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IEC (EN) 61347-2-3 - Year 20042 |2 m e( e! x' B" i
4 N! p" G( e5 v& @5 t7 EGB-19510.4-2009: s& h7 n2 J8 ]6 @5 e* p
http://www.angui.org/read.php?tid-65084-keyword-19510.html
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Clause 17.1 . q( K3 c7 N+ M; D' ^ G
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17 Behaviour of the ballast at end of lamp life
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0 F; a! ~0 ?1 G8 b* o$ ]1 h: ^17.1 End of lamp life effects
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At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.
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# A- f' y. ?- |8 O! t% Y4 g For the test simulating end of lamp life effects, three tests are described:
1 {$ f( H: E7 la) asymmetric pulse test (described in 17.2);
% K k$ R2 w( e* f2 @) c- E6 Ob) asymmetric power dissipation test (described in 17.3);
; p7 W$ {" e$ e7 G, @c) open filament test (described in 17.4). 6 m$ y7 C- f/ d2 }# f# s+ c, V
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Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
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NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.. W* M% E& X6 N6 g0 e
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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