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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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( u, t' k7 Q" L$ a0 j& XPage 9
" |3 X; v7 \8 ] ^2 S# H1 Scope and object
) b6 j6 b: J/ O8 hReplace the title of this clause by “Scope”
% M7 M, ]% S+ V" D8 U' N1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
5 v9 N2 H- N" u# I# Y. UPage 11
* P# y0 t; E2 F6 Q# a6 ], e; Y! w2 Normative references
% Q, X, U5 R$ J6 w9 T$ hReplace the text by the following:
; _) P4 e8 O! o- i2 iThe following referenced documents are indispensable for the application of this document.
7 x1 C7 g7 B& j/ O, O aFor dated references, only the edition cited applies. For undated references, the latest edition
. e d C. f) b1 t9 i) \3 _% f5 vof the referenced document (including any amendments) applies.
7 d+ |6 i* h: L! s- mIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
% R: ~% B9 w' e8 Q# E7 S! ZElectromagnetic compatibility
! |( F- c5 n# g) C
5 n1 i% u9 T( q! T1 @8 U# S Y; q* M" J+ Z: k
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –4 R7 q; q- ~% ]' U6 o _6 ^1 |
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
7 L3 a6 p2 t9 X0 n0 \0 p6 ]measurement techniques – Electrostatic discharge immunity test
( T4 e3 w8 N/ K% oAmendment 1:1998" i/ T4 d' _8 x: w0 z
Amendment 2:20001+ P. H9 a( [/ N* M
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
2 _/ M# G6 b. k, j% \3 [measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test$ |) j& O9 y3 H5 h+ H
Amendment 1:200722 t; U( V8 B3 _6 m
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and: h8 u i$ I3 H) |
measurement techniques – Electrical fast transient/burst immunity test8 A. ^- B7 m- G) o7 Q0 G3 z
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
1 j; a/ c3 g+ p( @& umeasurement techniques – Surge immunity test
, C* \* T/ g( ]IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
- S* B6 T* t8 T/ Nmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
1 T' T8 R& o4 V0 l2 e$ A" `fields$ h: e" ?& f% I
Amendment 1:20044 |! z) g7 S" ?# J. n6 e. g
Amendment 2:20063
5 P* i8 j1 ]9 F! {IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and# u8 e/ R; f d" u6 G* m
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests% t% Y& r9 {5 G
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,0 `, `8 q: }" B7 U o
electric tools and similar apparatus – Part 1: Emission4 q5 W; h8 W* J5 x1 |
Page 13
, {2 r3 h$ {& b, v3 F. E' o2 w5 {3 W3 Definitions' s X$ J, Z" r1 A( R
Replace the title of this clause by “Terms and definitions”.) x& \8 w) k: A" W" [% j
Replace the first paragraph by the following:5 Q; o/ P. i/ _3 X1 y& k; U
For the purposes of this document, the terms and definitions related to EMC and related! i( U) @9 L, h5 f/ l
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% U+ y: n/ H) Y4 f% }9 E1 aAdd the following new definition:" a" C0 k& [6 d( }, g! L+ q
3.18
# R3 J8 _) S8 L3 M8 `clock frequency8 ?# F, d$ v+ j9 C' T8 O
fundamental frequency of any signal used in the device, excluding those which are solely/ _# f7 H' O( p+ j
used inside integrated circuits (IC) {. A4 t% }8 V" W9 q2 b1 ^9 C
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits0 Z4 f: |4 B$ Q! k
from lower clock oscillator frequencies outside the IC.
7 H/ u3 z# v; G2 ?7 z___________
8 u/ d Q) J& r. I! X7 H1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
# ?3 G' L, R9 |3 D' ~, I+ _5 X6 V2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.. D. H0 b/ I. t2 t
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
5 O+ o# I# D. c4 j7 O
1 r, _, i& ~: E2 L2 Y, H0 J
+ c, M- N0 p4 O" o$ J! v– 4 – CISPR 14-2 Amend. 2 © IEC:2008/ }3 ]' ^! I$ F6 o) \
Page 13
! B; ?% X3 O# ^# ]$ G& p& Z4 Classification of apparatus: p, ?" N8 `- ?6 r4 l
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.' }2 q2 m8 e6 Q( t* m& M+ K
