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由于我的标准上有公司名字，就不直接贴上了，差异部分如下8 B' A- G! N0 ?
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Page 9, i) d3 _& n9 m0 e- X6 F/ e
1 Scope and object
' W7 ]6 I! z7 J1 A4 t8 l' f. d2 RReplace the title of this clause by “Scope”
9 t8 F( b. ?: b* m. P8 W5 I1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.' z z* K! }' K# N- t
Page 11
8 j! J8 r, |9 D9 v9 z2 Normative references
2 }8 n* A( k% _! ]1 c, b: D; G4 VReplace the text by the following:
, _$ h# ?; I- R3 H2 O) k5 bThe following referenced documents are indispensable for the application of this document.
* p' y2 ]: \1 N0 ~* @8 q) S$ X& uFor dated references, only the edition cited applies. For undated references, the latest edition
* f6 V1 \6 A7 s/ i1 b4 m4 F3 i7 Aof the referenced document (including any amendments) applies.
' Y+ Z: D; G7 v9 lIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:8 ^6 |4 o0 A3 T* T) H1 w( C) }- Y; Q
Electromagnetic compatibility0 v: x1 a% v* n$ a0 n
7 _% x# S" I. P; z, X9 o- X2 _' G$ e) r" j) U1 {
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –6 O; r! a" v/ K7 k- {# s- ^3 }
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and* c( ^9 [! S* l, P) _
measurement techniques – Electrostatic discharge immunity test* p1 Q0 @( @ Y0 `/ {; n
Amendment 1:1998
* D+ S5 g. e1 `3 UAmendment 2:20001
1 {9 M$ K3 X1 UIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and' v+ s0 f, A7 W3 F4 X
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
F) U \- [% J" y1 {- oAmendment 1:20072$ }6 n/ j$ B* {7 v0 d# y
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and& W4 |1 M, K5 e
measurement techniques – Electrical fast transient/burst immunity test* K# r0 S0 j+ H3 i* d0 \
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
* d5 _8 J7 J1 O0 t G, }. q' I9 l. Lmeasurement techniques – Surge immunity test8 [9 e$ T/ _: ]
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and: g0 ^" I: a, S6 I8 x5 j5 h
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
( s. I" `+ ^1 ^; Y: {4 Cfields
9 P; h7 R" i/ T2 KAmendment 1:20047 W, E% L& p' A/ @! _$ v& I( g0 S
Amendment 2:20063
1 x9 @3 P2 e% [8 f$ wIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
% K5 w- }" X* d8 ymeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
! B# W1 V$ X7 f6 @3 N2 ECISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
0 T6 v7 n# U& a# `6 o% Qelectric tools and similar apparatus – Part 1: Emission6 T: H8 u; \8 U: j" U) F
Page 13
/ j3 Y4 G9 }) [/ |+ `3 Definitions
- V6 n4 ?3 O2 A1 _" YReplace the title of this clause by “Terms and definitions”.
9 ?& Q4 S q% r$ F1 S# O+ _' l, lReplace the first paragraph by the following:: W) A B7 t1 l$ V4 `
For the purposes of this document, the terms and definitions related to EMC and related! o. \3 d) _+ ^/ @# k+ V
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.$ e2 [8 c8 o$ o: h! m- c" W
Add the following new definition:4 R2 o/ Z; ?4 a: _4 B1 i3 H) H
3.189 D* z- M5 W }9 O
clock frequency; _: @& v' u7 w: D; o" R
fundamental frequency of any signal used in the device, excluding those which are solely
$ Q: h4 j+ ~# z* {. A" Z6 }2 G& dused inside integrated circuits (IC)
: g- A% [. w, I$ rNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits! F, g$ ^, P$ R6 L: O( G1 i
from lower clock oscillator frequencies outside the IC.
9 B+ v$ T2 U" {) _* ~___________; Y2 H O$ W6 K5 H4 i. {
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
9 w0 q. {' X2 J9 A4 G9 M% o2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.5 J* o `* @2 j9 t/ Q
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
& Y' w4 w- i3 I: I' [7 h
8 s3 a% @4 w/ f+ w; }( \( t3 d" d# d# y* F- X
– 4 – CISPR 14-2 Amend. 2 © IEC:2008+ |0 ~0 ~( ]! Q- n* S
Page 13
6 m/ l# ?+ ~3 V& W4 y4 Classification of apparatus
+ X, Y) X" c' c" l4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
' j4 W h( S4 L3 |/ gPage 159 T; \) P* s2 L1 x6 G0 n$ t
5 Tests* L! O* _1 m% `1 l& ?) j
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”. K) L+ q' Y6 P4 Z& G8 D
Page 21; e2 A# I2 O. p$ n
5.6 Surges$ F7 k9 c/ r1 G4 v/ y( G
Table 12 – Input a.c. power ports
2 r3 A/ x9 T( s4 |In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add3 {. H& A* A& O1 ~, C
"Line-to-Line with 2 Ω Impedance".
