|
|
本帖最后由 chinatown 于 2017-1-7 11:25 编辑
2 @+ }2 `! [8 O- [4 M" Q9 C2 B! @* @* V1 R: p. p Y) W+ p1 a- u
Question% W& D4 U2 m( m. |) b
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC2 E1 f1 ], A3 @8 L
60831-1 for shunt power capacitors?
! ?, W6 f4 G+ O. V# o0 X2 ], X d1 PDecision
6 z" x9 K" j4 E9 c, SFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following2 m% t/ L4 t W1 {1 N
type test schedule shall be applied:1 ^; E' N2 H8 q7 C* P
Type test schedule:. V; c2 X& Z: _& e
Tests Subclause Number of samples to be inspected, K9 I" P. p r$ g0 ^$ Z7 y' ~
Single-phase i: s) ^- o( C9 C, q* p
units% J$ U0 ^7 ^! L8 z1 |
Three-phase units2 g- z$ y+ }" A+ c4 n0 P3 a
≤ 10 kvar > 10 kvar
) c3 @- i" D' Q$ D2 ZThermal stability test 13 1 1 1
! K' D7 `4 q; D: x' vMeasurement of the tangent of the loss angle (tan δ)" J+ d; H( `- ?: I
of the capacitor at elevated temperature9 K% A9 L5 R, _+ f( ]9 @0 L
14 1 1 1, C4 R$ C# G3 y, D y! S* A
Voltage test between terminals 9.2 5 5 3
5 \6 p- H$ H6 T! KVoltage test between terminals and container 10.2 5 5 3
2 V" J9 u: z9 O4 ?Lightning impulse voltage test between terminals and
- Y0 a+ d, ?& N2 d, d7 S8 @container
' N2 j. F, }. d/ x+ _' r+ b# E15 5 5 3" p, u s5 M( o5 s
Discharge test 16 3 3 3) s- F( d" m, T
Ageing test 17 5 3 2
: d5 V! w4 W# BSelf-healing test 18 5 3 36 V6 W9 b' d: l& p. |% H/ u7 m
Destruction test 19 5 3 2
0 a; Y. s9 v# U7 m' o8 d; y z* P |
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 )
窥视卡
雷达卡
发表于 2017-1-7 11:22
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
抢沙发
千斤顶
显身卡