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1. 2.1.1.1 Access to energized parts7 x; t- w) n" y; ?
− bare parts of TNV CIRCUITS, except that access is permitted to:
- _8 `# L0 \: Q' I$ i# I• contacts of connectors that cannot be touched by the test probe (Figure 2C);
, v5 }! O+ c# O" Z4 t! zd) A test with the test probe, Figure 2C, where appropriate. 标准里面这句话以下有说明。
8 O8 W4 E! y! A1 {# y9 h
+ P3 ~. n, @) z' i9 B! }/ _8 `4 k$ i2. 6.2.1 Separation requirements
4 ^4 B/ f/ M+ ?; [2 `5 M( bb) Parts and circuitry that can be touched by the test finger, Figure 2A (see 2.1.1.1), except! J: ?/ Z4 @2 `& l2 I( p% J% M
contacts of connectors that cannot be touched by the test probe, Figure 2C (see 2.1.1.1).其实就是上面的。 |
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