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由于我的标准上有公司名字，就不直接贴上了，差异部分如下" I* D1 J1 F& k* x% n) P) G
! ~5 Y0 F9 J. |Page 9+ ^9 I2 c" f) U" m: Q* ]; z
1 Scope and object" U. Y% v L: F3 P- c% L( ~2 F
Replace the title of this clause by “Scope”- F7 d, n! l+ R, E& W% f5 N- _
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.( |! V7 E f, V3 n3 o2 i0 k
Page 11; O" ^9 @: i1 S& V9 E3 t' x
2 Normative references/ O2 M; E7 v) e/ D, i! e, `, ^
Replace the text by the following:0 p: T: s8 C& @5 N8 B, Y
The following referenced documents are indispensable for the application of this document.) F4 A' `( U4 b) L' c: A
For dated references, only the edition cited applies. For undated references, the latest edition' i" t8 }6 V3 b( q
of the referenced document (including any amendments) applies.2 i" Z4 }5 K y0 w2 X! v: k
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:' b* e S* }2 u# l8 C) w
Electromagnetic compatibility X7 e2 n m9 V2 L, y7 T5 {5 `. t/ h
- q3 O0 @4 Q. s. n( j x, ^2 e! B
" N# t& q6 ?8 H. P; C( s0 ^CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
) M0 q( E3 i/ x6 J. b* sIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and* w# P* Z& |) e- m6 E
measurement techniques – Electrostatic discharge immunity test: N7 `1 }) H, N
Amendment 1:1998
: @' G9 k$ b: i: BAmendment 2:20001) O$ A* f0 d% {$ l, U g5 ?' r
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and( F$ _6 d5 k8 {; [. l- f0 A7 A
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test. H8 q7 n( c7 ^# g/ n
Amendment 1:20072, W) D1 L/ J7 G% u2 Z$ o9 I' i
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
2 K: q0 D d" M+ t9 g0 N. `measurement techniques – Electrical fast transient/burst immunity test4 s3 u" E' L& v: G/ j. d9 M
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
. t. l6 u3 G& `2 g; F# G7 {4 \4 Lmeasurement techniques – Surge immunity test% j6 b3 a% x3 f7 ]7 x
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
' H" l& W1 x6 _- H! Bmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency% _1 }0 n [" y5 t9 k, k1 B
fields+ ^% n# f: `, |: x2 i8 F
Amendment 1:2004
, f" p3 S1 m# y& iAmendment 2:20063
9 s8 x. r4 G( w2 \3 `3 y2 ?, K! jIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and! N0 T" g( A2 n) D2 B9 s& {
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests7 s: h% Q! @4 k
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,2 A- S. H# N1 Z* E, k" ~+ O: r6 y% T
electric tools and similar apparatus – Part 1: Emission& S/ w$ ?; J% l
Page 13& D+ w5 g# j& J! v% e& d
3 Definitions
7 |+ W- e2 d+ l: ?7 qReplace the title of this clause by “Terms and definitions”.
( r' W7 i& f) @5 cReplace the first paragraph by the following:5 G: X1 f" }: N8 N5 C) X9 u
For the purposes of this document, the terms and definitions related to EMC and related
2 |( U) e; ?7 V" f/ t$ E' `0 b2 `phenomena found in IEC 60050-161, as well as the following terms and definitions apply.2 u2 a! I- R/ J$ c
Add the following new definition:, t) [8 a" Q; d; t# Q
3.18# j5 J9 [! i: B
clock frequency
" q: R/ E. N! ~2 ]6 L" F3 Hfundamental frequency of any signal used in the device, excluding those which are solely
8 y( s) C7 r% @" j+ u+ z( Fused inside integrated circuits (IC)$ w. K3 m N2 T+ ^/ o @! k: {1 a
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits0 n5 V5 J0 A9 y0 H% K2 q
from lower clock oscillator frequencies outside the IC.
& n/ K* ^* ^1 ?+ A: T- G9 Y- c7 u- E___________# m" M% n2 O" J
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.# S" O1 q/ K k3 m/ g- _0 X
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.( t! r& r. s: N" i: r& W
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.% h2 V6 u8 N! T# ?2 R
& l9 X" q" ~0 F3 T+ i/ N. R M0 W/ x$ }8 v
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
* j' A. a# u, ~& y8 T& R. vPage 13. Z( v% T* l+ [) n4 ]
4 Classification of apparatus0 `+ x6 `) t' U; R7 j& R5 i5 D
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE./ }* b T6 o' J4 R/ w
Page 15
- a: m/ @1 Z* m K( A5 Tests D' D0 f' @8 V
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.9 |: S& _5 E m& U7 m$ Y
Page 21
( d u8 s" s! _" k' k$ _$ Q5.6 Surges
0 I1 l, f5 Y, g' {/ E; ~' d" [; X1 ^Table 12 – Input a.c. power ports3 ?& b7 u+ H8 e& x: }, ?
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
; h$ O" u2 c3 |/ w& M, a"Line-to-Line with 2 Ω Impedance".
