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由于我的标准上有公司名字，就不直接贴上了，差异部分如下' P2 N- a5 D" a2 @% @
( ]+ [7 f/ w2 X& ?2 \2 |" T- APage 9
0 J% U K. k4 z1 ]1 Scope and object* I2 K/ W, s; O
Replace the title of this clause by “Scope”
3 g) S8 M0 G& C% X" ~1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.' ~" t. F/ _6 B
Page 112 N( L& F# h8 I8 Q) T6 z
2 Normative references
$ @7 g( F) j6 {" pReplace the text by the following:
" W2 c# C. T$ @0 f( N+ u( s- S$ LThe following referenced documents are indispensable for the application of this document.
. a+ M. m; R% T3 `; O) @0 s: T% A9 jFor dated references, only the edition cited applies. For undated references, the latest edition% u9 a z/ I5 K/ ^ y
of the referenced document (including any amendments) applies.
. b2 b7 \' m+ D$ I! y1 dIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
# A- z, n6 r, T. d- @0 N2 @# OElectromagnetic compatibility7 r5 R! s3 I0 R; W5 m
* K; {& _5 q: M- Z2 I' D* C" U! q
5 l2 c6 ]* q9 D1 P; ?CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
$ A% c7 |8 c$ O& wIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
) S! N4 Z3 b) |+ C+ N4 d4 z5 j! _measurement techniques – Electrostatic discharge immunity test
: U$ Z6 ?9 X- l2 F- d) _Amendment 1:19980 i Y+ M5 m4 F) S. Y# ? M% O0 U
Amendment 2:20001' K6 F- ^' _7 r2 n: n/ Y
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
% W+ W( \% o( Rmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test; ]! }/ m- w% c# |( M
Amendment 1:20072
* C+ i4 c0 V+ lIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
9 @4 r' t( J" T* J& T J" |' Zmeasurement techniques – Electrical fast transient/burst immunity test1 Q' G! H+ N* B' ^; C
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and B2 u0 r( `5 k! ?1 E- X; v6 p
measurement techniques – Surge immunity test; S Q- _- I+ D! U7 z
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and, K" |) f. D, S% B/ P s7 P9 L, w
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency/ G* t+ g4 b* ~% [# g% a
fields" M1 Z% D& J% h! R' a) \* P
Amendment 1:2004; K) Y1 Q% h% j2 L4 }3 V
Amendment 2:20063
8 }3 X ~ O, Q3 |+ M% JIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
5 O8 h- c3 d- J& W8 zmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
7 T3 ]" _; m/ b2 I7 tCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,4 p# ~% T# L: R4 ]$ c4 h/ U
electric tools and similar apparatus – Part 1: Emission3 B0 C2 t" w4 ^! J/ ~6 N( o8 Z% i
Page 13
5 m& A" p7 M: @; G! a3 Definitions
3 x% k5 f; H% YReplace the title of this clause by “Terms and definitions”.2 w3 m8 R {: }3 L% V
Replace the first paragraph by the following:/ n+ f2 q# {- ^! m* n7 B
For the purposes of this document, the terms and definitions related to EMC and related
$ {% {$ S; u- }) R _; A4 H2 l9 `phenomena found in IEC 60050-161, as well as the following terms and definitions apply.6 v& @0 G ]) e7 c! z$ j& i
Add the following new definition:* @8 s2 e4 W+ u+ w
3.182 W' E9 E" b; A; a/ z6 y1 Z
clock frequency. R+ q, G+ C. t/ u1 `" ?; z
fundamental frequency of any signal used in the device, excluding those which are solely% s. ?% |) m4 U4 C, C4 P
used inside integrated circuits (IC)" V/ H! ]1 g% ~3 S
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits4 }/ {5 b: O' x2 Q
from lower clock oscillator frequencies outside the IC.
/ l& o3 f- q; \) d+ F___________
: C0 b2 n& U1 W' w9 U. }1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.2 R( O v8 K9 o% C
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
( x C9 o4 B2 U1 X3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.- R% I, a1 u6 A( A9 K1 A; W% C
# [2 ?9 G8 h- c* |
$ x3 C" f) g) l' \, S" u
– 4 – CISPR 14-2 Amend. 2 © IEC:20087 ]% g2 K) J1 z7 H, f
Page 13
2 L9 \' G/ g' y' w5 a( M4 Classification of apparatus
6 r) E3 u. K; v& m1 G( V1 O/ ?0 Q$ M4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
6 J% ~' h# R" |! s+ F0 aPage 15& n% l: l$ x2 M6 M9 C- r
5 Tests
; y; X4 \8 H$ @9 N4 Q1 }Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
J( A8 B' P4 n1 K4 F7 u6 APage 21
+ D9 F- Z4 G" j( b5 e# O* ?5.6 Surges6 ~# E& X: @) I1 P6 A
Table 12 – Input a.c. power ports) r, H& m0 Z5 z5 r3 u+ J
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add( g- K& B7 j9 M) L
"Line-to-Line with 2 Ω Impedance".- r' ?8 ], Z" e2 F$ e: X v
After Table 12, add the following paragraph as a new second paragraph:8 h i. A. U' N: {) Q
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
8 f% _3 U! A7 r5 [7 ]' e% ]! iequipment under test, and the negative pulses are applied 270° relative to the phase angle of/ x" T, o6 ]% [' Y R' S
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those! h1 n& V" W/ i
given in Table 12 are not required.
