CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
  {  d# [8 O) I3 W; j7 V請參考附件

) D0 f: x/ s2 c0 [$ Z其中,
DOP : 表示發行日期
! t9 ~; t8 O5 ~: I$ N( k7 Z通常DoP 之後就可以開始使用
8 S2 I+ d9 I/ ^/ L.......

可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :


4 I9 Q1 u8 B5 r, c% Z& }+ {: A& c
; h( _  n( f7 z, a可以贴上链结网址吗? 谢谢.

' d# B  [) }! J2 }" W8 U
4 H' r, t- ~( U& w" Ihttp://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下
/ z% `+ ^3 y. r% x  k/ ]
Page 9
3 H" R6 h$ \+ {- c9 h8 G  g; K( U. G1 Scope and object
$ E: n8 L' k6 B8 kReplace the title of this clause by “Scope”
- ^" v: Z5 g* s9 m7 s7 ~7 x1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
2 ^2 ^3 u, [5 J% ePage 11
2 Normative references
- ^( Q3 I, m3 [* IReplace the text by the following:
The following referenced documents are indispensable for the application of this document.
- u0 m8 L$ p0 h0 XFor dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
+ p: ]' k1 M: Z- FElectromagnetic compatibility

, M5 W  A9 ]% W2 q/ Y6 C% V- [
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
8 _+ t$ D0 z1 o9 t4 Tmeasurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
0 F; x1 @' d. c& B6 H' I: EAmendment 2:20001
$ ], [9 |1 L9 z- S$ j8 A* BIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
  Q& v) ^  ^' hmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
" e7 O9 x& A; X1 j" I/ f+ I7 ]Amendment 1:20072
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
measurement techniques – Electrical fast transient/burst immunity test
) d% O6 b" V; u* nIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
Amendment 1:2004
7 M" Z- u: R" c/ H$ Y5 c9 wAmendment 2:20063
) l( D$ x, F* LIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
Page 13
2 v8 |5 ^2 X3 J8 g/ I1 _3 Definitions
; Y' P% c2 Q8 n" S9 R  r0 q& A7 DReplace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
For the purposes of this document, the terms and definitions related to EMC and related
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% w" G! _4 D. l6 p( S4 L0 S2 TAdd the following new definition:
& h: m, x6 l; ^8 z0 G+ {5 Q3.18
clock frequency
fundamental frequency of any signal used in the device, excluding those which are solely
! t5 a0 A( J( Y7 D, w. Y9 J7 n- k/ gused inside integrated circuits (IC)
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
___________
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
. Y) R6 h, E; S2 x0 G$ q# c3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
+ K& L5 Q; L6 e" i# W

– 4 – CISPR 14-2 Amend. 2 © IEC:2008
Page 13
4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
Page 15
5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
: R; o( f8 x1 TPage 21
: U1 i6 Z7 v, B3 |4 U/ v5.6 Surges
Table 12 – Input a.c. power ports
; u! T  u( ^/ nIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
"Line-to-Line with 2 Ω Impedance".
% G3 M# A5 z. W8 a: bAfter Table 12, add the following paragraph as a new second paragraph:
; n# v1 ~. ^  vThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
) D4 Y6 C) u3 m7 R4 K2 k3 wgiven in Table 12 are not required.
5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
5 Y2 B6 Q5 X, f5 e8 dTable 13 – Input a.c. power ports
Durations for voltage dips
/ b( [2 V, V/ _- JEnvironmental Test set-up
phenomena
' W1 c. N' F6 r- u, FTest level
in % UT
4 s2 m6 x4 R, R50 Hz 60 Hz
! m/ o0 w0 f! t5 b" H) G# m- l# DVoltage dips
- ^! N0 ]6 `! fin % UT
0 |6 ^7 N$ y1 Z# u1 V3 {100
60
4 p9 @/ L: Q7 j: }& I, t+ u30
* r; J+ N" r- t; P6 `/ ^2 l0
5 c4 D8 w" c, ~6 U  D5 R' G40
70
2 R5 p- X5 W2 C3 \1 E, i+ T0,5 cycle
10 cycles
25 cycles
  ?- G: _5 g& o" K) ?; U5 i0,5 cycle
" C6 u3 H, j, m" X+ }$ v) m5 [12 cycles
& z; |) m$ |, I( P9 S+ |! Y: ~( B# [30 cycles
" J! }/ U. G7 s% A+ H$ DIEC 61000-4-11
Voltage change shall
" \" E( ]& S+ q. f+ Coccur at zero crossing
UT is the rated voltage of the equipment under test.
! G8 c1 o2 M0 ~+ {

CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
/ r: N. [, q* ]7 z( u9 ?" MPage 27
8 Conditions during testing
8.1 Replace the first paragraph by the following paragraph:
! e4 b( ?' ~( c# }& ?1 k7 \Unless otherwise specified, the tests shall be made while the apparatus is operated as
& A1 p0 X/ q) \8 `2 vintended by the manufacturer, in the most susceptible operating mode consistent with normal
use.
8.4 Delete the second sentence.
# t1 |$ A" \+ w! J* `2 b8 ?/ k8.7 Delete this subclause.
; Z# b! y& \" z, l# u* X, l8.8 Renumber this subclause as 8.7
Page 29
' ]. m) w! r3 P) H  y4 u9 Assessment of conformity
9.2 Statistical evaluation
Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
+ v$ q9 |" ]# K9 wCISPR/TR 16-4-3.
5 f9 g: Q3 S. T# T, }& U, TPage 31
10 Product documentation
Delete this clause.
& \% q, D0 A+ t( ]+ M6 KBibliography
, E" n  X) P1 P# m( lReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
# e8 o2 u' ]/ ?8 P/ {4 I5 r* FCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
, \/ s# P! r& n. tthe determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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