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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
e( W6 Z$ m+ o( W1 F4 {4 S& S1 S
Page 9
: |! c g: ?# E* K. F8 g1 Scope and object Y" @$ j# J+ j+ Z7 T0 M
Replace the title of this clause by “Scope”7 C( `( X9 s: [0 J: L4 p9 ~
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
6 U5 H0 d3 P8 \4 A! _3 PPage 11) O% Z6 D. d. n" P0 D6 E" a
2 Normative references2 V5 t! u$ F" B5 M( H' o# _" E
Replace the text by the following:
0 W0 [! ^+ ^, W5 V, o: Q8 `+ M! VThe following referenced documents are indispensable for the application of this document.
# b" @* H1 J* z5 }% aFor dated references, only the edition cited applies. For undated references, the latest edition
" ^- |4 A/ `, u9 G2 y( A; g7 Xof the referenced document (including any amendments) applies.
$ A' p7 H3 W# a, k2 |+ I; |$ dIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
; o! R" `& j& @9 x! J3 P t* p+ K3 V8 tElectromagnetic compatibility" N6 F. E. |9 o8 M I& I" W$ y
" m- ]9 _% d8 x& n. j
8 V' M* U G$ n! \CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
- E+ O' Y4 b- r2 E+ y- lIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
9 B8 W0 F9 ~: x" Vmeasurement techniques – Electrostatic discharge immunity test
' y" I O9 g9 J" V E' T' `Amendment 1:19982 ^& U% ?4 K: k! e6 f
Amendment 2:20001
0 K9 w' ~$ g: c( h& \0 @4 |IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and) Q4 H% }# U1 N" ^0 L: T
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test' i( v' E( V- q
Amendment 1:20072
. a# o6 ~: r9 e, l: L+ J) X% Y8 KIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
8 a0 }+ O+ P" Tmeasurement techniques – Electrical fast transient/burst immunity test
e# h7 U2 H$ a- J" NIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
- h4 ^: ]0 }0 }! H/ n: y% vmeasurement techniques – Surge immunity test. r7 z4 ]+ I2 C
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and$ t7 c4 E4 o, T7 c8 ~' [6 r
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
6 h6 }7 k! y A+ [2 Mfields6 l/ w8 d) k& p$ ]- ]8 n
Amendment 1:20046 X: f8 a" P _0 `2 [, x( e( r8 d
Amendment 2:20063
; ]( b. x' o# U+ @5 xIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and I o6 W/ W7 ]- c2 L
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
1 p" y) c! e* hCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,' O. B. ~' R6 n6 o+ I& w
electric tools and similar apparatus – Part 1: Emission$ I. D% K5 `3 a" ] n
Page 13
0 j, A' y p/ [& ^$ @* ^% t. q3 Definitions; {, A+ V( r' f
Replace the title of this clause by “Terms and definitions”.4 J% z4 D& e8 q& T3 k/ P
Replace the first paragraph by the following:
0 k( _! I* m* L& \1 R; Y7 ^- b# G& I; XFor the purposes of this document, the terms and definitions related to EMC and related+ M9 Q# r3 T R$ J
phenomena found in IEC 60050-161, as well as the following terms and definitions apply./ b1 y0 w! ]" k3 B
Add the following new definition:
& ~- l L [. ?: z+ b; @" X3.18
5 c5 i% _' h ^* k: T/ Wclock frequency8 L% [; y6 E# t( o
fundamental frequency of any signal used in the device, excluding those which are solely
8 @2 \& P7 P8 A/ }9 Z5 P" hused inside integrated circuits (IC)
3 y3 c4 C" F' |/ \NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
4 |' r. ~( t4 R' p. l: R8 Ofrom lower clock oscillator frequencies outside the IC.7 E$ U* A& `$ _; G3 ]
___________: G" t: A1 s7 P: d; E6 }
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
9 }2 L9 a3 Y1 s, O7 a: v( A2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.' E- O3 w! @& ]3 d5 M
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
4 K* ~0 j1 T% F9 [. d' E; a" Y4 N+ }. g3 _% \ \) z
9 ~% w: O3 {9 T: B% G+ o# x# `, y# {– 4 – CISPR 14-2 Amend. 2 © IEC:20084 R* v6 H( t6 _) c/ |3 M
