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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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) O# p7 i7 C; y. J$ ^Page 9
: w9 J) b: M+ s9 o! Q1 Scope and object) g& J) Y' S; z& C$ I
Replace the title of this clause by “Scope”
, k8 O) B) x8 D' L/ ?3 B% v1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
' I5 D8 M4 ~% u2 J. \# f/ ^1 ~Page 11
' m, I: w) N9 l& ]% q2 Normative references( p \' B. R& G
Replace the text by the following:; w1 d. [& c' S& X, K$ D8 k
The following referenced documents are indispensable for the application of this document.
$ g1 B+ r" B9 ?For dated references, only the edition cited applies. For undated references, the latest edition
$ K% Q7 E) |1 `2 A( s& o I- \of the referenced document (including any amendments) applies., R# H; `* L+ C, q, F9 [8 E
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
* O7 Z" L1 h; g- BElectromagnetic compatibility
! S! O/ H) D0 d; p
" q" }) G% ]4 o! d! G3 M1 A" \+ v r% I/ g' n, T3 G1 m
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
$ F) I+ A4 n2 E: @" KIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and0 e/ a4 W- o& @- z* S
measurement techniques – Electrostatic discharge immunity test
1 U4 q" u" ?" @Amendment 1:1998. P( h7 E5 ~/ B, P! \' w G! m
Amendment 2:20001
& {6 h; M6 l6 h2 Y/ [6 _IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and$ I1 j* A5 D- A5 B' {/ i
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
; J, Z6 S' Q' o+ W# g+ t" W& lAmendment 1:20072- i5 P% M0 J9 k; h" d- }5 g; M# _
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
+ O. L( i" C0 f. G! _measurement techniques – Electrical fast transient/burst immunity test/ m- y# |" f Z5 {
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
0 r9 L* B: Q% H# d9 Y8 i2 j4 J1 cmeasurement techniques – Surge immunity test
* v# |+ A& f9 v$ V( w* S3 `IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and0 Y% ]# C3 Q" b
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
% e8 [# u+ c2 o8 q4 dfields
1 w- }+ G8 z4 e/ @# _# uAmendment 1:2004
2 b, Y' Z z/ d+ e1 B# nAmendment 2:20063* I" q1 [( p1 a( l8 \9 U: @
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and3 P( X) L$ D( w6 J
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
( c: A1 s( ?" iCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
+ H% x. K( G$ Lelectric tools and similar apparatus – Part 1: Emission
# r1 Q$ ~0 Q+ X: i; xPage 13
8 w F: K# V: r, D8 f7 j3 M3 Definitions% T2 c0 x2 P7 K* x" Q6 B- B: S
Replace the title of this clause by “Terms and definitions”.
7 n2 {) d* O7 _7 L- w% r* o5 c9 i* mReplace the first paragraph by the following:
- B' f7 a7 a2 j$ a& d, J2 vFor the purposes of this document, the terms and definitions related to EMC and related4 Q3 ~# x0 Z+ i F1 i
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
) `& k( l3 {( p6 R5 n# FAdd the following new definition:- ~ z9 _1 I P- a7 Q
3.18. ^0 D9 ~" k# T3 Z; e
clock frequency
5 y; A" O, f6 ~fundamental frequency of any signal used in the device, excluding those which are solely
+ F$ J6 P1 e0 jused inside integrated circuits (IC)) ^( D; m, Y3 E( x6 y
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits9 I0 y1 L* m+ O4 {8 r% m. ?
from lower clock oscillator frequencies outside the IC.
" m/ g" P2 d# ^___________/ d5 `8 K4 r! i: J! M+ W% {( S
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
. b6 Y( F# y9 t6 ]2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
0 Y% f8 O& [& I; x2 s3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.0 M' h& i( w& x( P+ Q* A. s
& H$ r. d% J/ [
, [# @ p k% k; i; G
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
_: W2 e9 U, B( u5 v; yPage 13
/ f5 l2 W; |% @2 s* K/ s' V; A4 Classification of apparatus
1 C# O# r( V% Y/ ?6 ?4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
/ V* m) e. ?( ^Page 152 p+ |; v( E3 z$ {. A
5 Tests
4 u, i) F ^1 b# {& rThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
5 e' U y6 [* ?0 O! Y7 U) aPage 21 B& C- J3 {- h" D. E
5.6 Surges
8 q! j+ i2 g+ i' n2 u+ KTable 12 – Input a.c. power ports) B# a9 m5 i/ J
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
7 w7 O* N+ t4 u# s U' r. J3 g"Line-to-Line with 2 Ω Impedance".% V0 }6 g" S+ y; Y
After Table 12, add the following paragraph as a new second paragraph:2 i2 W K- k" ?+ U! M$ r
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
E9 q$ v$ i5 w7 m2 r J) g, T. Hequipment under test, and the negative pulses are applied 270° relative to the phase angle of5 p! M# E) k& Y: _3 N& l2 V
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
" y( j4 ]/ m' u( Q* sgiven in Table 12 are not required.
