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NMX-J-191
6 j5 ?6 O2 V+ `0 k5 M+ V% b) r# @, ZHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
% @/ n C( d. o7 |Conductors – Test Method- h' Y$ O* G' U% {
9 l8 b. R: C( {- y0 g
' k" f0 n1 ?/ X- P5.1.3 Deformation
& i! V' f# G# T& t( U5.1.3.1 Insulation' q1 w: [2 d! n: B* Y
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
, A! ?- v! {. F7 dparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
, N- [& Z$ n' k( B# v2 dmass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.
, q0 r; G' F' N: H! o" w0 a5.1.3.2 Jacket- L& S. Y& U) v- ]7 ~$ J4 l
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
+ `; ?5 m# J4 y; m. U' ethickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
9 n: p) @0 d8 u* s/ B: ~shown in Table 40 for 1 h.
6 k0 G" l4 {5 ?/ D+ ^4 i2 f. I' r5.1.3.3 Method
2 w9 y3 m1 ~0 y/ O+ JCompliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method6 B& T! _/ Y- M0 g
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.) t# Y; K0 A+ V3 b2 g Y+ {" ^
1 g& r" Y' x4 B% F' D& d! \8 H
UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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