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各位大神,
5 K) {/ j; I% x9 A! R$ J) C 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)' w( R4 q" b/ ^8 A# H( a' V
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18.1 Dielectric voltage-withstand
: g) C- r9 J" t18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
$ o5 m) i5 `# P, ]5 b18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
" [. l; M2 t" [9 ]between live parts and accessible non-current-carrying metal parts, including parts accessible only during
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18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice& T/ K* ~7 K7 G) f" t% J# K5 Z
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
6 n" m6 B2 @; u" d: V! I j! J1.414 times the AC potential denoted above." S. X! A+ l, }5 F* _& v
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
- M+ V& c7 |8 J7 @ j4 dtest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the5 X( {$ C9 G; T, d4 H& O& Z
ON position.7 S0 ^# C, M, P7 @/ R
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or( `' Y2 k5 U9 k; \. i
decorative parts not likely to become energized shall not be required to be in place.
, B- R/ P; {$ i3 \, m( @ A [( U18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can* U. W- Q+ p) i; g$ p; v5 ^" l$ b
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
! a' s, q! ]8 I, c4 m2 x; lrearranged for the purpose of the test to reduce the likelihood of solid state component damage while; ]) R+ E7 |6 Y) U; L
retaining the representative dielectric stress on the circuit.
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