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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
7 }6 t5 a8 g. C# D9 t1 k/ x
. r& Y" J2 s0 i$ U }+ p+ I VPage 9
& P& T+ M% @) J- n# Q; _; b5 n1 Scope and object4 I; U& V4 P7 e( C% n
Replace the title of this clause by “Scope”+ I- \7 G3 q$ g3 z2 `
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.' _/ K+ q, t6 P) P8 L* s% K7 F
Page 11
2 x/ B- h. s2 N& v2 Normative references
. |, f7 u5 u! V! BReplace the text by the following:
0 h$ E6 S7 V% f! _The following referenced documents are indispensable for the application of this document.
Q5 }% T# i/ j$ p, LFor dated references, only the edition cited applies. For undated references, the latest edition
6 q" w( ^- ^0 F, Vof the referenced document (including any amendments) applies.
( d. @5 |+ U8 T" S1 CIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:8 `7 z% d% C% D: Y% A- M4 A; t
Electromagnetic compatibility3 g7 R1 H8 e. ^8 a+ _- u
9 U6 [1 b- F# _7 g
$ i. V: C. Z+ Q, R9 OCISPR 14-2 Amend. 2 © IEC:2008 – 3 –7 i* Q5 i6 `3 c4 ~( {' u/ {9 V! u
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and: k$ I7 [* u w: I
measurement techniques – Electrostatic discharge immunity test2 A1 o: F; x0 ?; |& J# o
Amendment 1:19985 \% ]- [+ M: e1 Y y2 G/ ?
Amendment 2:200018 t1 x% r6 c8 T4 Y W' \5 X6 j
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
* t# F. J P+ ^0 U0 Lmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test' }/ v' t( ?& \
Amendment 1:20072
8 B: j, y$ o2 [ pIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
6 A% J, g$ P* E& _measurement techniques – Electrical fast transient/burst immunity test7 p& f/ ], }* U- i9 O, k; E
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and& O# D- v% D: F9 Z3 @6 D9 l
measurement techniques – Surge immunity test
. p% m$ c: \8 }: `" S! t! iIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and; a/ H* @8 c! O, _- ]8 @+ I& R% ?
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
/ R0 Z" a7 I! Ifields
3 _: N. J( p7 n: X& BAmendment 1:2004# U4 {% ~6 w* v* m
Amendment 2:20063
5 V. x* E' r$ n5 ]( zIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and! @6 m4 X) {1 y4 e
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests. w$ o [2 e5 i
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,: N2 Q8 ~) A3 r% r
electric tools and similar apparatus – Part 1: Emission
2 I1 c5 [. O9 q& d' @7 b, f, \" ]4 CPage 134 Z6 w! | B- g) S) p9 B% \
3 Definitions: s2 o: | U' H; ?. t8 @
Replace the title of this clause by “Terms and definitions”.- }6 @: M4 Q8 U6 W7 n3 K
Replace the first paragraph by the following:
' R# e) D. F, t* tFor the purposes of this document, the terms and definitions related to EMC and related
) O9 v$ z" w$ E+ Z; z* i2 lphenomena found in IEC 60050-161, as well as the following terms and definitions apply.# y0 v7 }9 R1 y: V
Add the following new definition:
: [5 t8 X4 I1 K4 Y" t; U3.18
) G- O' t6 J1 ]" t1 Bclock frequency
6 r* a1 v9 Y% _( n! B, Q; Hfundamental frequency of any signal used in the device, excluding those which are solely
& s2 r2 d8 h% b: b+ o$ oused inside integrated circuits (IC)6 a' k. j5 B. x+ s C
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits2 O: U* d6 I! {) K. {7 c2 L: F0 q
from lower clock oscillator frequencies outside the IC.
2 Q8 K2 s4 {$ v% P! {___________" r, a. K+ X1 }2 j+ e5 w
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2. Q5 m, O2 n& X4 o: s5 J
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.3 F- K% `% X; l
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
) a: y3 f) T* R B( c- Q- a4 E+ H/ k. A; g2 K$ L, |6 Y
# g0 p8 o/ V. s- \+ e– 4 – CISPR 14-2 Amend. 2 © IEC:2008
- q& Y1 I/ {; X' Q9 _, APage 13$ [' x) P2 F9 z0 A! Z ]
4 Classification of apparatus; ?0 l: \6 v3 E% v
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
4 I; ?9 b" M: d! L# w TPage 15
& x7 p6 M8 R7 b: X. z5 Tests7 C+ { ?9 ^) J" c+ @0 d+ Z( ]
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
9 W- z6 M9 K' ~2 Y( n7 F1 A3 o% zPage 21. ^/ c3 d- X" N
5.6 Surges6 f& t O; k1 e3 J
Table 12 – Input a.c. power ports- `9 k' \' g7 Q( Z; `' G* k
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
2 h& P/ ~1 }9 G& L" I: w7 E"Line-to-Line with 2 Ω Impedance".( D- p9 o$ ]/ Z$ |0 c
After Table 12, add the following paragraph as a new second paragraph:* ]! M5 `! p: k! |, S* B+ f
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
5 z# o6 g, X5 n. O: l, h; Cequipment under test, and the negative pulses are applied 270° relative to the phase angle of, ]# V* O: m9 _# z5 U% c8 m
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those4 D! I! F; r4 a7 L
given in Table 12 are not required.
