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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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Page 9
* @2 |9 J/ N( F5 f0 _5 m! |& }1 Scope and object6 M. W# i+ r$ Q, u% v, z% a5 P6 W
Replace the title of this clause by “Scope”+ c7 _( F1 @4 P: R! z) Q
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
4 K, O0 E+ s' Q4 V1 iPage 11
) F, L5 J, S d% }2 Normative references. m' k5 `; |/ I5 Q$ \, Y' _# j# p
Replace the text by the following:
1 z( H4 s3 Y1 ?' }% JThe following referenced documents are indispensable for the application of this document., T# q* O: \% P" Y' h9 i
For dated references, only the edition cited applies. For undated references, the latest edition3 E( m3 R' b4 T7 D, c: S9 V8 J
of the referenced document (including any amendments) applies.
7 A5 J# L8 V3 i9 w) c$ Q5 MIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:, d2 P! R# e" d; S
Electromagnetic compatibility: h: S7 w& W/ I' ?
0 _5 v( R% |, o6 G
7 r- k7 L& |3 p
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –" S1 {; H3 B- t1 I: O% X$ Y$ d
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
$ x- u9 N% C9 E5 b) Ymeasurement techniques – Electrostatic discharge immunity test
0 v; b9 O) f2 v: MAmendment 1:1998
3 B, `5 G* l9 yAmendment 2:200012 H" q9 p6 t8 |% ~
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
# z5 x/ W- ]2 z2 Smeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
$ k7 @) r* ^! j. f" u& D. ~8 m* _Amendment 1:20072
/ i- X1 ~' \# f; t7 _IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and$ r: x) n# d0 y9 K& _, O" [
measurement techniques – Electrical fast transient/burst immunity test
& m4 q6 o2 [* _/ r9 `. ?IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
2 I- n) T1 K( n$ F, J3 U Mmeasurement techniques – Surge immunity test
1 @9 C4 q& b1 I# a ~# Z8 @IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
! r4 D# H/ r, W- {( e+ hmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency1 w7 n- A. _) W6 ]* a! a
fields/ G- g2 i5 g2 ^8 g; _) d( F+ T6 B
Amendment 1:2004
+ C5 e( S$ r' ~ KAmendment 2:20063
' C( X1 w% E/ ]4 N7 K0 l/ f: V" MIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and! @3 N7 H4 r1 L D' V- Q9 _: `* u
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
& u8 B# ?7 Y( W4 D- qCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,3 }" r+ D& [ s: A9 f- |
electric tools and similar apparatus – Part 1: Emission
3 y/ ]- f4 A! T! LPage 134 [2 r7 l% p8 e- n% K
3 Definitions e. P3 a( T: h
Replace the title of this clause by “Terms and definitions”.
* M- Y) v; Y7 F4 L6 [. r RReplace the first paragraph by the following:
6 U1 D: K4 W0 ~5 o4 Z- h, p: nFor the purposes of this document, the terms and definitions related to EMC and related
9 {& o7 V% g# i& e% F; P3 j: Mphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
! h- h9 Q; t6 l' d8 t# ]# W4 L3 I" WAdd the following new definition:
0 Q4 q4 y9 e6 X6 _$ @" Z2 C9 M/ F3.18# b: h1 x1 x' o) E7 N
clock frequency
2 @" j7 {0 I' l8 l' Ffundamental frequency of any signal used in the device, excluding those which are solely
% G x8 h6 F+ Y8 x' B" Y6 oused inside integrated circuits (IC)
. z2 Y3 W3 G: _! p z1 sNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
0 \3 `3 k' b) K* I* F. @! Mfrom lower clock oscillator frequencies outside the IC.9 ]; D" e5 D# e$ \/ B q
___________0 f' M2 w0 F, T" |0 t+ F7 Y: @& N
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
% V7 _9 ~8 c8 \6 @+ n" \2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1./ u3 o7 c+ }- s9 u0 H3 C
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.) O/ |. Z3 x8 j: K% |3 D, Q
' U, S; c/ c. O+ [8 Q! z1 ^' r2 [( ~1 K, `/ Y4 _) g
– 4 – CISPR 14-2 Amend. 2 © IEC:2008+ t, W6 F( @' x& z5 ^
Page 13
, A9 I6 h' e5 a; l3 j" _4 Classification of apparatus: Q8 c+ b! q- Z2 C" k% U6 B
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.) T5 N+ R: w2 ?8 x/ x
Page 15
6 O9 Q1 s& z0 N: x0 e6 k2 | H7 z5 Tests
9 S8 E' v) e _0 x, dThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.' W' S0 p+ O8 G- E" j
Page 21+ w g. R5 X* u- M" m
5.6 Surges& d- x' ] s- ^' L
Table 12 – Input a.c. power ports
6 b1 B# W; D- ~, g& a4 q. sIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
" o, d$ I2 S! K0 `3 c"Line-to-Line with 2 Ω Impedance".) u) T$ d0 Z- k" S4 t" F2 O
After Table 12, add the following paragraph as a new second paragraph:* M, z, n& l0 r
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the* k- H/ h7 K' S) C) P3 j
equipment under test, and the negative pulses are applied 270° relative to the phase angle of* K8 C& j4 ]; x1 D J9 X
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those) H" U( I0 w6 _( J" Z6 s2 [& d1 {
given in Table 12 are not required.
