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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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Question
$ i0 T4 x/ s* l/ j8 @; {( {How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
/ D# y8 o0 k' E, q' y& X60831-1 for shunt power capacitors?& @' q0 j3 Z2 r, ~3 J$ L; s$ h5 ~
Decision
9 E- e9 R8 ]) v8 gFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following' v# C4 v; P! M7 a' s8 O+ b4 D; ?+ @
type test schedule shall be applied:% k, k8 b/ u# c" N+ u7 J
Type test schedule:
N3 E/ a6 [1 |! {' z% N( H6 ~' UTests Subclause Number of samples to be inspected% c& f( w9 k% N2 Q0 N
Single-phase0 W. r5 D. a6 @+ C% P6 I N
units7 r5 C. h: m+ V
Three-phase units- e8 _3 i3 z( j/ K
≤ 10 kvar > 10 kvar: ^( j9 v) H3 X$ C( M& ^: _5 }/ c
Thermal stability test 13 1 1 11 j. O) R' Y$ l8 v+ W* Q
Measurement of the tangent of the loss angle (tan δ)/ p7 ~. i! E# N* Q/ W* w
of the capacitor at elevated temperature
4 N. Z4 A* l" d( D3 \6 x14 1 1 18 G! v% T& m$ {/ E6 D6 w
Voltage test between terminals 9.2 5 5 3' G7 r7 t$ N, N" Z% o: \& `6 [6 t
Voltage test between terminals and container 10.2 5 5 31 _+ P* o; W; l; L2 Z
Lightning impulse voltage test between terminals and4 ]& z8 R6 M* Y# O7 p1 Z
container
1 j9 j8 D* ]7 G8 s4 J15 5 5 3
$ W+ J. e. {) U; a" A- `/ H) |Discharge test 16 3 3 3
1 p; u4 M: g1 N' P5 F* cAgeing test 17 5 3 2* v/ ^7 |8 ^( Z! g9 B
Self-healing test 18 5 3 3
}6 A9 h! m. ~9 }# \6 ]$ w/ T- MDestruction test 19 5 3 29 A6 I+ t3 d6 I0 s) }
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发表于 2017-1-7 11:22
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