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1. 2.1.1.1 Access to energized parts
0 r. L. S! } s: K- [$ M; q− bare parts of TNV CIRCUITS, except that access is permitted to:
" C; _8 F1 H5 x- m! d6 {2 g• contacts of connectors that cannot be touched by the test probe (Figure 2C);
) q+ ^8 y3 x1 qd) A test with the test probe, Figure 2C, where appropriate. 标准里面这句话以下有说明。9 S: _! Q# V8 P3 b# _/ k
" ?# B$ G' }2 A4 A/ d2. 6.2.1 Separation requirements" R {. O% p! {! n& _6 [" f* w
b) Parts and circuitry that can be touched by the test finger, Figure 2A (see 2.1.1.1), except
, u \8 \5 s/ P9 u3 C& _contacts of connectors that cannot be touched by the test probe, Figure 2C (see 2.1.1.1).其实就是上面的。 |
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