CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
請參考附件
( Z9 o5 q; B6 P% @
2 C( M" R% g# ^, E其中,
DOP : 表示發行日期
: o0 x  T7 i- _2 z0 X; H6 B1 b通常DoP 之後就可以開始使用
; z1 z4 N. R, K.......

: |( `" H) P: ?# f3 H' f  B可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :


- ~& ]- ~( h. R) V
可以贴上链结网址吗? 谢谢.

" M) ]: b7 `  f- S
http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下
8 i, `( I$ l# g# b! g
) r* n6 A6 j" @' _Page 9
7 f# _) u" Z; m( r$ k- _1 u1 Scope and object
5 c2 c4 ]) R$ c/ R& h6 kReplace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
# e+ |& A- V, {6 j  u; ~# zPage 11
3 P+ V( f0 s5 y5 g% u7 `: e  q2 Normative references
! g3 m  \* i- h, v, iReplace the text by the following:
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility

; \; I. N0 Y* ~: |, s" U& y
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
% _; r& h3 f5 _6 z. IIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
6 Z; T9 u& d0 A! E2 H  Jmeasurement techniques – Electrostatic discharge immunity test
) t) H$ h3 m3 R) U9 OAmendment 1:1998
Amendment 2:20001
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
" S2 H$ }; F2 i& H, j2 q+ ]* w) j+ Tmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
2 B' Y# r: s6 t. m8 B, l3 w9 uAmendment 1:20072
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
* }& ]7 N8 n4 G: j) emeasurement techniques – Electrical fast transient/burst immunity test
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
$ I1 ^. p9 @  ^- h- u2 zmeasurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
3 \0 p1 \( ]8 J0 N4 I" qfields
Amendment 1:2004
Amendment 2:20063
. B0 W7 d- z7 u6 g2 r6 B) x8 `+ TIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
3 k! x1 n* m* a) ]7 bPage 13
3 Definitions
( j8 ~5 h0 w+ |( ^8 uReplace the title of this clause by “Terms and definitions”.
" M) d/ c" c* [3 O8 j9 S6 sReplace the first paragraph by the following:
1 Z' c8 g2 D: g9 p+ m9 BFor the purposes of this document, the terms and definitions related to EMC and related
9 W0 j! F" o* jphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
Add the following new definition:
- W( q3 l5 `% P$ A. a* P3.18
4 e1 |; q4 F+ Y0 y- _clock frequency
# f- b5 }5 f- k% efundamental frequency of any signal used in the device, excluding those which are solely
used inside integrated circuits (IC)
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
___________
% {/ E: `  E* y; R+ [" E+ o6 W1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
6 s3 d2 q0 r; F& Q  T4 @( V$ s2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
0 @- `, r/ y* ]* o5 P3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.

2 c# H& A  e0 A# A; O
0 R9 a; ?* [" N4 r# e' O4 F& u– 4 – CISPR 14-2 Amend. 2 © IEC:2008
: |8 B) M; H7 iPage 13
4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
3 p" S5 Q$ O% b2 [Page 15
  p; U3 ^1 n, n7 |3 E5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
Page 21
( z$ K$ s( v8 G; l% T- P5.6 Surges
Table 12 – Input a.c. power ports
1 }! U( c$ t0 v. a0 H0 lIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
- S+ s% }4 V; @- m2 F. u"Line-to-Line with 2 Ω Impedance".
3 n( a  K- @; Y9 F2 jAfter Table 12, add the following paragraph as a new second paragraph:
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
! G1 ]* ?7 |6 g4 tgiven in Table 12 are not required.
: K3 e* `  P6 w+ W+ y5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
& s) J7 c9 C4 ?4 `# T- K( s' ~1 DReplace the existing Table 13 by the following new Table 13:
# S! ]" U# q$ e0 x, J8 k  ^Table 13 – Input a.c. power ports
0 c" Z6 g3 `9 G1 YDurations for voltage dips
Environmental Test set-up
phenomena
Test level
5 c, _9 E, k1 O; o4 h; `. L# qin % UT
50 Hz 60 Hz
Voltage dips
in % UT
100
60
6 m2 M% R0 [7 z. b# |4 c- Q: l30
0
6 R* y8 d" u" I4 ?% F9 D5 o40
0 O. k$ L! u; K, d7 a70
0,5 cycle
0 \+ Y3 L. c/ Y( l4 J3 y8 j10 cycles
9 E) Q6 V, p" H25 cycles
0,5 cycle
: ?0 ^) ]  i; C" i& V8 Q$ V" {12 cycles
30 cycles
3 H; n# }# N' H4 w# YIEC 61000-4-11
9 h* U2 \# z; q1 @  fVoltage change shall
occur at zero crossing
$ w5 `- w( ]1 t- F, i) J: vUT is the rated voltage of the equipment under test.


. i9 Z4 J. t5 eCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
Page 27
# a6 W7 N' w6 Y) N6 i& j' a8 Conditions during testing
8.1 Replace the first paragraph by the following paragraph:
! Z* d* j) v, G( dUnless otherwise specified, the tests shall be made while the apparatus is operated as
- k7 E& \* M( R# Zintended by the manufacturer, in the most susceptible operating mode consistent with normal
use.
) p$ |) ]- x* X8 s1 i1 W0 K8.4 Delete the second sentence.
8.7 Delete this subclause.
/ Y; K9 V: p; Q5 a8.8 Renumber this subclause as 8.7
Page 29
7 J) `) s' p2 E% f- e( N! v9 Assessment of conformity
9.2 Statistical evaluation
4 e" f5 a' |% kReplace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
+ W4 l4 y$ V# O! g4 BCISPR/TR 16-4-3.
" h& p# |* _  `* xPage 31
; ]6 n$ H' d2 |5 C10 Product documentation
Delete this clause.
Bibliography
' ]8 u' m5 D. m( T: m; o# eReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
6 X. X3 v! R7 f5 E" d/ JCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
% m& u3 S+ P4 \/ U8 K- ?' ]the determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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