|
|
由于我的标准上有公司名字，就不直接贴上了，差异部分如下
; |6 P) P3 w5 k }. k0 C! B" E% h; ?! N
Page 9
2 }, x( z! g+ Q5 a+ B! o# z p& G1 Scope and object& ^7 I9 Z; y Y, B7 E) O, M; J# }
Replace the title of this clause by “Scope”
; A: q- a/ b1 w% ?1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.# X6 y( m) M& K0 n1 A
Page 118 E8 l `( D m7 M1 u( K
2 Normative references
' M" B: C; ] l- S4 C6 fReplace the text by the following:* A8 x( v' X/ |) _4 w
The following referenced documents are indispensable for the application of this document.
' x; O1 U! M+ e- t8 QFor dated references, only the edition cited applies. For undated references, the latest edition
9 M! t- l; ]" z; Qof the referenced document (including any amendments) applies.
5 D) b* c% D( O( U6 kIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
" N0 @' o6 \- |" kElectromagnetic compatibility' T8 `& g+ d. t' e. a. U1 z
3 ]% } j4 ]# `5 s' B3 e7 _
' ~1 {7 v" B$ |$ a+ U, l% |# y9 G
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –3 s9 m( `" C/ n" C* r+ P, v0 z
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
/ C Q5 y2 ~8 |4 ?8 ymeasurement techniques – Electrostatic discharge immunity test
' _9 [0 a% P% g- g) dAmendment 1:1998. U; o1 Q/ g9 d* b: f
Amendment 2:20001
& X2 I1 r$ R/ c: Z5 f$ b. F0 u5 cIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
. P0 `! A$ z' `) T4 C2 Jmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test7 }7 p# k5 A, g8 ?* ^
Amendment 1:200723 D: S. Z" E6 B) w
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
1 }/ h- i" V* x' t f% V- T$ L, }( ^: Nmeasurement techniques – Electrical fast transient/burst immunity test2 G+ o0 g* X6 Z5 m. U: l' W
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and6 q# \" ^* R+ ^( ~4 q1 B
measurement techniques – Surge immunity test' d' x% Q8 O9 q8 n) r- |" l7 d! `7 [
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and$ t4 ]9 G6 H1 a7 L7 P- {2 P: o9 x
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency; z; o1 s# R- E! g( ?5 h
fields2 t! g( z1 e6 K, u) y2 h) I
Amendment 1:20044 V3 A' _3 Q1 g
Amendment 2:20063. A3 o/ B: q) w. t
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and% p1 J7 f$ M: h1 s: E
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests6 E6 ~' X7 o; X# ]
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,' L& k' d# P* a5 B
electric tools and similar apparatus – Part 1: Emission' }: K6 }! Q7 Z, }; U3 W0 y2 ?
Page 13
P6 [1 S# f* ]0 R, v n$ p' b! d3 Definitions$ T9 z- Y8 ]5 C1 ~$ `. V
Replace the title of this clause by “Terms and definitions”.( C0 i+ h7 v6 H `6 v
Replace the first paragraph by the following:
- A9 Q1 l0 p% {# h% s: a% H3 \For the purposes of this document, the terms and definitions related to EMC and related' L1 Q) r2 t8 h6 O; [) A
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
1 d1 c7 B$ A( s( @8 YAdd the following new definition:' z" U5 r6 F( G; q' D- H
3.18
( M# Q; J- l6 K ], v9 oclock frequency7 O2 w/ s5 Z: v, H: t5 e9 e
fundamental frequency of any signal used in the device, excluding those which are solely/ Y/ g: C7 U) j, |& @5 `, p
used inside integrated circuits (IC)2 J0 L5 ?6 ^5 e0 }7 ?3 \+ ?; o
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
& s. n: D' X z9 s$ ?from lower clock oscillator frequencies outside the IC.
0 `& X' E3 D' u6 i, N___________
$ _0 D, D& {2 ?- [6 d3 ^1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.! ~# p: `2 P! @; m1 J
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.+ j* s u V7 g
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
, {9 X9 |* V4 w4 L' ?7 ?( x) f n; R% K, z: P. e$ b) s
U# v0 p1 R2 {- ^( r– 4 – CISPR 14-2 Amend. 2 © IEC:20085 Q# \' c1 i; N l0 x5 E$ \$ z# @- f
Page 13) O, @; i8 @% i `, v
4 Classification of apparatus2 \' t6 m2 I. a" w/ z! r5 O
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.8 H6 Y5 G) | t8 M) g7 p
Page 15
5 x& O! v# T! J+ T% p5 Tests& s) P+ z: B* H+ W" C
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.2 `" |6 ^8 N J/ Y& S0 c
Page 21
( U+ J- {, e. V; z* {5.6 Surges5 V4 w4 t% i+ A! a* G( }: b
Table 12 – Input a.c. power ports
. `6 c' K5 V" s0 _1 N" `In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
& j3 e/ G$ d' f"Line-to-Line with 2 Ω Impedance".
