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本帖最后由 chinatown 于 2017-1-7 11:25 编辑 & J+ J9 ?6 \; ?2 n2 A
9 R' c) E2 d" s5 k ]* X! xQuestion
5 Y2 f5 d0 L# eHow many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
( s: K' _% m. g ?3 N8 a7 m60831-1 for shunt power capacitors?
+ a2 U0 n( [8 bDecision
& n! G+ s# I* v |0 \ U' `( t, KFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following+ J5 Y6 G$ x* T9 I& `5 p) [$ C
type test schedule shall be applied:
. I) k8 G. U. f6 B. K( d# m8 B" JType test schedule:
% a/ b' j3 w5 m8 B1 e$ z! ?; ?Tests Subclause Number of samples to be inspected& i# E8 h4 a! z8 M9 n2 y
Single-phase
7 ^( F' K6 B6 s) @9 ]$ H8 Ounits! S: v8 Q0 g% d$ a C; l
Three-phase units) Z, i, P1 z+ W$ A5 d+ m- p
≤ 10 kvar > 10 kvar% ~% q1 B9 V* A
Thermal stability test 13 1 1 19 q6 l& d" n! u. s& _
Measurement of the tangent of the loss angle (tan δ)
2 s5 L% e7 F; Y5 I9 c# I5 Q( J- iof the capacitor at elevated temperature8 t' `. F9 {; X# r# b7 d
14 1 1 1% {+ I$ _+ W! `; {! \
Voltage test between terminals 9.2 5 5 3: _, u: J0 {8 D) h: t$ ^
Voltage test between terminals and container 10.2 5 5 3
6 X* A0 a' M- y( zLightning impulse voltage test between terminals and: a3 d; h7 P q, c. o3 O6 \% G
container
- r v) N8 ?" r J15 5 5 3
- i; @* B8 L* I+ x+ zDischarge test 16 3 3 3
. Y/ E3 j/ ^/ f, v! {# A0 D7 rAgeing test 17 5 3 2
; w$ V+ h2 D# t" a/ d6 I6 `; \) p- rSelf-healing test 18 5 3 3
' Z. u6 F+ H1 J; FDestruction test 19 5 3 2' `0 T0 R8 \% @- a' |; ~
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发表于 2017-1-7 11:22
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