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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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Page 9* f+ |) [; Q5 r6 ]9 F+ y1 y }
1 Scope and object
- C: l- F$ y. j/ NReplace the title of this clause by “Scope”% ^$ P _) q _! y
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.' F4 H4 N" u# S6 y2 N5 @" h1 W
Page 11
) A1 B! c1 x: I) @$ d2 Normative references9 q. T( y5 [. G1 X$ v
Replace the text by the following:' b$ ?1 F) ^+ R9 A
The following referenced documents are indispensable for the application of this document.8 ]8 W+ d0 {7 W# j8 G7 Z
For dated references, only the edition cited applies. For undated references, the latest edition
D+ Z) Y/ Z" ]# [* ]! O0 }0 n7 Eof the referenced document (including any amendments) applies.# _6 {2 M! F$ T: G/ Y
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
, M8 V( z1 h. k* fElectromagnetic compatibility
1 u" |# Z0 t# h. p8 g4 r2 Z7 @- u7 o( p" b
' G; H7 B5 ?/ v: `5 y- VCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
- p7 k+ c4 _# U0 x* fIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
" S) t7 Q& c/ a! o: C" l9 J8 kmeasurement techniques – Electrostatic discharge immunity test
. e9 X! }$ ?7 cAmendment 1:1998
6 r2 l' O9 s4 v; V! \, Q! {Amendment 2:20001
% r6 C: D& w) q4 W, ?. @" cIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
& V% R9 Z$ z; T) r1 xmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
/ V6 p# F3 D$ A, w' L6 IAmendment 1:200722 f6 ]4 b( B2 u% s9 s
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and% y, K/ [ W: `* z: }* d% L
measurement techniques – Electrical fast transient/burst immunity test
0 |. z* t; ?1 J" @3 j2 x- zIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and# d+ M/ `9 {2 c+ Z# q
measurement techniques – Surge immunity test2 W8 R: R" b! d
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
2 J- G+ _* r% L& Emeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
, y( {' H. _6 hfields
. _9 k& E/ |6 AAmendment 1:2004
$ ^0 j) i U+ u3 L1 LAmendment 2:20063 X+ J) B# B7 A& u) F
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
0 C$ i; [3 v* b# O' k7 ]measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests7 e! ~3 m. g) ?5 e$ v: H
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
) p+ k' J9 @- M' n- felectric tools and similar apparatus – Part 1: Emission9 s) T! w* c5 r3 F! W
Page 13& h& F3 w# l3 i. V1 {
3 Definitions, T6 e. b# ]. b) X" O/ ]6 ]
Replace the title of this clause by “Terms and definitions”.
P; D: J! P" N- OReplace the first paragraph by the following:
. \* D5 c' y% F5 lFor the purposes of this document, the terms and definitions related to EMC and related
: B7 H5 i# \& L) a, C4 R8 Mphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
# J8 U$ @9 y+ u7 ~3 }# EAdd the following new definition:4 x8 @) U% y+ N' N/ I8 P5 V: S
3.18
# _, ]& W0 [' Cclock frequency0 `4 p& f( e7 P4 r, F
fundamental frequency of any signal used in the device, excluding those which are solely- x7 V8 |; d Z& K
used inside integrated circuits (IC)
2 a4 o* F& W% q3 \% N5 u0 O- ? ]* l/ ENOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
8 }/ A, o$ d* |& J! K+ X/ Ofrom lower clock oscillator frequencies outside the IC." i: r+ X" }" l7 s
___________
* @" P/ u( ^# v# ?: A0 d; x1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
* z9 O4 w0 y; u3 H7 Y2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.2 z) R0 s9 q' @7 a
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.; k* h9 o( j! e
* ^( Q( Y- o( y
) n1 B5 S- W3 E( R0 o; _, j
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
/ S: h' J, }& QPage 13. c% w9 |! m) T8 U) j& K2 L
4 Classification of apparatus
4 K) M, r& I0 ^ j: n& \4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.# ]$ X: O' D9 F" f$ |8 ]
Page 15; o. s* j# W \( q
5 Tests
! N9 Q! _; x$ a8 r* SThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”./ R% v8 K* \, b" J
Page 214 M% S6 |9 d+ _. C" r
5.6 Surges
* l( D, K9 q" @4 v2 f# @9 ?Table 12 – Input a.c. power ports
0 e k C! G4 _, d9 N6 [- [In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add8 G$ S& i _, P- G2 R7 M! z
"Line-to-Line with 2 Ω Impedance".
