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楼主: ALICE

CE标准/EN 55014升级了吗?

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发表于 2009-3-11 08:21 | 显示全部楼层
广东安规检测
有限公司提供:
引用第9楼Naomi于2008-12-21 15:56发表的  :
+ K- H. z3 g- Z8 y6 V請參考附件
) B* ]) H3 x& [
& s/ k! S0 [, e其中,4 b! c8 i& D# K# |! b5 I( b
DOP : 表示發行日期
' n$ n* b* p, L) m1 n+ V通常DoP 之後就可以開始使用
. ^& d' I! T& I& T.......

  O$ k/ ~, H8 z, T4 Z+ ?/ c; ?
4 r" R$ ?5 B; ^$ s) d可以贴上链结网址吗? 谢谢.
发表于 2009-3-13 10:04 | 显示全部楼层
有没有附件传上来
发表于 2009-3-24 20:52 | 显示全部楼层
引用第10楼2iso于2009-03-11 08:21发表的  :
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可以贴上链结网址吗? 谢谢.

. ~* ~! `. w' U# h5 B  ]5 w- {
  l* C0 ~- K+ W& }http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247
头像被屏蔽
发表于 2009-6-3 09:46 | 显示全部楼层
提示: 作者被禁止或删除 内容自动屏蔽
发表于 2009-6-3 10:06 | 显示全部楼层
由于我的标准上有公司名字,就不直接贴上了,差异部分如下! [- Y" P) {6 k% y: `

% L- L8 z. b+ u% W/ {# L# o: D% Y6 c; sPage 9
/ a7 F- o- j* w+ Q, B: G$ ^: A1 Scope and object
3 C3 h$ Z1 l0 @! }; p( b+ iReplace the title of this clause by “Scope”+ }" _% y8 T. R( C& Y) l; e
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.  P. H% m9 z, L- Y! }7 r
Page 11+ R$ w" ^, ?2 t* h% S! w
2 Normative references
+ f! s+ j& f6 N( ~/ O$ ?1 m. F, MReplace the text by the following:" Z: {3 v9 I9 M. k( D! |  T
The following referenced documents are indispensable for the application of this document.
8 p9 ]! ~/ y, B5 @; @- M$ CFor dated references, only the edition cited applies. For undated references, the latest edition& r$ M: E" Y1 d" e
of the referenced document (including any amendments) applies.
% m3 S4 G2 X) vIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
. e! `9 k' e: T9 E3 H0 QElectromagnetic compatibility7 |- n& }, E/ x  X6 A

