|
|
由于我的标准上有公司名字，就不直接贴上了，差异部分如下" P7 A \* c4 b4 h2 `% E
6 q3 O# L5 ]6 K6 Z! w
Page 9
h) V2 ?" U% J$ X1 Scope and object
4 t1 B( v# J; M$ ~. d+ m8 }Replace the title of this clause by “Scope”7 b8 c0 n# m# A5 _: Q% p! T4 s
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
! U# B- Y5 h' r) z4 A* fPage 11
9 o3 A+ X1 k# y0 v2 Normative references
- z* R. ^, F' J/ ^Replace the text by the following:' M3 p" N1 h6 N( U3 @& W p% c
The following referenced documents are indispensable for the application of this document.9 g$ q! A m: u4 A, e+ }6 |+ t
For dated references, only the edition cited applies. For undated references, the latest edition( n, i" ?; m4 M7 p' m' d' x) j% T
of the referenced document (including any amendments) applies.
% m1 [7 N8 y0 _( W2 P' S4 i5 K4 X$ lIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:0 N) x1 H) p; z. t
Electromagnetic compatibility" W. E. V i [& |( t8 S, z. e
$ A9 o# ]) y% A
5 K( ~ @# U. u9 pCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
$ {/ m( ?2 N! S/ \% EIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and. b4 g1 F6 U% v' ?4 F$ R
measurement techniques – Electrostatic discharge immunity test
2 h5 p2 ~! b8 l& |/ o7 o# KAmendment 1:1998+ Z8 Q+ l; h6 D) M
Amendment 2:20001
; _: a' ~3 h* b8 ]+ n4 s1 x$ `IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and& y) G( Q' H f6 ^ j
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test B1 |4 t+ o B1 D" N( O, h6 y3 y
Amendment 1:20072
( C# ]3 Z, {2 a* Y+ _8 b% E8 lIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and: D5 n0 H& z, K, G5 s z0 k
measurement techniques – Electrical fast transient/burst immunity test
9 a s) V6 l3 N& T; \' l1 k" {IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and% o. T8 J1 ?5 {% N( Y2 h% E
measurement techniques – Surge immunity test
) S6 u4 w P/ I; @. wIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and# C$ K0 I2 c3 c0 E0 \
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency' S0 s9 Y f3 y" W& @
fields
; Z+ s+ j/ ?8 @4 aAmendment 1:2004( q8 m9 I) r. s- Y9 ^( v$ o4 q+ F
Amendment 2:20063
' N1 k4 t9 Q8 A% ?+ j, }! pIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
- G( Y: |3 G% omeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
8 v' g! T3 J: r; GCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,5 Y h: X9 d! A* L6 n" B- c
electric tools and similar apparatus – Part 1: Emission9 k( J; Q A/ g/ }' R
Page 13
, {, g% e4 m7 I1 }2 A3 Definitions% j' [8 \( g" V5 s) @
Replace the title of this clause by “Terms and definitions”.
$ U; k( X& t- NReplace the first paragraph by the following:
1 D6 f2 k$ p) {# {4 n/ \For the purposes of this document, the terms and definitions related to EMC and related! Q2 ]% @2 _4 f0 o
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
- Z7 F A5 f% y" j' FAdd the following new definition:
7 P, N+ J! r1 Z; q3.184 F6 V) X' L2 h8 R( {
clock frequency$ m% k2 C8 U3 k* d
fundamental frequency of any signal used in the device, excluding those which are solely% J. S( P e# S% K4 \
used inside integrated circuits (IC)
5 C& S. S8 e( \7 w9 a4 ^# _NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
C2 E$ V6 r2 e5 Rfrom lower clock oscillator frequencies outside the IC." h0 m8 n% \8 b+ U- o+ m8 w: W
___________
5 t, J F8 P0 y6 g) s* m0 y1 o, L1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2. n* v: D. Y* `1 }% r
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1./ r3 c; O4 l) Y; b6 z
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.+ l5 e/ S' t8 k
5 M1 Y- |& {& T5 {- g4 z5 D+ r# G, m9 s& u1 o7 {6 ^
– 4 – CISPR 14-2 Amend. 2 © IEC:2008- y- y/ X& _7 w( g% {+ T8 E
Page 13
& @) A- E1 \. q/ y: H/ w' |4 Classification of apparatus
/ l$ Z+ v6 P8 u% [4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
& T- y8 ]7 k* o+ J8 S% jPage 15
; [- f, L$ w! \5 u& Z" O, D5 Tests
! `5 K2 T8 R2 s1 Q! @Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.& Q$ h3 a6 U. e. \
Page 216 j* _% q" {; g- l
5.6 Surges
" N% l, u: v7 R; j1 M" _Table 12 – Input a.c. power ports) n# [6 g* h* D2 z8 W
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add6 s, c% y. l9 t
"Line-to-Line with 2 Ω Impedance".' ?8 ?$ }/ ]' X; x8 P, L
After Table 12, add the following paragraph as a new second paragraph:
/ h5 {9 {3 e2 a% ~0 E8 U+ p9 t2 PThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
% Z8 ]8 q8 B+ l: k/ Cequipment under test, and the negative pulses are applied 270° relative to the phase angle of. [! _* U4 M$ f6 ?, V5 W; a& G
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
2 a6 ~. |8 Z& O6 S. i5 U Pgiven in Table 12 are not required.