6 S+ {4 S h4 q$ o& k) l n: uAfter Table 12, add the following paragraph as a new second paragraph:
) c) A4 D% \8 l" iThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
( t7 j% c8 |! B" |7 S- E$ P4 {, wequipment under test, and the negative pulses are applied 270° relative to the phase angle of
& p. P, h- a7 M! d; Q! K7 jthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those" T4 C5 p0 @3 ?6 T! W
given in Table 12 are not required.
! z4 \% k$ P9 E& x5.7 Voltage dips and interruptions
9 G- R. Y. O! c& E/ i mTable 13 – Input a.c. power ports* Q1 D# X+ a" A2 c. I
Replace the existing Table 13 by the following new Table 13:5 V- }2 ~: n" ?& L0 G: |8 E9 L
Table 13 – Input a.c. power ports& Y3 a* h# [+ Q% u1 }
Durations for voltage dips: z" s5 d7 q" G& s. l( D
Environmental Test set-up) x' ]2 x5 z% P2 a
phenomena
# J0 ~. y4 H% Q) X4 ~) l# u8 o% rTest level
# {" H0 H T8 Win % UT+ k8 l2 ]; I" k0 P
50 Hz 60 Hz2 U- Q; \5 F: A; u: G/ B2 x
Voltage dips* N/ W P4 Z9 c2 r% P4 u0 O3 X3 Q' s
in % UT
$ O& p" s7 {5 v/ X5 d7 `2 X1 K) K100* _: G& S* y( Y U) }3 f! k" T
60% ]+ w# z& [; |% l* M2 c
30' O2 c3 k) u! \, N9 v
05 y: b. g. Q9 C. k, s
40
/ Y$ @% \3 x8 a$ K% r7 O70
. \" @8 j. O8 H0,5 cycle
w( f+ H$ [$ e* `10 cycles% F3 w, G9 ?4 z
25 cycles
+ Y" A; Z- K& ]2 s1 Z1 ~! L0,5 cycle
6 m3 k8 Z# v3 x! X12 cycles# [% O5 z: T: S. P5 \; A7 I
30 cycles
, k; T# p' ^1 \5 c: D: ~- |IEC 61000-4-119 g6 n Z a4 J, {1 Q7 r1 M
Voltage change shall
' R' t2 \4 e! S" M; Goccur at zero crossing0 K4 L( i/ Q2 r. w( H3 s* |
UT is the rated voltage of the equipment under test.
1 S) z6 p/ Q1 f* z& V6 o; L i" K7 t$ G# F" f6 B9 C5 A: e& Z
1 p+ y8 {/ C: R L% W( F& dCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
1 H4 q2 [- ]4 V1 z; `Page 27/ _3 ]! i) s, \) G# j4 i
8 Conditions during testing( e, r* E$ i! B! C7 h3 z
8.1 Replace the first paragraph by the following paragraph:+ n6 W# r, v. K0 J' I+ W
Unless otherwise specified, the tests shall be made while the apparatus is operated as
' i& Z' x$ I0 @intended by the manufacturer, in the most susceptible operating mode consistent with normal4 h/ }; z, A/ f6 j/ r% J; P
use.
" z/ i) A' B4 z5 s8.4 Delete the second sentence.
) B5 ` H/ ?" j/ T" I E* p0 o8.7 Delete this subclause.; g# [# n# z% o: p; g" i Y
8.8 Renumber this subclause as 8.74 C, b% S* f+ D3 n0 |
Page 29
% }& Z% T1 s+ }0 x2 H G1 p9 Assessment of conformity: U1 a5 | c: x6 r/ r6 \
9.2 Statistical evaluation& n5 }+ ?2 p6 }! c! i3 h, Q
Replace the existing Note by the following:
+ v0 J, P4 k* o2 UNOTE For general information on the statistical consideration in the determination EMC compliance, see+ ]7 ?' `; C" t/ A: Y8 |' T
CISPR/TR 16-4-3.
7 b1 T: M; F+ p* `Page 31" T1 O& W1 o7 e% g. Z8 Y
10 Product documentation. V5 ]# Y7 ~1 }- p1 H+ }
Delete this clause.' l7 n# U; }' `+ @6 V+ T! {/ A
Bibliography
0 B! h0 G, J ]. V& ^1 xReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:1 }) a8 a: t/ l, k% ?7 b
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
6 G3 Y+ C* Y4 b" Wmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
& E3 l6 V8 o. k7 V5 vthe determination of EMC compliance of mass-produced products (only available in English) |
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