6 M3 B; H( r. v! R) B
# i& Y' d3 Q+ h  f' w$ qCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
7 z* Z8 R7 b+ ^$ k7 NIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
$ }4 n  e+ c: j# C' l" \+ T3 Kmeasurement techniques – Electrostatic discharge immunity test
0 T' k0 d7 R0 ]" w; L. p, x! {' t9 {Amendment 1:1998
9 @% G% e. ^. o) ~6 }Amendment 2:20001
+ j3 B. S% ]5 z6 @/ q, HIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and2 [1 Q3 w- j( `
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
. M7 o5 M* |9 {# rAmendment 1:20072! B) Y5 N! f; Y) x( I+ K/ }3 ?0 ?
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
: k" V- s+ j4 F6 g. j. jmeasurement techniques – Electrical fast transient/burst immunity test
% r+ f0 Q. n) `6 U, j  UIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
, _1 G8 d  f2 ?5 Gmeasurement techniques – Surge immunity test
8 {  |) Q+ O& Y7 m; \" U# eIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and# s/ A) X, \4 ^  x; V) n( U9 _, k
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency) |) S0 L- E' ]
fields
' O$ w! {4 |, E/ v3 M9 xAmendment 1:2004
) t" L# {- T4 v! @) \3 {6 X* FAmendment 2:20063& d* T- B, J  H
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and& ~+ A* ^2 p' Q- r
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
1 j- C9 m2 [/ h3 u2 ^! NCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,; B+ T0 O1 i( s; i; I- k
electric tools and similar apparatus – Part 1: Emission5 f0 P4 G( p( I6 G
Page 13* T) a- q  i+ h& V
3 Definitions
! e# w: g  U5 i+ u- ]Replace the title of this clause by “Terms and definitions”.& _( p  Q% o7 [6 W+ l* h
Replace the first paragraph by the following:- U, L5 a) a' y( N: t, n5 g, q
For the purposes of this document, the terms and definitions related to EMC and related9 Z0 n& L4 c& K2 A
phenomena found in IEC 60050-161, as well as the following terms and definitions apply., b% E6 U% |; C1 H. [1 X0 e
Add the following new definition:  U5 R" P% _, e. t
3.18
  e$ }1 e. ^' f& n3 kclock frequency- U  T) b6 Q2 y* [3 s6 p
fundamental frequency of any signal used in the device, excluding those which are solely
$ c' R+ ]6 X- v. P+ W; Dused inside integrated circuits (IC): L! P: Z( r$ P, J3 m$ n
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
5 p+ ?/ U. `) @9 A3 Dfrom lower clock oscillator frequencies outside the IC.
2 G- @  l% s8 v___________1 ]1 F, B/ @0 A  r! m; B, a
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.; f- l8 T" z! o# U8 I! ?( x& \8 C0 @
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
% r4 h5 O0 l7 r# |; a3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
1 f3 T  n# V( H% p* D
/ O8 ?# }4 S8 N1 b' O; q& b# D8 _6 J$ u5 R: x. Q7 `
– 4 – CISPR 14-2 Amend. 2 © IEC:20088 {; t, g* ~' x  X+ X9 F9 q
Page 130 f6 h3 H: w% u. g4 K- a) G% ^% s
4 Classification of apparatus0 i1 J; i9 T% B( w6 H4 k$ I, G8 J
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.1 e8 U" [! L& H
Page 151 ^. o7 a7 p% T) @% C
5 Tests
: _: O4 x! B+ T. f0 Q9 oThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
1 v0 H0 B4 L7 D& cPage 21! w' ^% D3 H& [7 h6 y
5.6 Surges
7 M, N! ~/ N/ |8 ]( N5 I2 I( mTable 12 – Input a.c. power ports" a0 A, m. h$ v. N
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add% H( Z& }3 ?* B2 a% F6 v6 c
"Line-to-Line with 2 Ω Impedance".( g( y0 D/ H- j. {# X( n
After Table 12, add the following paragraph as a new second paragraph:
' M9 `+ l' s& ^The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the* W+ p5 n5 _+ Y
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
' _8 r& J$ }2 _) R, _7 {the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those7 [& ~- b1 Q& h9 M- F( c/ t
given in Table 12 are not required.2 E2 S  a6 \  {+ P" p% L  w# F
5.7 Voltage dips and interruptions
' ^# C- }& [4 tTable 13 – Input a.c. power ports1 i7 }  K/ \+ U# ^
Replace the existing Table 13 by the following new Table 13:! }/ h; R" L; I1 _1 R
Table 13 – Input a.c. power ports
# }* w" W# ]8 V6 lDurations for voltage dips
, t4 \- e' U; s8 G: C. r9 v1 d' o) ~Environmental Test set-up# p4 t8 J( _2 J0 C; ]( H0 g
phenomena, J3 [& T0 k* |8 f( Q3 P5 C6 ?" s. l
Test level
! r& [6 T* V: y) J' _in % UT
$ s4 p/ J5 _# l. J8 f. y50 Hz 60 Hz7 R; G8 h( c3 \0 H  \% x
Voltage dips. I( i2 X  h1 o8 T$ T- e' f% P. S
in % UT, f' q* P( m/ j# X  C
100
: U) Z( K" b! s! J& g605 C- W! H6 ^. g( }  {; a
302 n( Q! o' I: j- i$ o# U
0$ {+ C! L, c2 W9 h8 Y/ ?
40) m: W  F& [" g0 A
70
7 U, q+ Y: X- L, x0,5 cycle
) J/ Y. G' H7 o! w- {- _10 cycles
! J& r: ]" C4 s0 n% V1 a8 B8 t25 cycles
8 m1 s2 ]! o0 W0,5 cycle
: X6 D  G5 _1 L2 @9 A( [1 ~12 cycles" {4 P% A7 P, N- W1 g
30 cycles1 h9 a) [% H  {0 ]9 s# S
IEC 61000-4-11$ t1 P. S! p! N. l" X3 L& Z
Voltage change shall4 r( x. ?7 r* F! J9 Z) v  X
occur at zero crossing
1 L# ~/ z1 m- ]UT is the rated voltage of the equipment under test.
: J1 a4 I9 {* I, O( Y4 T8 Q3 ]+ y! |$ D# Y& w9 g( ^
* l0 I- ]4 B; ~  @, x
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
% U9 H% y1 H4 m' T) W, {Page 27# D. ]0 g4 D' `1 u0 A' u+ m
8 Conditions during testing
8 U" p) F4 H$ g8.1 Replace the first paragraph by the following paragraph:
  I$ ?: l! j4 k% ]5 wUnless otherwise specified, the tests shall be made while the apparatus is operated as# b; f5 X6 [5 j6 A& \* F9 j8 p. g
intended by the manufacturer, in the most susceptible operating mode consistent with normal
0 @! g: t8 C/ i7 S/ Q  guse.
3 b. C6 ?% N& R  H% g7 j8.4 Delete the second sentence.7 D8 o: L5 U- l. t
8.7 Delete this subclause.
  W/ G; T+ P, b8 @, `9 Z9 \8.8 Renumber this subclause as 8.7
, {# x% ~" b2 F' c' Z% @$ J5 K6 ~Page 29+ |; f7 B0 _) ~3 ]( S5 `
9 Assessment of conformity
# O+ ]( K# F6 d5 ^! W% g0 S9.2 Statistical evaluation
8 b0 m, y/ J2 `. i' f2 TReplace the existing Note by the following:
/ k$ @) d7 F. h6 @* oNOTE For general information on the statistical consideration in the determination EMC compliance, see
. F/ z! P; d4 O9 R3 T7 U& UCISPR/TR 16-4-3.8 l5 y* R% ^7 l9 F3 ?* Z" a
Page 31: K$ Y8 D0 h1 |$ ^. _
10 Product documentation3 C! _- S$ h; u7 y" m& p
Delete this clause.' C/ I3 D0 R8 {/ K' S
Bibliography2 W8 _' B% K/ g3 G$ y# @
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:/ u7 I$ O- [  y1 K! T2 l: R- h& W
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and+ o9 n/ |& q! q) G, y# Q) j
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
! U6 k% l1 M3 \the determination of EMC compliance of mass-produced products (only available in English)
发表于 2013-6-24 15:18 | 显示全部楼层
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