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各位大神,$ S9 q( v- f- [4 n, c
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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18.1 Dielectric voltage-withstand
) j7 \: d& P O/ Y+ r" E, M18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
0 x! b6 B) p$ |- e( q18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
" R T+ s' [6 a# }0 H9 h3 n7 xbetween live parts and accessible non-current-carrying metal parts, including parts accessible only during, N. c% R7 }8 m8 [. V3 s z
relamping.# b9 h4 `2 y0 ]3 |0 a$ E
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
) {6 f0 ^9 T% |+ G4 Qthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at) W$ X0 g+ Z( i7 {: Z4 i
1.414 times the AC potential denoted above.
1 ~. c/ i2 f+ P% P4 S5 j% }18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
0 b: z6 \+ k% R2 n) ztest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the% G2 t/ w4 T5 u2 [& B
ON position.5 c9 ?4 D- {1 Q0 e( w9 u: d$ s
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or+ o2 s' p; n! p9 I1 G. s# D
decorative parts not likely to become energized shall not be required to be in place.
7 y1 w' `) u: Y( _18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
1 ^& s% e# a* q6 n6 y# Wbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
b: i& E# Z' ^; t6 R4 `0 Qrearranged for the purpose of the test to reduce the likelihood of solid state component damage while
( P# K7 M" N* K5 h: O n: Pretaining the representative dielectric stress on the circuit.
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