1 T9 ^, D3 d5 P$ o6 S5.7 Voltage dips and interruptions" o& ]9 v0 m3 `2 b
Table 13 – Input a.c. power ports/ R2 M2 t2 L( M
Replace the existing Table 13 by the following new Table 13:
5 R) u# T+ D* o* J' f7 c' bTable 13 – Input a.c. power ports
: p0 x5 V7 z; e2 b( L- BDurations for voltage dips) o% d- Q2 W+ ~- y; L5 Q( O- P
Environmental Test set-up" N3 @) P2 m. A: C8 E
phenomena
" q8 n2 r2 l. N& D1 E+ tTest level. Q3 S8 h( Q5 ~8 V) H
in % UT, M, j! T5 o) r+ b' w: l
50 Hz 60 Hz
/ D: y# |# C( `! A( L9 vVoltage dips& R& P/ x7 N' W+ q
in % UT6 @& g2 d& w, x
100
. j$ r2 k8 I( I3 I6 `5 ]60
5 U& u$ h0 f( p0 ^- c0 T30
* \1 T3 Y- s/ E V; O( n0
* I# f9 ~' y. y$ Y e4 d4 @) R& K40
! a' k9 X8 {, x, f$ \70
! P* q5 _4 e7 T8 l0,5 cycle* I8 }( J4 ?# }( R% `4 T* h* M
10 cycles8 g6 Q( C. R3 j$ Q1 b
25 cycles: p6 x1 r0 \8 T; ~' `" F1 X6 @. r
0,5 cycle3 z9 B4 g0 H* R" K) ?8 N1 W
12 cycles
( ^5 R) w% W& ]+ O3 I30 cycles4 g# ?$ w& d2 Q8 m( ^! d
IEC 61000-4-11+ f' `, }1 O/ q7 J2 W/ l
Voltage change shall/ v" h3 O. Z }0 ?8 C8 j: X
occur at zero crossing# V$ P$ J4 j# W8 x2 `8 U
UT is the rated voltage of the equipment under test.
# E' J7 X0 e) B* I7 }
+ A; m) B% m4 g- r5 r7 j, z
, A, e2 ?$ O1 SCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
6 M5 P. q" V$ n, y: n+ S* W7 s2 QPage 27
* U" N7 H% s& ^! L- j/ C+ M8 Conditions during testing- n) p( N, r5 P; y" Z; U
8.1 Replace the first paragraph by the following paragraph:# g( _# H' k. J( v2 i3 K8 \
Unless otherwise specified, the tests shall be made while the apparatus is operated as
b4 x: [% ^# Pintended by the manufacturer, in the most susceptible operating mode consistent with normal
0 j! X( ^2 H+ ^) O7 i; ]& ^use.
$ c4 e* J) @: I8 p' H$ {8.4 Delete the second sentence.- a, y4 P. T8 T8 {* _0 q; M9 \
8.7 Delete this subclause., I8 n. R1 o0 V, l* ?( J: `3 ~
8.8 Renumber this subclause as 8.7
$ U1 o3 |' u: u0 [; Q0 L4 XPage 294 s {/ h: X: H9 n: x. `
9 Assessment of conformity
( T1 j6 w: m/ ]2 r! ]9.2 Statistical evaluation
, p5 x/ x3 r6 D1 Z7 FReplace the existing Note by the following:
" ~% n" Q+ b. n" W& e* |; V9 XNOTE For general information on the statistical consideration in the determination EMC compliance, see
0 H5 l" d0 B( _/ V2 ?9 LCISPR/TR 16-4-3.$ |( U" x+ Z0 X: ^ ]: l
Page 31
$ u" a( k: [. g9 J( K10 Product documentation1 U* q3 c- v1 D! h# u1 R! _% g
Delete this clause.' p/ M3 a6 l( {0 ~8 ]' @
Bibliography
; F" Z8 k( |* |$ D8 p& NReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:! g& ?3 j/ E1 t& M3 V* e4 V
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and: ^9 R# k+ Q( |7 Z( k* O1 {
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
# n) C: k7 ^* M6 L# t7 B( othe determination of EMC compliance of mass-produced products (only available in English) |
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