Page 15
9 \% k5 ~8 e2 `$ f; E9 E5 Tests$ I" Y# t5 t" p' m% x6 r
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.- B% u. Y: c, G( @& f+ j
Page 21
% ^/ S; }2 ^8 H0 A4 C4 b5.6 Surges
3 t* e5 U; q3 X3 ], e* uTable 12 – Input a.c. power ports
( @4 p1 r1 d5 A2 ZIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
5 O- n( J9 N' k q3 I, D' f4 U"Line-to-Line with 2 Ω Impedance".9 p( ~: |/ }+ h. F1 {- M7 | ?
After Table 12, add the following paragraph as a new second paragraph:' S* q1 [$ k4 t! U$ v4 Z! ^
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the9 X/ z5 ~* z s/ d6 |, A
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
5 I B. P7 u w/ A" E( D1 {the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
' t# M1 K/ u2 ?6 Z c% _7 Ygiven in Table 12 are not required.* t- w5 v$ d$ \& F M) \9 X
5.7 Voltage dips and interruptions
$ \0 I) ]3 |2 h3 rTable 13 – Input a.c. power ports
2 L6 I+ h8 j" E5 m% Q" z# a; }Replace the existing Table 13 by the following new Table 13:; Q0 X6 S# D5 O; v% ]
Table 13 – Input a.c. power ports* K# } V- q* G7 ?9 b2 O
Durations for voltage dips6 k2 X8 v- x: m8 `
Environmental Test set-up3 {& y% @( T% s6 ^ d# C
phenomena1 d2 S( j/ J0 _6 [1 J. |/ ^
Test level
/ J8 `0 Y# l& i6 k- u% C2 g; Yin % UT9 h1 e/ {2 P2 L' l/ U
50 Hz 60 Hz
; s: L, }; G3 h2 a3 eVoltage dips5 c" C/ i9 W. R- M% m
in % UT
& s( }. B* `! V1 k100
% O3 V0 V) d1 n# S. \" n- Q# b60
" Q# J. C' O4 \, [. d5 _30' f" t# @3 u) c5 m1 w& Q. H, Y$ N
08 B7 i5 Z% w4 K$ a' D
40
. I" P6 Q5 J% g" n: x! m2 F70- r; ~8 v/ } i7 p2 C
0,5 cycle
9 C4 l6 m1 {8 V' V10 cycles
% G0 D2 a) B5 n0 h1 a8 q25 cycles
- n% r1 y+ i- D1 Y0,5 cycle& H- o, b) C" n" o) k3 C9 U! O
12 cycles$ {* P# h( g6 p" c
30 cycles
" G+ T1 V4 V; X- h) zIEC 61000-4-11
6 e6 L# i! _+ _4 \9 R+ v" f: LVoltage change shall* ?2 n0 A. I1 d& l: s0 v
occur at zero crossing
, m2 I% x9 a h4 u- P! b9 }9 o- qUT is the rated voltage of the equipment under test.
; ]7 t) Y5 v# N3 [. ^& D& Q4 ^8 s3 b: @% E4 r- }. \
" s3 K7 Q& O, Z& Z8 _+ ]( I
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –3 O; j- @: z) J. [
Page 27
. x1 T& \! M" S8 `8 Conditions during testing; T+ b# m! h. a) m9 F: U
8.1 Replace the first paragraph by the following paragraph:
. d8 C& ]- c( o& J0 _) PUnless otherwise specified, the tests shall be made while the apparatus is operated as8 t; Z5 }8 R8 _! e; H. H
intended by the manufacturer, in the most susceptible operating mode consistent with normal
7 F# V) l, M. V, v* |& q3 L; z. F+ S$ iuse.$ @4 x H" L ?# k! U
8.4 Delete the second sentence.
/ Y: N r9 r1 X& d7 d/ ~8.7 Delete this subclause.& s# z9 {& G+ B' G d
8.8 Renumber this subclause as 8.7( A) v# o8 i: c8 G8 m) I
Page 29
1 y C% e% k3 `1 o9 Assessment of conformity) r: t" h' h& m5 o% r# {
9.2 Statistical evaluation
% L$ |$ O- N! m2 O" JReplace the existing Note by the following:
5 ?. [1 F: s/ E5 `- C6 INOTE For general information on the statistical consideration in the determination EMC compliance, see
* Y* o9 _6 `$ N o DCISPR/TR 16-4-3.) v/ m! m0 p; Z% H: Q5 [4 G1 U
Page 31 e" L: I& Z% A( n$ A
10 Product documentation
; i" F, j5 L t; [Delete this clause.
& n2 m7 u7 E6 `1 ?& uBibliography
3 d# V5 g q( M# U6 ZReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference: b$ K5 e6 K1 h# d
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
; u* B5 ^+ `4 @methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in' R' \2 H( F, k9 H- O+ E4 y6 ]- s' }: K
the determination of EMC compliance of mass-produced products (only available in English) |
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