, _, \: v( G; n' E& UAfter Table 12, add the following paragraph as a new second paragraph:
& ]4 [" A, y3 [) E3 L+ l# L k5 }The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the9 ^& d: T( G* C) r. O# E2 _
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
& g2 l( T' ?) {% _6 {" ?$ P9 V% uthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those- f: u, u: b& ^2 X% {4 j, U
given in Table 12 are not required., {0 ]4 y8 H' S) q' b
5.7 Voltage dips and interruptions
8 L7 e6 h) C" Q0 L1 W) dTable 13 – Input a.c. power ports( Y' f0 ?$ e# \; ]& y6 V
Replace the existing Table 13 by the following new Table 13: x, u. j) S& {- X* O. _
Table 13 – Input a.c. power ports5 @2 s& v6 E$ `7 _# I
Durations for voltage dips
7 {7 w4 u- z& AEnvironmental Test set-up! {0 ~0 c" S$ u; m) A# ?
phenomena
8 b8 w- N% o' r2 FTest level: `- B3 R0 N9 ^6 N
in % UT
. `, i% t3 c6 L4 X3 X6 n50 Hz 60 Hz
8 j5 G& ]" @/ f; KVoltage dips8 c3 ?% ]5 q3 k# S$ M9 l B
in % UT
1 f. F9 t. n! M3 S! j( U100
4 {' n- I5 O/ t! U7 e# c1 Y60, a' N- I. [5 {+ J, V! ^1 a: |7 [
30' }! Y: x5 E) c0 ^7 k3 q" D7 N
0
' m" H9 r$ l$ i+ b/ k5 L40
9 h3 y1 E3 Y1 c% {) o4 \- W: \70
; f! Z* d1 X4 |7 E0,5 cycle1 k' j9 W# K. F; k
10 cycles
5 O+ `+ j; ]0 J25 cycles
, O" ?: Y9 ~% k R# t( J; w0,5 cycle
0 o$ Q' C8 d/ n6 V: u12 cycles3 ^( U4 W! _8 M( X
30 cycles: K, W, l6 y2 }- E3 s/ D
IEC 61000-4-11; _$ r ?' J0 v
Voltage change shall
( J2 B& ~" }' M2 }9 o/ k) v2 woccur at zero crossing
% P7 f- ?" r+ Y5 V& gUT is the rated voltage of the equipment under test.
6 m* T, H; v9 K5 l) `" q/ s% { Q$ v+ m+ q! @! p" t- J
# A% E6 a& A, u9 c; a. w& m7 oCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
9 G. {& i0 b' W6 |* F' M. M1 TPage 27
* f* T/ v2 u$ z& v: W* M/ {& ?8 Conditions during testing5 F8 ?: ^6 ^/ S: L- g6 K
8.1 Replace the first paragraph by the following paragraph:. z- c* i) B* G
Unless otherwise specified, the tests shall be made while the apparatus is operated as
9 o; L$ ~' n3 l4 Z2 N* z: c- cintended by the manufacturer, in the most susceptible operating mode consistent with normal
% B" }9 _1 Y0 {4 p( r B2 e2 y6 q4 Yuse.
# k6 v( f- f$ M( P9 H7 c8.4 Delete the second sentence.9 K+ Q9 x5 `1 @1 n4 |" h: G, K
8.7 Delete this subclause.. i6 F7 z0 s& Y% g
8.8 Renumber this subclause as 8.7/ i, l5 x0 ]" J
Page 29
, Z z/ H- J4 J$ K! o; m/ `9 Assessment of conformity/ p* t& Y+ A7 c& H7 K# G$ z
9.2 Statistical evaluation# l" d0 r1 P, H7 K' L' Q2 h
Replace the existing Note by the following:
' G4 ~5 p9 c$ k/ wNOTE For general information on the statistical consideration in the determination EMC compliance, see# t2 f) D0 Q# E- U( j
CISPR/TR 16-4-3.
: X- ?0 D2 D. z* k7 m+ s, RPage 31* m$ r% W- {$ ^" M% G3 a8 L
10 Product documentation
: E- R# z7 u" U& T! K% ~% L4 xDelete this clause.' R; P6 k+ ~: H
Bibliography6 |' i6 P% z& G& X- `) |$ k+ y
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:) H8 l5 ]' E3 }3 |* C( x
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
0 r9 W0 \( v" J: K( y0 u, Dmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
2 Q, z+ s& r. J* G( h8 K2 P0 ^" Pthe determination of EMC compliance of mass-produced products (only available in English) |
|
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 )
窥视卡
雷达卡
发表于 2009-3-11 08:21
显身卡
发表于 2009-3-13 10:04