Page 134 G0 K3 i2 _; p6 i |0 r$ x
4 Classification of apparatus$ v+ B3 G |6 [1 H
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.' q: H' N% O+ |4 ~: ^+ U$ I" H
Page 15
$ a' Z" g% S! \3 Z" {+ [% T- A5 Tests
! D4 w- D# F9 v, q4 V( aThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
2 i2 ^1 c5 [3 wPage 21+ H. F$ N! N: I) J
5.6 Surges4 a2 j" C/ ?+ c7 w
Table 12 – Input a.c. power ports6 r( K; z: s$ ?1 L1 G) W. [9 z
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add* t4 h% T* F2 d$ E& D1 N: r
"Line-to-Line with 2 Ω Impedance".0 M/ K5 B$ ?3 N1 q
After Table 12, add the following paragraph as a new second paragraph:
+ c! K( y8 u" V; W# k# EThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
u' M% o% |3 D( F/ P1 ?( N% |equipment under test, and the negative pulses are applied 270° relative to the phase angle of. i6 k6 }9 o( Z8 o+ J0 t; N
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
' S1 E0 E1 {+ ~. v$ l6 L0 Ugiven in Table 12 are not required.( {, n$ |# J/ i O% U' d
5.7 Voltage dips and interruptions6 _% I+ }" [. A1 N+ P+ Y
Table 13 – Input a.c. power ports
' M# n; O; d1 S3 S1 iReplace the existing Table 13 by the following new Table 13:% ^' } j' T; y' [% S
Table 13 – Input a.c. power ports
" O# g8 e; }; A& |$ q6 B: m: t- wDurations for voltage dips
6 z; _0 K0 v; L+ BEnvironmental Test set-up0 ^; Q' a1 h) _
phenomena
/ R9 X, o( v- q! N( q; v7 o& nTest level( A0 }+ @! i% J: q8 R, X- G$ I1 f
in % UT
/ ?: V& e$ f# `50 Hz 60 Hz
6 n; a$ C4 n ^2 v! ]Voltage dips' u9 U( M ^- W# j% P$ n
in % UT
$ @. W B( ]1 [8 u4 s100
6 M$ o7 f, {# G0 ]' u: ]0 r$ y60) |8 n. N% v3 @( j+ x: W2 v; x
30
0 Q p9 @; h* D4 d4 N% N* L0
6 {9 L( c0 z& x" l0 s9 h2 T& x! X; }40
, {9 q2 N4 u3 C70; Q" ~+ _5 W/ g/ h8 o% s
0,5 cycle* L9 O& L% v! G8 E" D3 N
10 cycles/ R# {) m; Z9 q7 d
25 cycles b: X* j' t0 {: F6 O3 Z
0,5 cycle! p$ q: V+ [9 j; l
12 cycles o, [ U, s/ j' w
30 cycles
A6 f0 y! F5 E; N/ g' rIEC 61000-4-11
6 S- f' z# e& y8 }2 c6 F& k7 RVoltage change shall
. Q7 p$ g: K4 x8 s2 `+ ?occur at zero crossing
; `& r5 c- w3 y0 s$ UUT is the rated voltage of the equipment under test./ M/ L: l) S; R! ?) V# m( E
3 B) `. j8 K: c5 d' S( o
' `2 O, h& K+ \) K) _; \. O" J9 g. s
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
; R9 c( C5 L6 \Page 274 m1 A, A+ \% F. ?- `, Q# N
8 Conditions during testing2 k8 w) H% v! N
8.1 Replace the first paragraph by the following paragraph:4 m" h& C+ R/ d8 P( z
Unless otherwise specified, the tests shall be made while the apparatus is operated as& l# Q# r. @: x I/ d! x
intended by the manufacturer, in the most susceptible operating mode consistent with normal
7 J& u) U1 x% @8 _1 V1 P7 J# g( Wuse.5 r/ R7 R7 t$ Z# A f( @9 }
8.4 Delete the second sentence.
& S# c( T7 x1 r( M- x i9 s4 Q8.7 Delete this subclause.6 Q; b+ t2 N% _ a# \
8.8 Renumber this subclause as 8.7- z4 C% L. {0 ?9 F/ H
Page 295 b7 U& T, p5 }- w" B
9 Assessment of conformity. ]7 c5 r& O! m2 B8 f2 L
9.2 Statistical evaluation8 C4 I( y2 |7 ?; ^& s1 O& e
Replace the existing Note by the following:9 Y; ?0 C7 h8 q7 O& D: q
NOTE For general information on the statistical consideration in the determination EMC compliance, see7 k! a6 \7 A4 k0 r o% @' q
CISPR/TR 16-4-3.. U7 K# _5 _9 Q2 p# C3 J# Y
Page 31
, [& ^0 ~5 \) p10 Product documentation
4 C% F3 z( z7 L3 mDelete this clause.
# o4 @* t" b) \+ B( a0 b- e' bBibliography5 {; F7 N- T u( Y R* i/ L/ ~! r
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
% a6 L+ ^0 Y, |) j8 Z ~$ qCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
4 T! Z* g- ^* c! l7 Q7 C) i' ?2 f7 j5 ]6 Tmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
+ l @; X+ ^/ ~2 tthe determination of EMC compliance of mass-produced products (only available in English) |
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