CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
請參考附件
, _+ R1 @% d# i$ t2 H) R2 I8 y
7 H. \, [% V7 D& B其中,
/ q) N- Q/ |5 |6 i; ]DOP : 表示發行日期
通常DoP 之後就可以開始使用
/ }$ X% m  u$ A' F) F.......

; q5 b3 C# k6 b$ n9 }可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :

' x2 p% _* M  K! m8 Q/ h! ^' ~

0 n  n9 A* m5 w! k. O. F可以贴上链结网址吗? 谢谢.

$ `) x; \' L+ R# y1 e! mhttp://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下

0 o  ]% @- |& i  i/ V. O/ F- v/ v1 Q0 GPage 9
1 Scope and object
Replace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
. N; p  L* q; M6 g. BPage 11
, `% ^& x7 `1 P2 Normative references
Replace the text by the following:
The following referenced documents are indispensable for the application of this document.
/ I0 h1 D: h! G4 x8 QFor dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
7 [* E. ?  _3 X7 f6 s* Q( f0 J
# s2 Y/ T$ x! F3 q" m% y' {4 P
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
Amendment 2:20001
( l2 O4 e. e* }6 V3 M) oIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
- t( c' G2 G& s" A8 vmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
Amendment 1:20072
6 B6 i2 x* W0 k0 U, M+ P' x/ r4 MIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
6 Z: G8 O3 u2 t; A" V6 Pmeasurement techniques – Electrical fast transient/burst immunity test
( Y+ X5 H8 `# z1 A! D  JIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
/ }+ G4 H: X' P6 s" M3 dIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
Amendment 1:2004
, A( F! B- ]3 p- l8 e, g! U& hAmendment 2:20063
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
5 L) Z7 v5 ~! I* c4 }measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
" _7 ?  |) S" \2 Lelectric tools and similar apparatus – Part 1: Emission
Page 13
3 Definitions
. ?6 _5 h, o, H6 `5 k, U8 zReplace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
+ W& s8 I9 P! t7 K) i. OFor the purposes of this document, the terms and definitions related to EMC and related
" s7 ]# |2 k5 ^( ?" V0 r1 Cphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
( u* G% i# A6 K# e2 F1 c1 }Add the following new definition:
. ?# |) j! j, J8 Y! v) [3.18
5 t. j' m, i4 [  ?5 {8 z8 q0 r3 Wclock frequency
% g/ U0 R, Y+ D5 ]+ ~fundamental frequency of any signal used in the device, excluding those which are solely
used inside integrated circuits (IC)
6 g$ p1 G$ o' b$ n: jNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
___________
* U7 Z8 s: Q- v6 }1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
4 q5 ^9 }6 U6 W$ ^2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
9 P9 \) I' |0 N- N: G$ h/ m" {$ x9 }

( F2 I# {1 l, t6 O– 4 – CISPR 14-2 Amend. 2 © IEC:2008
7 _8 [7 v5 V8 X2 C! }Page 13
. B6 e+ P8 S8 ]- N! L- j4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
Page 15
, M' C9 ^; y, @5 {" g: ?5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
Page 21
5.6 Surges
/ a# }8 D8 |: S/ N% @0 ATable 12 – Input a.c. power ports
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
"Line-to-Line with 2 Ω Impedance".
After Table 12, add the following paragraph as a new second paragraph:
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
6 o! {) \4 O9 R4 v! sthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
given in Table 12 are not required.
2 [. B+ P; f2 a* F! v2 H1 q' c5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
Table 13 – Input a.c. power ports
3 B; j' I& F  C6 W5 n$ sDurations for voltage dips
Environmental Test set-up
phenomena
Test level
in % UT
' l2 v9 S2 ^$ f6 Y( N( s( p. M50 Hz 60 Hz
- p0 E+ m$ i0 L( R" l6 T! AVoltage dips
, `) I' v* r& M1 l. p' _in % UT
100
60
30
- j. D9 [+ u+ ?, B3 }0
40
" V$ Q# o6 C# {8 Z70
0,5 cycle
10 cycles
25 cycles
0,5 cycle
% [% S9 z* q/ M( x. D12 cycles
30 cycles
IEC 61000-4-11
Voltage change shall
occur at zero crossing
UT is the rated voltage of the equipment under test.

4 ~7 C4 j) t4 o6 ]9 F
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
4 E% h1 {% ]" z" C2 QPage 27
# s3 w; l9 M. p8 w2 d% @5 _; z8 Conditions during testing
: \$ I0 a0 j- R' s8.1 Replace the first paragraph by the following paragraph:
Unless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
* u' ]. A" a8 H0 v! E7 puse.
8 C8 D" Q$ A; k; X+ v7 G& W1 K2 _8.4 Delete the second sentence.
8.7 Delete this subclause.
8.8 Renumber this subclause as 8.7
) J4 t9 T/ t" FPage 29
6 g: g9 @! H. u- e4 d6 A9 Assessment of conformity
: e$ s$ T+ Z7 a4 [& B9.2 Statistical evaluation
4 T+ A, o5 `, s  E$ N% {Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
CISPR/TR 16-4-3.
4 O0 `1 x' j! }9 O# L5 P/ S3 o5 XPage 31
) w0 O0 \6 R( h0 o' H! j7 n10 Product documentation
! s( c- A/ S- B/ {8 y% kDelete this clause.
8 g3 p* l! a& k- S) wBibliography
" p9 V6 M- t( C- j7 F# nReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
7 Y; `1 B& ~3 d+ o4 n8 X5 uCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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