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
9 o9 K, b+ f7 z$ m4 \measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
% Z( L1 _* t7 t' dfields- X5 C7 U5 h( d7 n9 f- e
Amendment 1:20045 L5 N0 x% i! g6 ^
Amendment 2:20063) A5 Z& t9 F4 f
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
$ L$ Q7 j& X9 N! n2 N- ]/ U8 Zmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
( v+ K( J7 _6 l @$ |. k/ ?0 P) eCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,8 e) m2 r1 `$ Q
electric tools and similar apparatus – Part 1: Emission
: G" x/ u$ d9 E- z" GPage 13
* C3 ]! e% i) T# W' `3 Definitions
7 H2 k# ^. y0 JReplace the title of this clause by “Terms and definitions”.* z8 @9 e# }" x7 \% P
Replace the first paragraph by the following:' Y6 u A& T5 \, ^; h# q7 H+ t
For the purposes of this document, the terms and definitions related to EMC and related
: c4 \1 L. w1 h3 N7 h( rphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
2 r% L0 F# R- x" |0 aAdd the following new definition:
6 u' K I5 \) T6 r4 M8 Z, V3.18: }+ ], T* ^) Y/ C3 {7 J3 F
clock frequency5 T% j4 \% `& c% ]5 l% Z! ^
fundamental frequency of any signal used in the device, excluding those which are solely
: C+ v/ i f: @9 ^" u$ qused inside integrated circuits (IC)
) }! c2 s( y0 y2 zNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
* O6 j7 |0 v; Ufrom lower clock oscillator frequencies outside the IC.5 T$ @1 x) L3 n2 T
___________9 n9 Q. ~3 B& I H
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2., Q7 s U* h0 x7 ]
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1. K/ Q/ P3 R0 C# G& h' N& Q8 w, }
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.0 A/ Y/ b2 `) q
8 R2 l( o6 L% `9 B3 Q% z6 l' j9 Z( B9 P& X' E+ E& `
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
H% C8 b* j j( o: k+ ^Page 13
, w+ Z5 `- ], ^+ i8 n3 e: L! b4 Classification of apparatus
! e3 |/ a3 w0 z5 J# ^4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.8 l2 B$ f+ ?. p$ H) f7 @; }, d
Page 15 G, E4 @ K/ s9 p {0 v5 M
5 Tests' k9 {! _9 ^3 m
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
0 h8 W3 F3 W; bPage 21
! B3 b3 D1 P7 Q! @! l5.6 Surges3 e& e% { ]# }' j1 H
Table 12 – Input a.c. power ports6 T+ P3 }* W- o8 z! Z- [5 u8 K
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
" l% [7 E) s0 D7 o" ^"Line-to-Line with 2 Ω Impedance".8 u `3 U5 h9 h0 r8 y: g
After Table 12, add the following paragraph as a new second paragraph:
4 F! K( \3 W6 F- s' _The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
* a0 k6 ~0 q/ D& G% oequipment under test, and the negative pulses are applied 270° relative to the phase angle of
% `" U# ~6 c1 a; N k4 A4 athe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
1 q' N3 g; t8 }# V" N8 F" Bgiven in Table 12 are not required.
- h7 d8 E: S( y5.7 Voltage dips and interruptions: n3 n9 Q( V# N
Table 13 – Input a.c. power ports
/ z0 }/ W j# w/ GReplace the existing Table 13 by the following new Table 13:
8 B; [: I! l4 C% LTable 13 – Input a.c. power ports
/ i) D$ i0 ]1 d2 g% _Durations for voltage dips
- i4 `& z& Z# G/ s: yEnvironmental Test set-up
6 {+ D6 {& K0 y. c0 |# S: Iphenomena
) n" {" P. w$ p. M4 DTest level
$ i: y4 k4 t' ]: T1 |% B qin % UT
/ W4 C& h$ c0 n. H0 q50 Hz 60 Hz
* ^) s- o/ e; ?7 v9 [3 CVoltage dips
8 U3 M! {. c" Y# Pin % UT
4 G [* b; t7 g& J4 _9 ~/ Z100/ |, {- s* T% R8 X
60
( t9 d& W* T9 Z. e$ X9 U& H7 m300 M# I% s: ^1 b+ k+ A
0
7 M/ ~- G3 Z- o5 x2 Z0 _40( b" J! x7 G' z) g2 {$ }+ t7 n
70
O2 P, L5 w* Y. O0 |8 }0,5 cycle
% q/ S, e `1 Z% D C5 n10 cycles
2 j/ y: q" F+ [25 cycles
* D' a7 A' U' F" V5 r6 B0,5 cycle/ z9 J, f1 R2 j& B, N: I2 p
12 cycles
# V: k, i8 v- N30 cycles
$ M' @' R+ l# r9 B& C9 f6 |IEC 61000-4-11: k* ]3 {* j o5 J: Z5 D) s
Voltage change shall/ w; H: j. b& F+ `
occur at zero crossing
! C4 D; ]# T# R5 kUT is the rated voltage of the equipment under test.4 {( H! o1 K% c0 Z Y8 E
! ]. k5 _7 N* h% t' ]! V( ^5 ]
6 b3 y# e- Y+ r3 n* I' wCISPR 14-2 Amend. 2 © IEC:2008 – 5 –; D: Y& g& @( C7 j* m" j4 N4 _5 I
Page 27
8 q' s3 y" ]7 [# m* p8 Conditions during testing3 c3 S6 |; v, w* e o! q
8.1 Replace the first paragraph by the following paragraph:( y# B' S) e3 X+ s% P/ s$ e0 c
Unless otherwise specified, the tests shall be made while the apparatus is operated as' y2 k$ y. ^8 m" \+ a
intended by the manufacturer, in the most susceptible operating mode consistent with normal- f1 C4 E0 j" \& w
use.
3 Z3 k3 }! P! K7 @! U8.4 Delete the second sentence.
# I1 Y9 w, _# H8.7 Delete this subclause.2 W: g& i6 i' r/ N; a
8.8 Renumber this subclause as 8.7
$ [+ X& h1 [" pPage 29. W9 U6 L% F5 a
9 Assessment of conformity: w" ~) F E" I/ O! h- m( n
9.2 Statistical evaluation) Q+ s5 ], k0 c) z5 m
Replace the existing Note by the following:& A( r( Y( q! o+ Q9 [1 }
NOTE For general information on the statistical consideration in the determination EMC compliance, see. ~' G9 v( ~' }$ p
CISPR/TR 16-4-3.
/ [1 j6 ?3 F T% [Page 31
5 e1 l; [- k8 A* I3 O' Y3 }; p10 Product documentation
& F4 A2 d0 A4 I% ZDelete this clause., A ?6 A& @1 `/ w8 k4 h- \3 B) d
Bibliography
7 S. n8 M |4 z' x T. g CReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
- U! x. K) v! k: NCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
7 ~6 n* U% S6 }3 a% J c1 ]methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
7 j# O" e6 b+ @7 A4 B2 gthe determination of EMC compliance of mass-produced products (only available in English) |
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