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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
1 c' o6 c5 ]+ |
! x0 I; h7 b1 N+ D$ W7 aPage 9
6 e- s2 _8 K. ]/ m% g ^& c+ G1 Scope and object
$ j; `# D0 I# }( V5 YReplace the title of this clause by “Scope”! {% B" K4 X$ J% s! k" u
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.6 b/ H0 E {! n' X
Page 11
% w- s4 s" J* \6 n ~2 Normative references
- i E4 m, z: |Replace the text by the following:! D; w. v/ B6 o9 s1 T7 F7 Y% Q0 ^0 z
The following referenced documents are indispensable for the application of this document." U- @1 F, k, P5 r; `: z& s E
For dated references, only the edition cited applies. For undated references, the latest edition
$ g3 f& w) l2 t5 n' zof the referenced document (including any amendments) applies.9 O% |9 L$ N- Y" V
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:, z4 v8 u* Y# \4 i: Y
Electromagnetic compatibility1 Y* U8 d( w5 a+ G n% i7 W
7 r8 ?$ ~3 |" A' o8 N( O/ ?' h( E: m4 e/ o/ a- B
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –/ P+ g/ Q1 X* D' a: X3 p, M
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
5 O$ U- E! j( [measurement techniques – Electrostatic discharge immunity test+ A5 ~9 ]# e; O/ m( z
Amendment 1:1998
' _: R; \" J w4 ?* c3 m* H/ I( T% I3 \Amendment 2:200015 V' l5 W" E3 Q" o- N/ p
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and+ q) m" X+ \9 ^+ E( S/ K/ g- s
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
2 }) k/ g7 d) e1 E: BAmendment 1:20072
9 u2 b/ H1 ~9 e7 ~1 c2 ~IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and1 R6 n- U! R1 _( F, z" V, @8 c
measurement techniques – Electrical fast transient/burst immunity test
1 ~6 m; J+ {3 h& P1 nIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
) b0 u2 L/ L: y1 Zmeasurement techniques – Surge immunity test
* r& ?. w& Q$ H0 B* K2 fIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and. C1 i0 y: w# q
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency w' ]; J: K2 d8 J& v$ Y
fields
4 [0 S K6 T# I, \5 j, QAmendment 1:2004& T; T7 ]5 ^7 c3 M5 t7 {2 q) B
Amendment 2:200630 T. c0 x7 c: `8 r, s) q8 s; t
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
1 x' T/ {! p" O( J- rmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
; l i9 F. M% J. aCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
; n, Q! i' j8 z# ?5 Kelectric tools and similar apparatus – Part 1: Emission& _8 W* \4 p) R0 b/ q3 f) }% u7 {" j; d
Page 131 L3 R0 U$ ^# Z! y9 t8 n
3 Definitions# j. u3 R* F. M+ [6 i
Replace the title of this clause by “Terms and definitions”.% h4 a+ Z- _$ R4 I; O, ]3 _
Replace the first paragraph by the following:7 ?6 e; P: W9 U6 k8 p' ?& ]
For the purposes of this document, the terms and definitions related to EMC and related
8 u* `: c2 p$ ?% b, @3 r( Xphenomena found in IEC 60050-161, as well as the following terms and definitions apply.' `! k$ i* A. M5 `: w) z
Add the following new definition: @( q1 R3 P: Y" H9 v9 h7 [
3.18
, i% F3 x+ p, c' Z9 e6 kclock frequency+ x5 ^9 t7 t( y5 c, ]: g# }
fundamental frequency of any signal used in the device, excluding those which are solely
) _- M; H2 T9 T, ?" _2 D! T0 kused inside integrated circuits (IC)
6 _' U% y3 V" \4 L" Y/ wNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits6 m1 ^1 s K2 {' v
from lower clock oscillator frequencies outside the IC.
' s! s. H9 u, j___________
- J* @6 j. J3 _' m8 b; a1 k* @1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2. A& F1 w3 o7 M E* T7 T% R
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.3 P: R; U" C5 @* h$ u1 ?2 T
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.4 X+ ^0 P) A( x) Y, v* t+ J5 h
$ R8 W/ Q2 G0 \* S
* e6 |$ ^& `! z* e4 ~$ V– 4 – CISPR 14-2 Amend. 2 © IEC:2008# M# u' S% I J2 D. I1 S
Page 13+ ^& }9 G* t6 P
4 Classification of apparatus
" |3 O. @; W4 X8 |: D4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.) B5 c8 y {+ o6 z
Page 15
4 ?6 N8 k2 n8 f7 \" W7 |! w5 Tests: L% g9 j. n2 v; t3 ^7 ]. E }8 K
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.: U% R6 \4 |% l. `5 E7 f
Page 210 A1 _7 u1 ?8 e" l# w } x
5.6 Surges
7 p5 v3 X) ~# ^) HTable 12 – Input a.c. power ports% o* E: C7 ?2 h2 ]5 U4 R
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
$ u/ t4 p, L5 P$ O"Line-to-Line with 2 Ω Impedance".
