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1. 2.1.1.1 Access to energized parts
7 m5 {8 q t! D' T− bare parts of TNV CIRCUITS, except that access is permitted to:" P. O+ \4 e4 D; F8 }
• contacts of connectors that cannot be touched by the test probe (Figure 2C);
* B, n6 e7 Q6 W7 A% k3 cd) A test with the test probe, Figure 2C, where appropriate. 标准里面这句话以下有说明。7 k }( v4 v/ _* ~6 C5 n+ M/ \( p
. U5 [1 c! i' [) D7 z F6 c2. 6.2.1 Separation requirements
4 ^7 L3 E: u- A/ Ab) Parts and circuitry that can be touched by the test finger, Figure 2A (see 2.1.1.1), except
0 o I( [+ _9 e( y5 ccontacts of connectors that cannot be touched by the test probe, Figure 2C (see 2.1.1.1).其实就是上面的。 |
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