9 m% {- G( v+ [4 OAfter Table 12, add the following paragraph as a new second paragraph:3 V, ~1 h" I1 C2 j) \
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the- h! k4 q3 v5 m+ Y3 a3 M5 I
equipment under test, and the negative pulses are applied 270° relative to the phase angle of1 n4 S3 J( I. f. @
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those: ?$ v, `3 Y" k @$ X
given in Table 12 are not required.3 A2 z' w/ X2 D2 B
5.7 Voltage dips and interruptions" y9 R$ X8 D5 n2 G7 U' Q2 F
Table 13 – Input a.c. power ports
4 [& C- T! F8 H4 BReplace the existing Table 13 by the following new Table 13:3 h7 h3 M" k6 N5 g1 a
Table 13 – Input a.c. power ports* S2 ^2 e4 B& M4 E+ |) ?3 J7 T: @
Durations for voltage dips
9 m$ K4 @4 p$ u- F+ M% I4 h# T# eEnvironmental Test set-up
' y( H9 e- l1 |/ @1 kphenomena
v* I& H8 c4 S. O6 XTest level6 b: w o& \- O
in % UT
2 q! E( B, E& U) Q50 Hz 60 Hz
1 u$ m+ T; D$ T7 N( jVoltage dips
8 q( w" @& _# j( r4 lin % UT' n- ~6 J& ~# o: d7 X* j$ x- P' S
100
?8 T9 S. S4 c Y60
3 @: z( E) N6 N# ? q30
( h5 Z/ J% F; V$ ]$ V1 a0
* f2 h/ A+ p* I) o40) ]( s' q% Q2 b1 T8 t7 l8 u
70
/ `% R; c4 Y" ?9 v( Q( |' Y3 i# ]0,5 cycle- X5 m+ d% g/ P+ u
10 cycles0 ^6 P+ v% I: I& _# M; c; b
25 cycles
9 J$ K r% K+ S- Z0,5 cycle
9 d a+ a/ e/ g7 d" R; v* B12 cycles
! {! q! N$ X3 P9 X, v30 cycles7 Q4 K9 m4 x2 M
IEC 61000-4-11
3 v; h( z# g5 D/ G7 ]7 `- L6 t2 ?Voltage change shall
; Z2 [8 I8 M+ U3 E" t. `1 K4 Doccur at zero crossing) P# i6 z+ d( |. L' p9 f! G
UT is the rated voltage of the equipment under test.
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8 i; o& {- f7 f ?( C K- a' W: ~0 ?4 B% Q: z* ]. c6 r" c
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
' E) C$ D7 D: v- [* `; qPage 27
1 J3 A/ L1 j- [! c; Y; J8 Conditions during testing
* _3 _7 d+ X5 [& S, c( ^8 Z& P5 A1 @6 }8.1 Replace the first paragraph by the following paragraph:" @- M# D1 a0 t( h1 C4 {1 K, S
Unless otherwise specified, the tests shall be made while the apparatus is operated as
: b: u( A" s |. Y3 G* Cintended by the manufacturer, in the most susceptible operating mode consistent with normal4 ~! s2 }) F8 V& d
use.5 y: z& q: p7 J( q8 r- A9 {
8.4 Delete the second sentence., b! q1 l4 {+ F8 D2 C
8.7 Delete this subclause.
9 D8 S2 ~1 q7 D* T0 U0 f8.8 Renumber this subclause as 8.7
7 @2 U- C3 d" p/ B$ P1 h6 pPage 291 {3 {- {; e+ s3 J2 }
9 Assessment of conformity8 @' Y& x9 V& p D3 L/ _4 T% Y
9.2 Statistical evaluation8 n8 y, } ], R# K( ^
Replace the existing Note by the following:. [' @) t, j( a _
NOTE For general information on the statistical consideration in the determination EMC compliance, see
# W( {6 Z3 F4 P) F/ @. o, TCISPR/TR 16-4-3.
3 k& c) M% H! h7 V3 lPage 31
& Q O4 }, P9 r: a! H$ F10 Product documentation2 B" [# _0 ?6 B' K" H
Delete this clause.3 r: b# H7 f/ z* s8 s
Bibliography8 Z& E7 y5 x/ X) k3 ^
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference: i. h% W B7 l" V/ N: n% r
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
5 o3 T/ @8 z3 N x$ _* x) amethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in; `+ y2 }$ g% h- W
the determination of EMC compliance of mass-produced products (only available in English) |
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