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由于我的标准上有公司名字，就不直接贴上了，差异部分如下" `' D% G( S1 K$ p) F$ ]1 Z
& }& [4 _+ X/ D" Y, w qPage 9
0 O# \5 g$ `* I$ x/ Y( v1 Scope and object
w8 f% }' P. fReplace the title of this clause by “Scope”
. n: j# r- c" s0 K1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.8 k3 }$ ~ w* Z/ M, Q6 B) c
Page 11
( Z% z) F- [$ X$ v7 o7 ? |5 {" o2 Normative references
) b4 D% C5 ?, a3 H" ~6 xReplace the text by the following:# d# D3 D3 ^. S; J$ k8 d: c
The following referenced documents are indispensable for the application of this document.
8 N: x, y0 I/ I& m4 R. _For dated references, only the edition cited applies. For undated references, the latest edition% v r7 I/ S* h$ R6 ]: c
of the referenced document (including any amendments) applies.- @! `! Q5 W* S
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
, y& ]$ k& ^5 |% hElectromagnetic compatibility7 c# L, ^2 f/ ?- m+ y" D+ Q) o( L2 }
: v% V( f: M6 k% @: o
6 R% E7 V" [1 w6 L5 j- ~/ M1 b& LCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
J/ x! G2 y& z# E' q- Z: b$ vIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and8 ~/ {( f& ~; l
measurement techniques – Electrostatic discharge immunity test
+ x. Z0 @8 x, S6 s8 }" yAmendment 1:1998
# E& y( p5 S x6 U7 H! t7 L# YAmendment 2:20001, x7 O5 \! z4 o% c
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and9 ?* I) [0 C( O6 z2 }
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test; H, U0 V. r" J3 d: B% W
Amendment 1:20072$ P5 q9 a- V2 V# A2 d
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and3 p: @) g; m [7 ^$ }7 P/ z! o
measurement techniques – Electrical fast transient/burst immunity test- {. ^4 y- m7 k- ~. _# @
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and7 G- Y& j; T2 Z5 a q
measurement techniques – Surge immunity test
0 D4 v) C: x) W# P8 _& RIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
! b# P" P8 \& b$ ^measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
$ V# r3 w" p( T& {fields! q( I: o' t% e$ l
Amendment 1:2004
" }3 Z s* f0 VAmendment 2:20063
2 T4 B9 R0 c s, k$ h5 nIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and* h6 G, k( I" @! b0 X7 A* Q) D/ x( C/ [% g+ f
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
+ @6 h( {4 R# ?# q* Q& QCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,, T( P0 N' W: M$ T( w, E- r$ G
electric tools and similar apparatus – Part 1: Emission
. W5 G' [' @3 I/ n' }Page 13& s' k2 {7 R- n/ v
3 Definitions
1 G1 m; ?) m5 K$ rReplace the title of this clause by “Terms and definitions”.1 C. E4 Y. Y+ w& E! r
Replace the first paragraph by the following:
/ y# S9 D# a- mFor the purposes of this document, the terms and definitions related to EMC and related: _% c3 M( L- I; y# y! _: a
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
% y D+ Q! Y* S1 J' t1 B8 HAdd the following new definition:
7 x! l3 |5 p3 T E- }4 E3.18
' I3 M: E* I& S& A* jclock frequency2 A; m: Z- B7 r2 A4 ^
fundamental frequency of any signal used in the device, excluding those which are solely
. w9 n% ~2 ?6 yused inside integrated circuits (IC)2 m% U/ J$ b) Q& H4 \( G3 [1 L
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
( o, ]* C7 N8 |$ t- pfrom lower clock oscillator frequencies outside the IC., n! ?4 ^$ `" y2 y* D% j
___________( d3 F/ C5 t3 b9 f' t k9 Z( h
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
- ?6 j; ^( A2 m( Y& p2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.( B; r+ |* s, d2 S
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.; X* D' X. P) }, |! r5 G0 V0 }
S$ I' u$ U& H$ ~! l0 ?
" q P5 y* Y" u8 y6 q8 q& T% l– 4 – CISPR 14-2 Amend. 2 © IEC:2008
3 h; I6 u4 r0 o8 ] B6 K5 bPage 13
0 P4 ?/ h$ y, `& b4 Classification of apparatus6 ]( p7 A' i9 J4 w, d
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.: `* S2 X+ j2 y5 E! V/ _2 }
Page 15
/ P6 [ n+ q& k6 h I( W w) o5 Tests
7 D6 ~. s) p5 T) w: `) }! x- _- FThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
1 q, g+ @5 }4 b L$ P2 @6 DPage 212 l* Q! B% X0 f0 G( l8 G
5.6 Surges
' _! A- i+ w5 ^1 F% t7 t- ATable 12 – Input a.c. power ports
) V0 E6 n& |4 W! h$ x% H$ PIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
4 J( _& Y/ n; M' U# E# ?"Line-to-Line with 2 Ω Impedance".2 V G# `# q0 H" n
After Table 12, add the following paragraph as a new second paragraph:
7 f2 J# |7 X/ h" t8 p. SThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
+ j& y# E4 |% M/ y% |# iequipment under test, and the negative pulses are applied 270° relative to the phase angle of
3 S1 B1 V( P+ A7 C* wthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
( t ~+ P# R( @$ Egiven in Table 12 are not required.
