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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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- d5 Z i+ w$ l* r% g8 w2 vQuestion
+ z$ x( k) O/ S/ e8 b9 S2 w, \How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC Y, `( N8 v: [# l1 g5 n
60831-1 for shunt power capacitors?
" D. |: v7 i3 n9 @Decision3 j7 S3 k* U# y F5 P
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following' l; [$ M4 g. Q$ J$ V' K# X
type test schedule shall be applied:( A9 l/ h5 [. e4 I& h
Type test schedule:1 E n/ b u' I; j! n) B6 k
Tests Subclause Number of samples to be inspected8 l: N# ^8 T- q' W/ k2 H* V( P: s
Single-phase
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Three-phase units
. C9 G0 f8 i6 z$ f! `' v≤ 10 kvar > 10 kvar6 D) K5 U2 G' ?1 h; G
Thermal stability test 13 1 1 12 \& {3 |, @+ R
Measurement of the tangent of the loss angle (tan δ)6 w6 N7 n4 @, U' x5 u$ P2 {: ~5 [
of the capacitor at elevated temperature3 }( Z3 B/ `) g; J$ A
14 1 1 1& Z$ y. B/ y7 v0 M% I
Voltage test between terminals 9.2 5 5 3
% `2 M- |& A4 W! N1 S/ JVoltage test between terminals and container 10.2 5 5 3
( p$ C4 d; {( I i5 }Lightning impulse voltage test between terminals and: @/ [0 N9 M% Q/ D1 H
container
# l5 v! L6 p; v2 }" M15 5 5 3
- l3 b6 y) s6 oDischarge test 16 3 3 36 s; e/ }! W5 {/ \: X; D$ ^
Ageing test 17 5 3 2% M8 h% j6 Z! w0 r
Self-healing test 18 5 3 3
7 z+ {% g; G7 Z, d8 F: f5 b( |' X ^- fDestruction test 19 5 3 22 W0 x( a" L5 [ |! l
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发表于 2017-1-7 11:22
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