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由于我的标准上有公司名字，就不直接贴上了，差异部分如下+ Q5 w! W. \5 i
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Page 9
r1 z6 u6 l7 n( H3 _1 Scope and object
; _1 z: y5 b! C: {Replace the title of this clause by “Scope”
( ^& E9 K0 C0 g1 t1 x0 q1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
1 G. e* K0 l8 ^) L% wPage 11: j; r) H# t, K+ O& f
2 Normative references( R3 H0 @# |. R8 a
Replace the text by the following:
4 X; u1 V: R3 fThe following referenced documents are indispensable for the application of this document.
5 B3 i( e7 B2 Z& uFor dated references, only the edition cited applies. For undated references, the latest edition. ^4 ]7 Q3 K! B7 B# k7 A% c
of the referenced document (including any amendments) applies.% T& k- R/ S' _" h' ^6 T
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:( V8 C7 V8 L$ ?5 ~0 I% s& F) s
Electromagnetic compatibility7 R$ A# W2 O! R- C0 s
6 ?+ X; W# _. x! @2 l0 T
9 y, n* M! x+ ]/ R H* wCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
5 I) l/ H, Z: CIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and% H9 D, I: J! X8 v
measurement techniques – Electrostatic discharge immunity test7 l# } @7 Z6 P3 b P4 z3 g! S- k
Amendment 1:1998) S( k8 i' Q$ J! Z7 r4 z8 m& T4 u- w
Amendment 2:20001
. g5 n+ o7 k8 e, K1 n2 \IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and- R4 X% I7 e) a0 H* N
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test ~$ E) M X+ P- ]0 A
Amendment 1:200720 K9 V4 F* I& S. N- u$ @( T3 I7 q
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and* u$ U6 N' ^& y
measurement techniques – Electrical fast transient/burst immunity test$ W) c) B7 B$ m: D# {/ I
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and- ~3 Q% J& d: W7 f
measurement techniques – Surge immunity test0 r9 A4 `0 g" ^/ u9 T1 ^
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and/ j6 \# n. m. w
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency" q7 P5 m0 P# j/ P+ U
fields( l3 f, N/ m. f5 o# L0 T
Amendment 1:20046 j8 } I! W$ H0 T
Amendment 2:20063
6 @: T( T; E" ^1 I$ _8 VIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
6 m0 a: a' D' ]/ U/ M6 D; Ymeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
( G* F( Z0 V* V) l& z' bCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,3 [$ K% ^4 U. M0 T$ N# e
electric tools and similar apparatus – Part 1: Emission
, v. P% D8 f8 |3 \& QPage 13
1 Z1 {+ @1 l4 K$ m3 Definitions
* f8 b+ d" G5 EReplace the title of this clause by “Terms and definitions”.. Y. u. E W# Z7 @7 B; e6 j2 ]
Replace the first paragraph by the following:
- z. a( r& G1 y5 |! B8 @8 c6 \$ EFor the purposes of this document, the terms and definitions related to EMC and related( B5 D0 T& {' V+ a; X: [( H
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
4 y1 H' I. b& k& W5 _' _Add the following new definition:
# \- P( t0 @. m. P) G3.18% b; X- l! X$ j/ b- w
clock frequency- W, `1 i( u/ R) q( S- m
fundamental frequency of any signal used in the device, excluding those which are solely) r* M. V" h8 B2 K
used inside integrated circuits (IC)
$ H' c' C4 ?$ `# n& T9 o7 |, jNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
+ U: x! _3 a- n3 A1 ^from lower clock oscillator frequencies outside the IC.