7 j# `8 E( @% G9 |" y5.7 Voltage dips and interruptions; K* k1 Z6 R, v2 y
Table 13 – Input a.c. power ports
1 W. J5 b; F9 J1 q- f9 Q* n3 _# b' aReplace the existing Table 13 by the following new Table 13:* p8 K" k, r& t0 a9 Y- _
Table 13 – Input a.c. power ports! F& r& s, i% A$ l7 I4 e
Durations for voltage dips
) l6 S) K4 c+ o; nEnvironmental Test set-up; _3 J/ B. w7 N
phenomena" ^+ z- ~# z* g' o( h
Test level: @8 Q( e- D1 |) `
in % UT" _- z8 l5 e, G# |
50 Hz 60 Hz
* ?7 Q7 @* t6 o o: O% i$ B6 tVoltage dips
# C% H# ~; Q+ B! k% R5 Pin % UT
- l2 S. ~5 V- s1 |100! R% A. h- l3 @ v3 i
60
/ ?1 g1 o0 S7 E" x! x: B b30
9 K- `9 w& L- ~1 ?0* L& s) C5 O9 b: {
40
H7 s( t9 W) v1 R6 \70
: J6 x$ ^4 ~2 S9 A/ ]; {, `: h0,5 cycle
; g* T) G8 M' _) V6 M" t1 e9 E$ c10 cycles F7 l& O$ K4 c/ \
25 cycles/ z L% y* K3 d8 a
0,5 cycle
- d0 u2 |4 ^* t8 B: _8 Z8 T12 cycles2 y2 Z" N, h( O- _8 L+ }/ Q4 a
30 cycles
; Q6 d. B( A0 b. |4 _7 R, fIEC 61000-4-11
. s! M' I' D: Z8 E( [3 X% s! @Voltage change shall
4 k: B1 u: F4 c% joccur at zero crossing
/ u7 m' v5 z* H+ c! y) tUT is the rated voltage of the equipment under test.
9 Z1 u0 s& L0 n3 v G! |6 s, y. b7 Z7 W/ a
3 z. g; X9 T5 H* c0 P- L
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
7 R/ q4 v4 ~ d+ s+ }Page 27
- i. `+ P' u% y3 L8 e9 X, u+ h8 Conditions during testing
% a2 v( b% @8 w3 \/ e8.1 Replace the first paragraph by the following paragraph:
4 @% g# M3 q2 N1 z$ m/ eUnless otherwise specified, the tests shall be made while the apparatus is operated as" H B8 z1 }' D, R/ ^
intended by the manufacturer, in the most susceptible operating mode consistent with normal- Z& p5 _& [2 |9 L
use.# a& I+ R% H9 T- {) y
8.4 Delete the second sentence.
& l2 z' ?9 W' `; i: V7 h# ^8.7 Delete this subclause.4 p, U# G' P f6 k q; {7 j5 h* y
8.8 Renumber this subclause as 8.7
, F/ h1 q. A1 G# DPage 298 d# }, q5 Z @$ ~- Y* }3 X3 M; H
9 Assessment of conformity6 D7 u, d0 K: M- J7 p+ u* z
9.2 Statistical evaluation, ~$ j- U6 r+ u( q7 n- [
Replace the existing Note by the following:
3 V3 |8 ^- E+ j2 q8 xNOTE For general information on the statistical consideration in the determination EMC compliance, see2 g* W, u v* ^$ G; V* @
CISPR/TR 16-4-3.( s9 d7 A& r/ N; j5 o
Page 31$ _& l7 \ C% ?7 Q
10 Product documentation) p/ r; v% T+ {* W. l( V5 N
Delete this clause.0 x# _5 }. m- a4 ]
Bibliography0 H1 v: e/ D) w- ^# Q/ |4 `% i9 p
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
; y( ^# v; c6 k5 r- GCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
; I$ I/ R! }* d) H7 A- A( Q# A& Amethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
* z" W$ D1 v( O. h% F* q. O- |( lthe determination of EMC compliance of mass-produced products (only available in English) |
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