3 q6 k1 g1 n, Q1 ~5 f8 u$ T" XAfter Table 12, add the following paragraph as a new second paragraph:
6 x/ f, U% g1 b& \" C9 WThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
. A8 r4 Y5 b; z$ \equipment under test, and the negative pulses are applied 270° relative to the phase angle of4 q- s& b7 V) w2 w
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those5 v- N5 D3 q- H( u, ^ }
given in Table 12 are not required.* t/ T" F7 D4 K* W
5.7 Voltage dips and interruptions
7 |! S9 \- i2 d+ wTable 13 – Input a.c. power ports
' H. ]2 \ N' R T* Q8 eReplace the existing Table 13 by the following new Table 13:2 L7 P% Q: m/ j X9 F# N. Y
Table 13 – Input a.c. power ports5 y/ i$ P! b* L
Durations for voltage dips
5 h. B( t( h/ v2 V8 m; b2 ]Environmental Test set-up* o: E: M0 S4 D$ _, G6 M
phenomena
* h; Y' K" w; z! W! k$ ?' gTest level
0 h1 H) a) Z8 B! A) m8 Y) kin % UT
# J+ ?+ t4 N5 f8 X8 r+ t50 Hz 60 Hz
, T9 S; M4 B: s4 v" {Voltage dips
0 p4 x9 q) I7 X _in % UT
8 y3 W; c5 a7 s6 n9 a' ^100
, F5 f0 R7 b& w, {& ~# O$ V+ q, q60
; X% m+ R7 q% ?- b, }+ L- K30 A4 s" ]# j7 d
0 F1 P5 @! l5 m" w4 P
40
: r5 I: P2 D; g70# u* |/ l4 _; l4 X$ m4 K7 d
0,5 cycle
% g% R1 e7 c& Q( h6 O, P z! Q10 cycles* O/ k" o6 O/ [' h
25 cycles
- w4 {0 G, M) r i: D" H, }0,5 cycle8 G4 ~& i% J! m' R1 u
12 cycles# h$ I2 E8 m' w* p8 O, \- v
30 cycles O% M/ Q7 I9 }; c# z
IEC 61000-4-11- \$ X; v1 E, c `" b
Voltage change shall: O f, k7 Z/ J* v" L: r
occur at zero crossing- o8 m/ i' j8 t5 m/ |
UT is the rated voltage of the equipment under test.! r, l# K N6 B4 r7 ]
4 @/ s% C: x" w( ~, r0 X, k) r3 C; }0 n, n
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –" _+ m% ~: k/ j/ ]/ h9 Z4 `
Page 27. M9 G. M( H$ Y) u0 i
8 Conditions during testing4 I' B# v1 y) r# d
8.1 Replace the first paragraph by the following paragraph:
8 R% y3 I. s0 O5 f3 B3 r! P9 fUnless otherwise specified, the tests shall be made while the apparatus is operated as4 V* j$ }' O0 c/ F3 E8 Y) s
intended by the manufacturer, in the most susceptible operating mode consistent with normal/ C. E# N- p& j4 o$ ~3 ^& h; q& K N
use.) E& H w2 p5 i* F* P# @
8.4 Delete the second sentence.
$ S/ B$ i2 R* S, S8.7 Delete this subclause.! d5 v" _; c# @9 a: p5 f- c
8.8 Renumber this subclause as 8.78 H3 z6 D; W% G# Z
Page 29% T5 e" t5 c4 Q I* N' e+ v; |+ a
9 Assessment of conformity
8 j, _' c. N: J4 e8 y9.2 Statistical evaluation
0 ]) c3 J# p! m/ h# wReplace the existing Note by the following:6 s1 m6 o3 c. b( P8 f
NOTE For general information on the statistical consideration in the determination EMC compliance, see
! K- I. _4 ^9 `% K7 CCISPR/TR 16-4-3.
; j* w) }7 m9 \: K) `7 cPage 313 e! ^2 U5 T/ [" S' I
10 Product documentation
. o: s1 V6 K" Z: [! U9 UDelete this clause.+ q& z* Y) {8 F7 \- d; l. u
Bibliography
. X1 Y- n$ b) a% w' ?1 x( DReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
/ h: d7 X, v+ L/ P0 f4 y KCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
! @1 ^9 c6 M1 B. ~6 ~methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
6 J& Q* n) F1 m$ _% e! [ E4 nthe determination of EMC compliance of mass-produced products (only available in English) |
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