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由于我的标准上有公司名字，就不直接贴上了，差异部分如下" m B& o, {% Q* p0 x
/ e- x' i! G, C4 J4 n# ^2 _Page 9( F# N, Q) }* p: p
1 Scope and object8 W6 G/ o9 F! z# r8 k/ N
Replace the title of this clause by “Scope”
# S) o+ ?* j9 A( c! d* p! j1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
6 T' D4 d3 {6 r, R |8 o, LPage 112 ^' h ` _/ d
2 Normative references! ]: I3 E$ S7 |0 K2 G B! E
Replace the text by the following:
# E. y9 p) S0 r$ @! v& jThe following referenced documents are indispensable for the application of this document.& L# P2 u& Q# q: H0 w, g
For dated references, only the edition cited applies. For undated references, the latest edition/ V0 e! ~" ?+ r
of the referenced document (including any amendments) applies.
9 b7 r& ~. D5 t$ Q9 R R2 l' F" IIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:: ^$ z6 I2 d0 D% T
Electromagnetic compatibility. L7 |" t* e j
. I$ E0 G: `5 e
' R' Y2 N( p; i# k( h
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
+ g4 n0 B# E& T9 X# ?IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
) Q( L8 U) m( c+ t) o" N7 Pmeasurement techniques – Electrostatic discharge immunity test; C3 U3 r/ S2 w R5 @
Amendment 1:19989 \6 a* g2 \" s
Amendment 2:200019 k4 h1 R- |$ Y' w" z& V' ^
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
# S2 k' I' g, u( Ymeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test6 {. u! D! q. ~2 [( n
Amendment 1:20072
0 L; h/ F% R5 f" T4 P! D$ iIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
r, v8 ~" S' R& M) \measurement techniques – Electrical fast transient/burst immunity test
0 N/ H( x# M4 ^9 p: O8 Q; ` K7 oIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
5 ~& g4 n' Y7 u- c/ gmeasurement techniques – Surge immunity test) h1 m" r V, |. p* o; [
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and, w0 F6 }; q+ g S- p9 {: U
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
) Q: k& T4 d& N+ L. z( u' afields
: N( p* o. Y( C5 e( l& } k* RAmendment 1:2004% c' E# V0 q2 k* `
Amendment 2:20063* e9 D/ g) `( O( c& n6 s% F: o |7 ?
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
$ d) K" u6 j+ |5 T" Jmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests4 I" ~# ^9 a/ [. h+ M
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
) B2 L; b& H' |' h, n Belectric tools and similar apparatus – Part 1: Emission- o' V3 w$ } k
Page 13- r3 X% a' s2 @
3 Definitions
! d; {# o% d' W P! `) q# n* }Replace the title of this clause by “Terms and definitions”.9 }# Y+ k& A, b4 d7 _9 x
Replace the first paragraph by the following:
( p5 Y4 x9 P. i4 J. f+ y* ^For the purposes of this document, the terms and definitions related to EMC and related
: g- \. d, H6 P( ?/ Uphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
- i( V) M3 b, n6 f8 sAdd the following new definition:
$ U7 l7 M3 p( w. ]9 R6 |4 h- Y4 x3.18
; J9 Y" H/ Y1 I5 ^! aclock frequency8 ]& e/ J) t( E9 P5 P$ \1 Z
fundamental frequency of any signal used in the device, excluding those which are solely7 i& ?! c" F: d+ ?
used inside integrated circuits (IC)
( t7 ?+ p2 I7 H- G% |, g" jNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits% N" t1 C1 o# e6 n6 d8 `# B
from lower clock oscillator frequencies outside the IC.4 @( o5 T& t: ^! d
___________; k* \- F, D& X' Y+ S
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
, v0 P3 \3 s* p& h2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
! V4 S$ T% \6 M4 {6 Y& E: p3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.! Y/ ~" e4 G3 P7 P/ d3 {
; @+ N9 S0 g# k) }7 T, q
6 f6 H0 E+ a9 b5 r
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
8 c! b4 C a- ~+ u- [( F9 a5 HPage 13
^4 H Q: c3 g$ I: b8 N4 Classification of apparatus5 }, S: x7 Y/ C) B
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE. P5 z1 y- g9 w% o% ]2 q+ e. e
Page 15
. |9 |8 B+ [* V0 ]5 T1 g5 Tests
: r( e0 H& p' \Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.# `7 l9 G: A% x. e6 |
Page 21& A' A9 s; E0 r# E3 O1 ~
5.6 Surges
) |8 @( j9 B# w0 Q8 iTable 12 – Input a.c. power ports
8 @8 O' N ]- Y; k6 XIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add$ a% n, K; M) R" Y
"Line-to-Line with 2 Ω Impedance".
