CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
+ K- H. z3 g- Z8 y6 V請參考附件
) B* ]) H3 x& [
& s/ k! S0 [, e其中,
DOP : 表示發行日期
' n$ n* b* p, L) m1 n+ V通常DoP 之後就可以開始使用
. ^& d' I! T& I& T.......

  O$ k/ ~, H8 z, T4 Z+ ?/ c; ?
4 r" R$ ?5 B; ^$ s) d可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :
" \! Q0 i! c* H: g& E- s8 b- q( j
) o) y8 R, O7 q) o9 {/ F/ a8 D

可以贴上链结网址吗? 谢谢.

. ~* ~! `. w' U# h5 B  ]5 w- {
  l* C0 ~- K+ W& }http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下

% L- L8 z. b+ u% W/ {# L# o: D% Y6 c; sPage 9
/ a7 F- o- j* w+ Q, B: G$ ^: A1 Scope and object
3 C3 h$ Z1 l0 @! }; p( b+ iReplace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
Page 11
2 Normative references
+ f! s+ j& f6 N( ~/ O$ ?1 m. F, MReplace the text by the following:
The following referenced documents are indispensable for the application of this document.
8 p9 ]! ~/ y, B5 @; @- M$ CFor dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
% m3 S4 G2 X) vIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
. e! `9 k' e: T9 E3 H0 QElectromagnetic compatibility

6 M3 B; H( r. v! R) B
# i& Y' d3 Q+ h  f' w$ qCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
7 z* Z8 R7 b+ ^$ k7 NIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
$ }4 n  e+ c: j# C' l" \+ T3 Kmeasurement techniques – Electrostatic discharge immunity test
0 T' k0 d7 R0 ]" w; L. p, x! {' t9 {Amendment 1:1998
9 @% G% e. ^. o) ~6 }Amendment 2:20001
+ j3 B. S% ]5 z6 @/ q, HIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
. M7 o5 M* |9 {# rAmendment 1:20072
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
: k" V- s+ j4 F6 g. j. jmeasurement techniques – Electrical fast transient/burst immunity test
% r+ f0 Q. n) `6 U, j  UIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
, _1 G8 d  f2 ?5 Gmeasurement techniques – Surge immunity test
8 {  |) Q+ O& Y7 m; \" U# eIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
' O$ w! {4 |, E/ v3 M9 xAmendment 1:2004
) t" L# {- T4 v! @) \3 {6 X* FAmendment 2:20063
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
1 j- C9 m2 [/ h3 u2 ^! NCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
Page 13
3 Definitions
! e# w: g  U5 i+ u- ]Replace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
For the purposes of this document, the terms and definitions related to EMC and related
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
Add the following new definition:
3.18
  e$ }1 e. ^' f& n3 kclock frequency
fundamental frequency of any signal used in the device, excluding those which are solely
$ c' R+ ]6 X- v. P+ W; Dused inside integrated circuits (IC)
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
5 p+ ?/ U. `) @9 A3 Dfrom lower clock oscillator frequencies outside the IC.
2 G- @  l% s8 v___________
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
% r4 h5 O0 l7 r# |; a3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
1 f3 T  n# V( H% p* D
/ O8 ?# }4 S8 N1 b' O; q
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
Page 13
4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
Page 15
5 Tests
: _: O4 x! B+ T. f0 Q9 oThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
1 v0 H0 B4 L7 D& cPage 21
5.6 Surges
7 M, N! ~/ N/ |8 ]( N5 I2 I( mTable 12 – Input a.c. power ports
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
"Line-to-Line with 2 Ω Impedance".
After Table 12, add the following paragraph as a new second paragraph:
' M9 `+ l' s& ^The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
' _8 r& J$ }2 _) R, _7 {the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
given in Table 12 are not required.
5.7 Voltage dips and interruptions
' ^# C- }& [4 tTable 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
Table 13 – Input a.c. power ports
# }* w" W# ]8 V6 lDurations for voltage dips
, t4 \- e' U; s8 G: C. r9 v1 d' o) ~Environmental Test set-up
phenomena
Test level
! r& [6 T* V: y) J' _in % UT
$ s4 p/ J5 _# l. J8 f. y50 Hz 60 Hz
Voltage dips
in % UT
100
: U) Z( K" b! s! J& g60
30
0
40
70
7 U, q+ Y: X- L, x0,5 cycle
) J/ Y. G' H7 o! w- {- _10 cycles
! J& r: ]" C4 s0 n% V1 a8 B8 t25 cycles
8 m1 s2 ]! o0 W0,5 cycle
: X6 D  G5 _1 L2 @9 A( [1 ~12 cycles
30 cycles
IEC 61000-4-11
Voltage change shall
occur at zero crossing
1 L# ~/ z1 m- ]UT is the rated voltage of the equipment under test.
: J1 a4 I9 {* I, O( Y

CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
% U9 H% y1 H4 m' T) W, {Page 27
8 Conditions during testing
8 U" p) F4 H$ g8.1 Replace the first paragraph by the following paragraph:
  I$ ?: l! j4 k% ]5 wUnless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
0 @! g: t8 C/ i7 S/ Q  guse.
3 b. C6 ?% N& R  H% g7 j8.4 Delete the second sentence.
8.7 Delete this subclause.
  W/ G; T+ P, b8 @, `9 Z9 \8.8 Renumber this subclause as 8.7
, {# x% ~" b2 F' c' Z% @$ J5 K6 ~Page 29
9 Assessment of conformity
# O+ ]( K# F6 d5 ^! W% g0 S9.2 Statistical evaluation
8 b0 m, y/ J2 `. i' f2 TReplace the existing Note by the following:
/ k$ @) d7 F. h6 @* oNOTE For general information on the statistical consideration in the determination EMC compliance, see
. F/ z! P; d4 O9 R3 T7 U& UCISPR/TR 16-4-3.
Page 31
10 Product documentation
Delete this clause.
Bibliography
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
! U6 k% l1 M3 \the determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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