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由于我的标准上有公司名字，就不直接贴上了，差异部分如下3 h2 ]' N# g% N6 I1 T6 U" |+ q
) r K) ~& i1 o3 [- O1 bPage 9; A3 ]5 e8 H. t, O) T9 p
1 Scope and object0 ~6 `. a4 _: V1 J/ v
Replace the title of this clause by “Scope”. v& K( e# p" F8 w3 v. @: Q1 o6 G
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
- u3 J; T: F0 h! b! O* |Page 11
/ s1 h; v) Y; Z7 t% K0 x1 ^- t2 Normative references" Q/ S' y# i$ W5 C9 j- t; C
Replace the text by the following:) X l! l" z3 o: X+ z( p7 |
The following referenced documents are indispensable for the application of this document.8 \5 a6 R6 N7 ?! U2 n
For dated references, only the edition cited applies. For undated references, the latest edition
4 i+ p7 ?$ O9 ^7 y5 cof the referenced document (including any amendments) applies.
, d6 j# Z+ d5 w; YIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:, C* g( g, ]2 W
Electromagnetic compatibility% \1 X0 w+ P9 E6 k( Y& |0 t% a
4 G& [# ?' p: s3 \2 V6 R
& g% B+ m) b6 S) J. @3 OCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
+ |. Y6 E" w2 k; s! BIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
U& T6 ?8 Y6 G1 b L7 ^7 Fmeasurement techniques – Electrostatic discharge immunity test
4 P- ?+ ?) p6 i `: l* fAmendment 1:1998
) e$ e' p9 ?7 @# t; Z1 c8 Y. t+ AAmendment 2:200018 I8 t; ?! ~ I: K. `6 H
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
. ^) @5 \! u! H' Lmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test7 R2 U; L$ k7 p- {" A
Amendment 1:20072+ F- D7 W G' t! B$ R* j
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
0 l' b8 c, c0 h8 e* }0 l1 imeasurement techniques – Electrical fast transient/burst immunity test
4 G- \1 z" M% y/ ~0 R, `IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
4 [/ H* z0 p" v! p6 g6 p7 H9 d$ g9 @measurement techniques – Surge immunity test
: p/ V, m5 F: p3 h9 IIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
' z& s) j, Y& p% o2 v- K; F3 Mmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency, g# S! y2 i h- _& ]* D Z
fields
9 i- x' W0 C5 b$ X; _2 ^; `6 pAmendment 1:2004
4 T ^6 y& |! W% ~ P2 r! wAmendment 2:20063
% A! g9 i5 H( w; o" {5 [: DIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
0 Y# }1 p% R& `% Cmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
0 `) X" {( R* m+ N9 |' X( SCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
) Y* F' O; n% o. G; j telectric tools and similar apparatus – Part 1: Emission
. G3 h. P4 ]; v1 P' t' u- \+ GPage 13
& R8 w+ q/ s: k: I0 }3 Definitions$ S! g8 W5 i% d. a' C7 X
Replace the title of this clause by “Terms and definitions”.
( y/ }* L; z9 a9 W' F0 |Replace the first paragraph by the following:
: J2 A( }/ r7 R+ L+ T) H LFor the purposes of this document, the terms and definitions related to EMC and related# K$ m, S* C7 _
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
0 Q$ G* }4 H% Y' c2 ?! f; `7 |+ JAdd the following new definition:
7 f% |' \$ B$ Z% v6 Z( M0 S3.18
* |* |& ]9 j' n7 Pclock frequency
7 G( v% ^$ P! `2 V' }# Q; z2 kfundamental frequency of any signal used in the device, excluding those which are solely
* n- N( g) D% B: J2 eused inside integrated circuits (IC)
9 S ]7 t. f: }( y6 a( HNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
# h N4 M7 p+ X( \7 s& efrom lower clock oscillator frequencies outside the IC.
# R9 B9 I" w5 V; l% B/ }___________
2 f8 N& n- |7 c* h5 H0 `$ f8 ^1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
5 ^) U% c$ R& T7 I& H/ o O2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.4 J) l% w* |3 y. {
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
! E2 d8 e: ?8 Y- [# h9 U) ~0 b$ V- {% a w1 [, u
/ @& H2 }! z0 C* i, ?– 4 – CISPR 14-2 Amend. 2 © IEC:20085 O1 U6 k+ f3 g# x- M, G( m
Page 13
" `* Z4 E, e& k w; Q$ p& h4 Classification of apparatus1 h7 a t W! n9 g
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
5 Q( u$ c# z0 Z5 Q" r CPage 15
; B4 u% f; g& r7 }; z; ]! {0 d5 Tests/ Y: Z$ l: k+ X9 N: o6 L# q
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
9 T% V1 y5 b2 {" f- @7 u, D. kPage 21
6 ^3 X L* A* D8 _8 e9 ~5.6 Surges
% |" Y# s* u0 _4 k1 B n; h8 n/ ]1 rTable 12 – Input a.c. power ports
2 l. s1 @/ V/ `8 n, W LIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
+ D9 b+ Y$ O: e3 r7 x. u7 g, E"Line-to-Line with 2 Ω Impedance".# D5 B! a& a5 x: |" V5 E9 |
After Table 12, add the following paragraph as a new second paragraph:* D% c! g$ Q. C7 p, p& t3 u0 w6 z
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the6 \) ~, o+ k" f" |- T4 F+ g
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
" G( s7 K- d+ t9 Uthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
* G7 W( l5 v; l$ z! @given in Table 12 are not required.