5 v; K1 K5 ~ {* l8 v___________. F& H4 Y& f' S3 h/ F% h
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
6 Z1 r7 y1 N7 F% Y. [2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
2 F1 q" l& _1 e3 a4 n7 s& e. s+ K* u3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
$ O2 r `6 K" R9 j
+ g- x0 E& }- b( ]' U8 u) a: V5 u0 ?1 G2 l) L
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
4 m# F2 M0 y. q& _1 J, w4 CPage 13
! B: H- Z; V% e4 Classification of apparatus, R7 i+ H8 v/ o0 i
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
3 _; |7 _. l+ A# J8 APage 15
8 V0 f% Z' ]) w, C5 Tests+ L5 O1 y6 D1 u7 S" W9 ^, j
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
0 g1 U E, d, b1 a7 JPage 213 O9 M$ X; s' i; W2 z* V
5.6 Surges
9 B5 {2 v, u+ H: N+ j3 K+ KTable 12 – Input a.c. power ports6 F2 I1 r, U$ k0 g! ^
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
9 z4 }4 D2 A* F+ o2 H1 g"Line-to-Line with 2 Ω Impedance".- B a$ c3 U9 U! F; P
After Table 12, add the following paragraph as a new second paragraph:
8 s- ?; D$ H' P2 I- CThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the/ R# A9 b9 W( `
equipment under test, and the negative pulses are applied 270° relative to the phase angle of0 L: \/ C6 L3 B; V" ?# K
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
' k( `3 {2 [" F. Q! }# v: v! _( w) g. Qgiven in Table 12 are not required.4 K6 {; C3 P! b
5.7 Voltage dips and interruptions9 }' I0 j/ _4 A" V4 I
Table 13 – Input a.c. power ports/ T6 k' f6 s1 T
Replace the existing Table 13 by the following new Table 13:5 H' j: D, D- {1 B6 P
Table 13 – Input a.c. power ports# v$ T; D2 p$ t
Durations for voltage dips( x. s8 m& A! p' |- g
Environmental Test set-up# N5 b) o! C8 b
phenomena9 O5 V6 P/ H- q) C
Test level
/ W" C+ P/ J6 w7 U; x e" ?9 o7 Oin % UT
0 O: T; C" Y2 b. r" e- y50 Hz 60 Hz
& g, K O7 C0 F9 vVoltage dips8 n% ~1 S1 J% f1 ?; E1 e8 s/ V
in % UT& h+ \+ V) _( H$ j( |
100% N+ s5 |+ v) N3 B. u) ] R! w
60
9 K: c, ]$ T: w9 D4 @30
& D% w+ _0 E7 `" q( I0, ^/ X+ n% \$ A$ t! w7 g$ j/ s
40
1 V6 {3 m* M3 z2 } }( [# m70
3 |* p# M* K" T0,5 cycle2 g$ `$ l6 r. k6 U6 a
10 cycles0 f7 q1 w7 W r6 g* \
25 cycles4 B3 s+ M1 |* Y d- W
0,5 cycle' \) S8 H$ f. t0 V+ N! W
12 cycles
# T, z/ v& c5 x' c30 cycles6 {$ h% \+ H4 x" ]" h$ x# Q$ m2 I" o
IEC 61000-4-11* B+ U0 B( S- k5 @! g
Voltage change shall7 A, G) B. V; Q9 X& n
occur at zero crossing
( c6 m8 w+ Q ^% pUT is the rated voltage of the equipment under test.
2 k7 b( O; g2 L! W0 [; h" U& I; N; f! B U& H$ M; {7 |
, c" a/ Q6 {6 s J% W
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
' M9 K6 q2 v) Z6 l' _Page 27
. J& j. r# ]" u8 Conditions during testing
. d0 N( q3 u$ Z( l1 J- |) x2 D& L, L8.1 Replace the first paragraph by the following paragraph:
: I; D' V5 M: t9 T( r& h% {Unless otherwise specified, the tests shall be made while the apparatus is operated as
u9 h: Y, C: d4 p- Lintended by the manufacturer, in the most susceptible operating mode consistent with normal
% [8 X, ^5 U' y I4 yuse.
: R0 g$ Z2 Z3 s: C, F) y7 L8.4 Delete the second sentence.$ ]6 W4 ^* u6 F8 i3 U/ V% a/ L
8.7 Delete this subclause.* X) j0 Q, r( W2 H7 p* C" _- X
8.8 Renumber this subclause as 8.7
& x- A& d2 |4 J0 n+ y. l1 H! uPage 29
i5 S, x2 x$ F2 S: F8 y+ ^* I4 ?: q9 Assessment of conformity
7 _' [1 H. }+ {: J, f* p- \- E8 t9.2 Statistical evaluation
' }$ X o( H. ~7 x3 M% F2 Q, ]( wReplace the existing Note by the following:6 H9 D, M3 Z% j* f2 D5 s
NOTE For general information on the statistical consideration in the determination EMC compliance, see
/ U# ~; \/ F: o. F$ k# jCISPR/TR 16-4-3.
& M! ?. B7 ?/ R" x/ f& TPage 31
4 R5 _0 p* {2 U6 g. i7 v10 Product documentation3 o1 d9 Y3 K" A3 V2 P
Delete this clause.2 f1 @6 t0 {0 C
Bibliography
7 v) T# c- V5 c3 xReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
N# _$ z6 `' V3 F+ bCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
( T Y i5 c* g( k- b" c% m6 ~methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in$ w8 d% P5 o$ ?3 ^/ p$ V& n
the determination of EMC compliance of mass-produced products (only available in English) |
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