CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
請參考附件
5 p4 f$ \6 t9 U5 r$ o& s
其中,
7 N. q( d. L4 v0 s: z# y+ jDOP : 表示發行日期
通常DoP 之後就可以開始使用
.......

; ~" r0 ^' H$ g+ Z" ~
可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :

" D. O; e& ]! a) X5 u
! o0 \' Q; ]7 p- y8 `
可以贴上链结网址吗? 谢谢.

http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下

& T8 F1 w) R# E2 c$ CPage 9
1 Scope and object
5 S: b5 H2 @" ?' p' d: w# qReplace the title of this clause by “Scope”
$ B" q6 g+ R- i! B. Q  m1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
Page 11
2 Normative references
/ h8 B# `7 ^8 w& VReplace the text by the following:
+ c6 S8 ]+ }8 N+ h/ i/ ]& [The following referenced documents are indispensable for the application of this document.
- z+ H1 E6 S! p1 UFor dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
* ?! }; M% `9 s1 U2 T) {/ ]IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility

( T& Z# a. X- \; d3 x! j
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
8 w. j/ y& l6 k' uAmendment 2:20001
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
Amendment 1:20072
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
$ }( I% K! H1 _& i' xmeasurement techniques – Electrical fast transient/burst immunity test
% a7 M' D- u( l4 c7 XIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
" n  x7 }5 k9 L5 u& O5 g3 f3 fIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
  I/ X  {8 }2 h+ Q& H9 }measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
8 h. ]5 N8 ]6 a6 u1 h; A6 p- Y6 `Amendment 1:2004
# X/ I' ~4 {+ i$ `  n7 ?Amendment 2:20063
0 a2 Z* v. n' J9 D( K  G" D  a) C. gIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
  N0 v' ^0 s( K' O: z# A8 |CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
Page 13
  E+ y/ m1 u  e+ D, H3 Definitions
Replace the title of this clause by “Terms and definitions”.
# ~. J1 V4 v  \$ i$ RReplace the first paragraph by the following:
! \2 A0 r" m' `. x) s# s" q1 bFor the purposes of this document, the terms and definitions related to EMC and related
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% s% ~7 ?9 X" m& q4 I/ e! uAdd the following new definition:
- F- N, p1 m8 S, G. Y3 {: j; n, P9 C3.18
clock frequency
fundamental frequency of any signal used in the device, excluding those which are solely
$ A# n3 r4 l! t8 A- T1 aused inside integrated circuits (IC)
6 U! I& O* _" }3 W  h5 U  i9 F# E3 qNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
+ I3 S: d) E3 ~+ s' R# Z___________
3 R1 j" W9 k7 W. \( d1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
1 g; k% n$ b5 C" @( F2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
2 W$ V, F; P/ O3 W! T" S9 Y5 c
0 d! G, }% k6 [) z9 i" m0 H
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
Page 13
' q2 R. ^! a% U8 P5 C4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
6 L, k+ @/ m- Z0 a4 m9 g. UPage 15
2 ?& R$ g, N( _* K5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
: v! I* i% Y4 s+ k5 d+ TPage 21
6 c( W: j: J. a  p. D5.6 Surges
Table 12 – Input a.c. power ports
" ^/ y: x  ~$ EIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
, ]  d9 w7 o' ]2 n"Line-to-Line with 2 Ω Impedance".
$ F' Z! ~9 Z+ c5 V4 g2 d' JAfter Table 12, add the following paragraph as a new second paragraph:
: N$ A9 H0 ~9 s& e; e( t2 BThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
+ q8 g. \9 Z% j4 A" ]; u: p6 Nequipment under test, and the negative pulses are applied 270° relative to the phase angle of
& s% }9 O# u+ t" Uthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
0 R& S* u7 `) _given in Table 12 are not required.
& \! ^  j0 u( c+ s7 a5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
$ \) H( G0 x" S- xTable 13 – Input a.c. power ports
Durations for voltage dips
Environmental Test set-up
phenomena
Test level
& P* d! V; s, u5 Q- p  j6 M* \! Ain % UT
50 Hz 60 Hz
Voltage dips
7 ^1 D7 b5 }! l8 U' [; L2 Q7 d, Pin % UT
" g5 G1 Z& D$ [7 R4 \100
  `- a5 `+ Z$ c8 b2 O' N60
: x2 n! [0 W2 X& U0 z30
, T" s  {. N6 c& h8 r6 ^0
40
70
8 d4 Z6 h( V3 d. V# k% e. \& C0,5 cycle
10 cycles
25 cycles
0,5 cycle
, c: r3 O3 |% h# Q) Z+ i6 G1 v! O! G12 cycles
  V: \0 W2 G+ ]7 y: S3 ~! H30 cycles
IEC 61000-4-11
+ N! C  B: }/ bVoltage change shall
  q, {" q; ~! Ioccur at zero crossing
UT is the rated voltage of the equipment under test.
* ]+ Y/ w. t% M; a

' e/ g( a9 j* L+ U: k4 NCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
# c( ^4 P3 Q" h8 e" }% V/ z; _Page 27
8 Conditions during testing
8.1 Replace the first paragraph by the following paragraph:
/ G: N! `' o* nUnless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
, U9 q4 T7 |# [8 d4 s5 G* ~- Yuse.
8.4 Delete the second sentence.
8.7 Delete this subclause.
8.8 Renumber this subclause as 8.7
Page 29
9 Assessment of conformity
0 v5 C, l1 J3 W' l5 E9.2 Statistical evaluation
' a1 N/ a8 D: P+ @5 t. }Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
/ h; y7 n8 l% _$ [' t6 |CISPR/TR 16-4-3.
; r$ z- Z8 j+ I# d* M4 aPage 31
' _" J4 b/ |2 Y1 p+ q8 m  a10 Product documentation
- v& B& S* x* ]Delete this clause.
Bibliography
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)

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