/ `+ M f, z! s! nAfter Table 12, add the following paragraph as a new second paragraph:
: R: n2 t, d/ E( BThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
7 G, |; Q5 B' n4 Q4 F4 b. ~$ `equipment under test, and the negative pulses are applied 270° relative to the phase angle of0 `) h7 L7 P Q# x$ c
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
S' A7 H& C: Q6 }- J8 k2 Y; o: @given in Table 12 are not required.: q$ g: U+ e; S" R* `
5.7 Voltage dips and interruptions
# i" r4 L9 M% w9 Y0 M5 T, V* BTable 13 – Input a.c. power ports- \& s$ t3 I4 b4 D x+ y
Replace the existing Table 13 by the following new Table 13:
8 A# y4 i- r8 ]8 bTable 13 – Input a.c. power ports
( L0 V# G% `- m ~& ^4 L, }4 MDurations for voltage dips+ F2 ~; ~% I! i5 f N
Environmental Test set-up
( @) w6 _+ O, \& ]) w& Z% G( Tphenomena( b) L8 ]5 h3 Y9 L
Test level, N4 V: e7 Z1 ]6 H
in % UT* a. ~$ T& B* Q8 @
50 Hz 60 Hz+ n( T4 G; i" Q
Voltage dips
+ o Q) k8 N$ A/ P4 \$ M. t9 H. uin % UT5 ]& U3 D# n. ~: j
100
$ J- Y. V: j9 s0 p60
9 r# D6 I9 x" v) W, X8 k30
% f4 z2 I' g3 Q# N( ^0
0 ^, ?3 C9 B1 M; X3 T40
/ B+ M( Z+ `4 Q70: o6 J9 h+ J5 e% w
0,5 cycle
9 U( d0 Q' r5 o# R: V/ |10 cycles
. X/ `# J+ f, e- w! l! N- g/ l6 Y25 cycles" p; m% L0 s3 v$ a+ q
0,5 cycle
9 `3 _0 P) Q7 {) R12 cycles
7 [$ Z7 K4 K P. f30 cycles/ t/ M+ Z c$ ?
IEC 61000-4-110 ?5 V( ~$ l( L$ I5 Q# g
Voltage change shall, \3 b- V4 [1 W
occur at zero crossing0 X. s. e- z" B3 [. w) t, X
UT is the rated voltage of the equipment under test.; V0 { [& j, m+ O: k' d D
# n; t% m' e" ]7 e; x, c% U/ R( R8 w( I5 t4 z7 y- b. H
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –( R- F& [6 ?7 s B2 f/ a8 t
Page 27
8 ]6 D! X+ L/ z+ A6 ~8 Conditions during testing) Z( E8 w# z3 ^3 q# a
8.1 Replace the first paragraph by the following paragraph:
5 D5 m3 y. h) }! {! D tUnless otherwise specified, the tests shall be made while the apparatus is operated as7 k7 C; j& E- }! N9 A
intended by the manufacturer, in the most susceptible operating mode consistent with normal. Y% M4 g3 Z; l# p% f+ i
use.
7 W( g' z; g+ G8 i" z3 D8.4 Delete the second sentence.5 J F4 ?! X- p$ I1 H7 h5 w
8.7 Delete this subclause.
$ A2 \8 \: J; ~) ^5 E% Q2 C8.8 Renumber this subclause as 8.7, g3 M# F& g& t2 w: f& I
Page 29 G7 t3 \' u% t& H& w
9 Assessment of conformity
E- w7 k; e+ R9.2 Statistical evaluation
& N# [' e* s0 {6 cReplace the existing Note by the following:. w! D* Y9 {' D4 `4 R
NOTE For general information on the statistical consideration in the determination EMC compliance, see
( h% V' m) m. J4 @" aCISPR/TR 16-4-3.$ {; h+ s. O" E" l
Page 31( W0 l- @# n( g' Z7 @$ C
10 Product documentation
Z, \- S2 ]; s0 t0 N. t4 L! {Delete this clause.
& Q, Z" Y. M- e. ]8 i! |) ]7 pBibliography7 f( e" i. v9 Y9 \: ?8 W
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
8 |# C5 [) K. K$ HCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
# i7 T1 A, ]' i1 T; `1 p9 D qmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in' q) Z5 d! n. E
the determination of EMC compliance of mass-produced products (only available in English) |
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