$ S2 f" s5 a; z5.7 Voltage dips and interruptions: J; b# j# `, Y8 m9 J- {/ N# H
Table 13 – Input a.c. power ports" j* `, k' E, G8 Q" E
Replace the existing Table 13 by the following new Table 13:7 K! d4 S8 N0 V# ? E
Table 13 – Input a.c. power ports7 A+ }# c( O; x' M" v
Durations for voltage dips5 j6 \, h* r/ v1 U
Environmental Test set-up
. b j& u( g. A, h7 [phenomena
8 Z5 ]- K3 U9 K8 E$ B: S3 @- MTest level" ]5 ?9 ]/ r4 p# U
in % UT
% @& J J- M0 Q, v2 N2 j50 Hz 60 Hz, ]! C; u( p; c' c. W- d; r7 r" ~
Voltage dips! \4 z% y ]" S' v* L
in % UT
" [& C0 H" g' S0 m& k$ r& \: ]1000 P3 M+ z2 T0 N4 f+ @% C# Z% u5 ], r
60
/ A m+ H; t- [: k& V7 W! X301 k" L9 r7 g: z# a2 W* F
08 ^& H; U5 z" D, v# ^
40: t0 C3 J, t7 z% M4 o! |8 B: u
70
: t& K8 c) Z- B7 `: A, l0,5 cycle
. Z$ S& a: Z- a+ h1 }10 cycles
, {9 t# [5 ]/ A: U0 r25 cycles! m9 b N3 d* p$ c! S
0,5 cycle! j. r' P0 {; q& C a
12 cycles
. m1 [6 O# F6 |/ G7 W1 C% T, `30 cycles
1 d8 R8 |4 D/ h; d6 WIEC 61000-4-11
) D$ x V8 W+ Z$ P+ K3 H/ {Voltage change shall/ i) l: H7 ~. ^& r- u: C9 T
occur at zero crossing
( Y9 H# g+ R1 Z m8 r5 w- Z' ]7 rUT is the rated voltage of the equipment under test.1 [& ~1 H4 `6 }" G( R
7 U5 c% Q! ]( H, v1 B! T
. k" R/ l+ s; {+ o" i# ^CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
! O. q8 k& @, Z. P0 e2 b% @: h: ?Page 278 ?; ~* G9 O" N) O" N3 L7 C
8 Conditions during testing) S9 v% B8 r8 p7 Y3 `$ H7 M
8.1 Replace the first paragraph by the following paragraph:
$ ] z5 M3 A! gUnless otherwise specified, the tests shall be made while the apparatus is operated as8 S9 `8 X1 D0 ^
intended by the manufacturer, in the most susceptible operating mode consistent with normal* G: a1 o8 q% `' d! k7 E
use.
: @6 {& G0 R3 f8.4 Delete the second sentence. C8 q2 Y/ i" ]$ E2 x, F& {
8.7 Delete this subclause.- T/ y; i/ G6 `( O
8.8 Renumber this subclause as 8.7& Q' O7 w% W" J- i
Page 29; p( j* P: E' o2 g& G4 F" f) }; R3 g, x
9 Assessment of conformity
F6 s0 ]2 L- W( `! A. o( ~9.2 Statistical evaluation
! P/ \5 @5 }, Q$ s! YReplace the existing Note by the following:
g0 s7 A% U0 _& B; Y* `4 SNOTE For general information on the statistical consideration in the determination EMC compliance, see
, P: n6 J- g8 F u+ h* xCISPR/TR 16-4-3.
/ X/ D, l j0 R+ A" }0 _Page 31! u4 p2 |2 H1 O& d) _
10 Product documentation
7 q7 Q3 X, |+ e4 n6 HDelete this clause.7 R* q9 w6 m& f5 ?6 E* n" S% j
Bibliography
+ ?. q; t7 _# a5 ?$ q6 SReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:9 a% A, i% k* n: Y7 m7 e
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
& @9 C* v, G0 r0 R% emethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
8 p# S8 S5 V* z9 `! e- E1 R+ ]/ K0 Tthe determination of EMC compliance of mass-produced products (only available in English) |
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