5 e) N: v6 [) n4 |5.7 Voltage dips and interruptions
2 |4 Z# D, x8 g, ~) U" DTable 13 – Input a.c. power ports8 |$ O1 A! u8 A0 v& |# q' g
Replace the existing Table 13 by the following new Table 13:/ _% \; p; w: O C0 W6 V4 m7 h
Table 13 – Input a.c. power ports' y4 a7 R/ z& B- h. y+ M
Durations for voltage dips, u9 E* B" [% z/ k
Environmental Test set-up7 {$ x: S& |# s7 [1 ~
phenomena
& N: e9 P% ?7 O/ p4 c3 PTest level
( I6 Y; }5 J' }# A& B( cin % UT
" Z5 x" @* r5 p# a50 Hz 60 Hz
0 h0 t/ P$ x( q; `" UVoltage dips4 [- r- d% P8 J, l; g' b
in % UT
1 I5 }5 D. x, l- B1009 ]" v$ ?& I( M6 P* Q
60
2 R1 g% U+ F9 d' j! y+ ?+ r30! T! T _9 n& h. @) ?/ x" ]
0/ W" e2 W; p7 N4 ^& t3 }
403 Z, @) u7 H3 x B1 ^5 u2 h
70, c8 W/ j' f) c- h ^
0,5 cycle3 K+ y* Q+ g: x* U1 L' x, x
10 cycles! q: S! K# H- N3 y/ Z$ w
25 cycles
* v1 w/ k% m0 p0 A5 b6 q# P8 H0,5 cycle
) K( M4 Y m( H, w% v12 cycles
+ S: Z3 y k$ p" V& y30 cycles
3 ?- h! \. W1 w/ Z1 _IEC 61000-4-11* A6 f2 Q) y; O& d* P% A" A
Voltage change shall7 M6 q5 u E* R) K2 [( f
occur at zero crossing, ?* P3 f4 H( P. {7 x9 _
UT is the rated voltage of the equipment under test." c! q# L' h" j' n1 H
& `" U" H y8 V: ]3 b4 L' ~! K6 S6 U: g$ R& y
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
& W6 l, _; Y# ^9 T+ A3 ^ GPage 27
0 X! \. @9 ~6 ~* k# J1 O8 Conditions during testing
; ^5 t) ~/ H! r2 O2 I& s8.1 Replace the first paragraph by the following paragraph:
" ]! }' Q+ f# X# a' M+ kUnless otherwise specified, the tests shall be made while the apparatus is operated as0 J+ B$ z2 M7 U8 r
intended by the manufacturer, in the most susceptible operating mode consistent with normal
+ u& a' f7 u1 iuse.
; q4 O: ?/ Q. w5 b8.4 Delete the second sentence.
1 a( W# k1 X; H! _) @7 J, H3 v8.7 Delete this subclause." G) ^# @& u6 T+ u# H
8.8 Renumber this subclause as 8.7! w# Q: U7 J/ {2 q% K* @4 R
Page 29
- t; }( s& t) ?, V" n" [9 u9 Assessment of conformity
4 b. ?# |( K" s1 |" T+ @+ t9.2 Statistical evaluation: |; c6 u: D4 J$ S& H5 r
Replace the existing Note by the following:+ q0 p/ u, X3 K* q- H$ o
NOTE For general information on the statistical consideration in the determination EMC compliance, see
+ S# O! h- F; G/ RCISPR/TR 16-4-3.
1 {; y1 j* z) z& a6 L: ?0 jPage 31
: v/ d% l( J1 Y10 Product documentation
( C* @5 c1 A" f4 S) V2 zDelete this clause.
2 w* O; y# N0 o5 I, NBibliography# J0 O) u: F. w* w2 w$ y
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:0 ?* X$ R: c4 L) p
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
$ N' u3 Q6 Q ~1 l3 W/ x$ L3 \methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
! G3 O7 A4 y' L, z2 Y6 Xthe determination of EMC compliance of mass-produced products (only available in English) |
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