& @3 x) V4 q# x1 H; V& ZAfter Table 12, add the following paragraph as a new second paragraph:
a+ z& a# J! oThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the9 ]) Q$ v* r7 |* t1 u- v& c
equipment under test, and the negative pulses are applied 270° relative to the phase angle of) _. A0 ^7 u8 L( Q6 z- H6 V
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
( |% n1 W' k% P4 D$ y. Egiven in Table 12 are not required./ J% ^, ?: K) F
5.7 Voltage dips and interruptions5 G, J& a: D: e3 ?* W& P9 W
Table 13 – Input a.c. power ports9 a J2 `! H! w$ T
Replace the existing Table 13 by the following new Table 13:' P2 Y6 ]# E+ {6 F U) y* H7 c; r
Table 13 – Input a.c. power ports. p3 [" `9 C m
Durations for voltage dips% `: {( c% p1 x5 q
Environmental Test set-up- [& W8 ?/ @* U4 x: g
phenomena/ S6 q7 a5 T V x( c. I
Test level
% c! G* c$ b' T2 j8 vin % UT
$ n5 q+ G3 M, b50 Hz 60 Hz& C+ G) A9 f# b: @2 C4 T# O7 f
Voltage dips" }9 c8 G: J5 w
in % UT j. V& E# B" \- C7 e+ o
100/ `$ C# _( o% G, o
605 p; W! C# C5 U/ P6 f$ C
30
2 {$ U7 p! Q% B0 B/ S8 E0
' C& @9 ?" l1 J5 [7 E# y0 @: |9 q40
/ M4 U4 z# V6 }& H ~. l70/ y" A( S4 c- L3 n3 v7 D% m! Q% w
0,5 cycle- b" U w, m2 c! ^( ?# N" b" d1 C
10 cycles
/ Z7 D9 l' Y7 M4 Q/ u/ x25 cycles
% ^! x1 L# ]$ p' [, f$ @0,5 cycle4 X9 _& q' x4 T; \( F0 ?3 F. `2 q3 |
12 cycles
Z! f# g8 v6 K8 E30 cycles
G ~3 V$ v1 I7 r0 s. Z6 NIEC 61000-4-11
* j2 ?! Q, V' D/ eVoltage change shall9 [$ U/ r2 u! L6 ^. j# P; O* N
occur at zero crossing
; V* n; q5 n% @! J9 uUT is the rated voltage of the equipment under test.2 t# d m, K) i e R% h v1 [' E
' [" U) B* e+ R: P; `7 I4 J
- G$ N' ^& n) N/ ZCISPR 14-2 Amend. 2 © IEC:2008 – 5 –; q4 \7 l; N: _& i8 l
Page 27) S: l8 s/ D" J& |+ ^ M$ C4 Q
8 Conditions during testing
2 p1 P/ _1 D3 x1 G) ]8.1 Replace the first paragraph by the following paragraph:% j6 F& u% \: ~4 h& ^5 o% `
Unless otherwise specified, the tests shall be made while the apparatus is operated as" k; F4 S! b9 }8 E. g% K. g7 w
intended by the manufacturer, in the most susceptible operating mode consistent with normal0 j7 }3 L5 v* L3 x$ k W
use.
3 X; }. ?7 G6 ]8.4 Delete the second sentence.% a& V( B$ a- e# K! F8 ?
8.7 Delete this subclause./ i: q0 f6 g6 q: q; Q+ m! K
8.8 Renumber this subclause as 8.7( S% W) ? m* [% Y0 ~6 z6 i' D& ]! R* Q
Page 29
# J4 c$ n/ d! d& R4 ^" D9 Assessment of conformity {6 C/ n- e P; |* R
9.2 Statistical evaluation
, b2 V) q0 E& b% t; x& E8 n. \Replace the existing Note by the following:
( V6 Z( w( e4 V6 MNOTE For general information on the statistical consideration in the determination EMC compliance, see
0 E9 y$ @* T* H) oCISPR/TR 16-4-3.
/ ?" |5 q. Y+ b5 |: m+ FPage 31& q* @, j: V# ~2 v! o! X; b( g
10 Product documentation) t' l& k! g8 O8 o
Delete this clause.
4 d/ }$ h; y; K2 e, a6 n9 v5 KBibliography
" r/ U7 C1 Y5 J# u2 Z1 ?8 KReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:' l' N$ Y! d1 v/ V, H- B5 K
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
9 ^+ q# }8 c1 E8 A! ]6 vmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
7 L! B/ }% c( o vthe determination of EMC compliance of mass-produced products (only available in English) |
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