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IEC (EN) 61347-2-3 - Year 20049 h7 u% l& L7 Q/ h4 J& R
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GB-19510.4-2009
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Clause 17.1 0 |$ r! H4 g" L+ _# z3 q$ C# j2 G
; g% g6 ~- O7 w. j9 ^2 S l7 h2 s17 Behaviour of the ballast at end of lamp life; O' h, \$ {, L4 w# t4 w. D
! I" `9 A8 L# ^# v" K17.1 End of lamp life effects ( C/ d- [8 D( `% ?, X: L6 v( A
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At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.
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For the test simulating end of lamp life effects, three tests are described:
( g6 }% m& I* R3 L1 c' qa) asymmetric pulse test (described in 17.2);: K7 L. P' z3 m _1 X
b) asymmetric power dissipation test (described in 17.3);
! Z6 i e. ]/ I- a6 l4 Cc) open filament test (described in 17.4).
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- E- L4 ~9 | n7 D7 E( @Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.' _, a5 h7 X) z9 f
- C- C8 X5 r2 A( d" }- k7 w NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.0 t% I9 y2 \' D/ Q; j; N
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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