! `7 h# H: ?5 p) Q/ }; i5.7 Voltage dips and interruptions
" Y; Y' s( p5 C( P6 l7 L- {0 ?Table 13 – Input a.c. power ports
. ^& R4 E* y3 o0 ~; F! n# NReplace the existing Table 13 by the following new Table 13:
7 N6 T6 R2 g/ F7 ^' GTable 13 – Input a.c. power ports
: m9 D, P# ^5 e" l aDurations for voltage dips
2 p& [. A- i _$ F- o n' [Environmental Test set-up
_. g- \0 t6 G% J/ [, t1 w7 Ophenomena
" A9 l% S M$ o, i a; r9 s4 UTest level
% R* C- f0 \4 z6 h# P& O5 Z, Sin % UT1 O L9 h9 K0 R2 E6 T0 [
50 Hz 60 Hz: V& A* v) S1 C; a9 O/ F& k0 q
Voltage dips
; v0 _+ p1 @' G9 D4 u" Y; H5 {5 {in % UT
: M; D7 T5 w+ I* K% A: _* b100
: o: g5 ]; Y7 L) G3 i60" x8 P) f0 b! e, @+ A/ L/ E. C
30
l& G) C( [* b) {! C3 r01 b' w+ e8 j& o- X. P9 V' F9 b4 \: U
40
# o6 [5 a0 m- w( T4 }: i& B" n707 ^5 j9 p4 _8 w) S! F. z. _6 i
0,5 cycle, I6 {: E$ K" M H+ _1 g' g
10 cycles
. Y# L8 ^% J, ?9 y+ V25 cycles8 p4 Y+ c4 W$ @; `4 s! M- s
0,5 cycle$ p( @2 o2 s3 V& M! X
12 cycles$ i# e* }6 h' U* T1 g, [
30 cycles1 g) i& u4 z2 z$ V1 N, r% R1 o2 {
IEC 61000-4-11
2 s# _# o1 P& c' y8 W" Q) D" rVoltage change shall
, D j2 U: V c" goccur at zero crossing% I. c0 H5 E- V+ A
UT is the rated voltage of the equipment under test.
8 |* I7 ], l7 {- o1 K" g" P5 L# [# p/ D; J# E: A
8 W9 n3 l! h* }. r/ b! R9 |% e/ ICISPR 14-2 Amend. 2 © IEC:2008 – 5 –1 ^* e U# z* T) ]; y5 x
Page 27. m' d, C0 z4 t
8 Conditions during testing! Q# K( v; B1 H) I+ v" `1 |; W
8.1 Replace the first paragraph by the following paragraph:
8 q0 m7 c+ s* E, ]4 _' A3 p4 m) z. \Unless otherwise specified, the tests shall be made while the apparatus is operated as m a4 D; a- y* S
intended by the manufacturer, in the most susceptible operating mode consistent with normal" I( u3 x2 n0 Z7 b" w3 R! P. Z! e4 r
use.- L8 b2 q/ |1 y7 a
8.4 Delete the second sentence.9 R+ C' y$ X8 q: g9 j2 b% s
8.7 Delete this subclause.' g4 } T% W o! }
8.8 Renumber this subclause as 8.7
- k# z, Q) o# V+ C' _4 p' sPage 29
; F( H5 K5 l! ~0 w9 Assessment of conformity* p+ R3 c2 e; t* D
9.2 Statistical evaluation5 e& r ?$ G* Q! Y
Replace the existing Note by the following:
, v' B8 S6 l1 Z8 D9 PNOTE For general information on the statistical consideration in the determination EMC compliance, see' {- @6 w5 b6 U$ m$ a* r
CISPR/TR 16-4-3.
( o4 W& U. u0 M0 Z* }Page 31- R- W5 h% P, @/ y$ [8 y) _
10 Product documentation3 X) W3 I0 o0 n" L+ j: d: `
Delete this clause.
& k; Y% \1 z7 i$ L$ w aBibliography7 e t# ?. F. p/ W
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
4 b. @1 S* T% C5 ?CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
2 Y/ s4 v9 j4 ?/ [" jmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
0 F. j* s4 r) z1 \+ U4 U% B3 Jthe determination of EMC compliance of mass-produced products (only available in English) |
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