3 Y( R K5 f& ^7 r" h3 @5.7 Voltage dips and interruptions& f7 F, o& Y A4 x# N. ?: x4 \9 U6 D
Table 13 – Input a.c. power ports
" M) G. K- G8 W M( A& t: FReplace the existing Table 13 by the following new Table 13:$ _- h( r$ a; [/ T4 O
Table 13 – Input a.c. power ports0 {7 z" J' A0 v8 g7 w4 S
Durations for voltage dips. s8 P( c, {$ f0 M0 s6 V! q" \4 p
Environmental Test set-up
4 t8 x7 i j* E+ D6 i2 ^phenomena' X+ e6 S) f. S& B: X
Test level: y L: A# W7 r' H6 t9 z* b3 J4 z1 E
in % UT( t* e9 X7 g6 f) y0 B0 P% d6 P# J
50 Hz 60 Hz
6 ^2 P, U1 A% nVoltage dips1 e; F: h1 ?: o2 m% W
in % UT5 v8 z( `* }* o, V% ~/ N9 J
100
2 y+ C y6 P/ P" B+ z60
. c; t0 d2 ~% K1 e1 f/ t) F1 i9 q30
: o" {9 v. U6 Q8 n4 O6 [# h. g, w' `. A0
* }* w, x/ r/ c: X8 b" s40+ j" H o* u; D+ {8 l& k# k' r
70
8 u. O; o0 u( o5 a1 X0,5 cycle
5 n7 `6 i2 j- T& I* i10 cycles
; A/ u% r& I6 E+ P7 H25 cycles
7 P& D9 w t( ]* P t, D! q0,5 cycle4 x! K C+ r4 U6 E, r" \) Q& U
12 cycles
' l! j* y. b8 C30 cycles
+ O1 F2 j3 w0 ~# ^' hIEC 61000-4-11
+ V1 y5 p& W( J( X+ nVoltage change shall
t; @! x6 }3 ]occur at zero crossing% d" Q: y! ]$ E( z5 G
UT is the rated voltage of the equipment under test.
; X0 g- h: f1 b0 g3 h
- k- I0 e, p( i
4 |! R4 Y1 ~4 F! T8 C( {" M2 CCISPR 14-2 Amend. 2 © IEC:2008 – 5 –# ~: H, ~7 N- o7 }0 E: \
Page 27! |8 p' Y4 O6 h6 V' O, \
8 Conditions during testing
( ?7 q; S# a- [2 W$ p# Z; B8.1 Replace the first paragraph by the following paragraph:
1 s& }% i9 [2 v- j B8 E! wUnless otherwise specified, the tests shall be made while the apparatus is operated as" q: o& X* F5 i/ N9 k8 p/ r p8 K
intended by the manufacturer, in the most susceptible operating mode consistent with normal0 S! l$ J; \2 q. n- d/ j. g
use.
* O* {% Z0 U O8.4 Delete the second sentence.7 `9 ^- ~+ |" R: t0 p- J8 l
8.7 Delete this subclause.: M" K4 K6 \5 E' K' ?: M) h$ Q
8.8 Renumber this subclause as 8.7- l# c6 |2 n4 U7 W9 ^7 O. L
Page 29
) P" V! y3 E* [7 ~0 ?9 Assessment of conformity( L+ S' I* b6 A
9.2 Statistical evaluation
+ y: ^+ C( _, g1 o6 f0 q& BReplace the existing Note by the following:
5 i5 c# n) r2 H8 |NOTE For general information on the statistical consideration in the determination EMC compliance, see
5 {5 y0 k2 D3 {6 ?2 Z ICISPR/TR 16-4-3.
# Z1 n) \/ }% }0 ^Page 31! h$ Z. w) T+ b! R
10 Product documentation
( _/ R3 X6 H' _: Q$ ]; ~$ FDelete this clause.
2 Z" A- l& s. tBibliography
' K3 Y% B. l) x* L" tReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:8 Q5 q F3 @" t5 d$ Q$ o& r8 t& U, X
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and4 y' g, s8 S, B* D4 r) P
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
3 }* O7 Y# U3 x' sthe determination of EMC compliance of mass-produced products (only available in English) |
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