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各位大神,
5 a( W& \7 j6 _7 [! Q 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)1 b! a- D" x Z7 K! F
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18.1 Dielectric voltage-withstand
3 H1 m1 p! q, J& p! f: x18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.. N; E- n, J* y- L$ L) O6 }
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied9 |$ ]# _, l6 K! \/ t4 D
between live parts and accessible non-current-carrying metal parts, including parts accessible only during4 P9 [- W" N" r9 a5 t. n
relamping.2 B. b7 q7 \* T% K( R2 }
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
4 `+ ^! }% x5 k3 [' uthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
. R$ }4 o' h8 c8 A4 v! a1.414 times the AC potential denoted above.
5 A h7 R/ }; M' N18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required! ~ F# h% F- X% {+ g7 W! j
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the
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18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or7 t# o( D0 M* E. G' f. f* r5 D
decorative parts not likely to become energized shall not be required to be in place.
, e8 k( n; w% h/ S; a18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
! p4 \! _7 ?- ` q* L$ @be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be* l5 x+ R1 H3 T3 H9 R4 X% d
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
2 V0 y$ D' M7 F$ dretaining the representative dielectric stress on the circuit.
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