) \7 M. X5 c* U2 |$ x! Z3 S" \9 J5.7 Voltage dips and interruptions
1 }% o+ F5 j$ m+ cTable 13 – Input a.c. power ports
% R. c3 J O' C; q& H) T0 I9 CReplace the existing Table 13 by the following new Table 13:2 V4 ] [# o( m9 L- ~$ v
Table 13 – Input a.c. power ports& c# Q! I* {9 ~" C7 S! H1 a
Durations for voltage dips
2 ~ I" x( ]4 H) zEnvironmental Test set-up- H4 R4 R9 Q* B8 o" A# q: c, g- f
phenomena# x: y+ b- ^! g) k
Test level, w; [' Q4 T; y* c% A4 U! V; {
in % UT
+ X( n U) I/ Q. O50 Hz 60 Hz2 _4 ~' [( B" @# d) e. }* R, I
Voltage dips
# W- C# c d4 b7 o& |: Din % UT
' I# t4 G5 k/ T4 ]$ o100
X& }/ Z& k9 v' S/ I604 s/ o2 w' i B: f
30
# c, C; h. V# b: e* N6 [4 g! A% F0
* a S4 E; R' |" L* M407 s J7 R5 N) x' H( }' P
70
1 ^+ O# Q3 I( c0,5 cycle( L. A* Y# M% V! u; l8 X* i
10 cycles% K, @% J# m' L0 g# V2 [6 X( B" Z
25 cycles
1 F+ P: ~8 _ ]0,5 cycle1 F' C8 N3 G4 N$ O0 S. Z& S" k
12 cycles
0 [1 H+ ~+ C4 Z5 W' J30 cycles g- K# I: E8 z2 q$ J
IEC 61000-4-11
2 ], A5 s d3 z# N0 pVoltage change shall- d- _" O+ s8 I; h. i' J% O
occur at zero crossing9 u# R1 M* V3 ?5 t! `4 L" F- _) d+ A
UT is the rated voltage of the equipment under test.
6 ?3 ^) m1 K+ a5 _ D2 x/ R9 G
; G1 ~7 i% K1 Q# |4 V
: S+ q- ^0 n. b* xCISPR 14-2 Amend. 2 © IEC:2008 – 5 –6 S: T7 ~& G1 t* q: L# r1 f
Page 271 o2 a3 V. B! q& j
8 Conditions during testing
4 z# n F6 N: {) C8.1 Replace the first paragraph by the following paragraph:
y" ^4 \/ B" ^" i7 IUnless otherwise specified, the tests shall be made while the apparatus is operated as
1 f2 D( }/ y; [3 B4 _intended by the manufacturer, in the most susceptible operating mode consistent with normal
8 }* x$ n! c9 q# f! Muse.) j! f3 R, \: S# k# z0 h
8.4 Delete the second sentence. c5 Y( M6 d# S$ h
8.7 Delete this subclause.- O2 R, ?/ X; i! Q/ l# r0 g4 N
8.8 Renumber this subclause as 8.7
* e1 Y/ h, S. `% h: K/ |6 A, APage 29
$ f; g" t1 M) ]$ ]' w% o" i+ X- W9 Assessment of conformity! Y& }& I) S6 o: ]7 d
9.2 Statistical evaluation0 h: V% K' R9 n
Replace the existing Note by the following:
0 a: g4 }0 ^; j6 sNOTE For general information on the statistical consideration in the determination EMC compliance, see8 j$ G# E9 s: W! n E* y7 a( C3 n0 F
CISPR/TR 16-4-3.
6 R1 N4 l! N( y1 Y% K, APage 31
/ n8 l3 a& x4 m$ g: i0 H! a10 Product documentation2 Z' w8 k9 p& ?9 e% N8 `
Delete this clause.0 m2 O* J2 Y) Q( ^
Bibliography
( m- _6 j9 y5 B: ]# ]' o6 [Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:) `4 H. ?, F7 H; ]- ?# x/ d) y8 T
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
( H: Z5 L: a6 h- ^: l4 C0 nmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in2 Z8 Y. U2 v- {
the determination of EMC compliance of mass-produced products (only available in English) |
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 )
窥视卡
雷达卡
发表于 2009-3-11 08:21
显身卡
发表于 2009-3-13 10:04
