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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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Page 9* B1 ]# `: @1 m8 i
1 Scope and object
& V5 Q! D3 S4 j" }Replace the title of this clause by “Scope” A9 L8 W+ s: i
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.+ @% |* R' W; E6 s6 Z
Page 11
3 ~ K! s9 a E- J: x% B3 s, J% z) g2 Normative references8 r0 d& f( k+ ~- p1 L
Replace the text by the following:* f' r/ @; p) P. o: \$ l+ {' E
The following referenced documents are indispensable for the application of this document.
+ T* g: j2 N# |* J7 m( T& mFor dated references, only the edition cited applies. For undated references, the latest edition
x. u6 g4 P, S; _, h; xof the referenced document (including any amendments) applies.! n2 R m% d7 z) O
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:- {0 t d( Y7 v9 J" z0 ]: j% v
Electromagnetic compatibility
! T( O4 ^! Z9 c: C: |; x! B/ _
0 _ F# j8 T1 ^; y6 |+ @+ @/ U) ~/ n2 L% C; H. ^' O7 K- X& d' \6 J5 W
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
9 S2 m' X T$ ~4 IIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
# D0 \# k8 w5 O7 o, Wmeasurement techniques – Electrostatic discharge immunity test
( u% t" y3 U" PAmendment 1:1998
$ a4 w% r3 y9 z4 _" aAmendment 2:20001$ f; _8 H R* N6 q, e1 E
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
; _% l/ S% g$ Vmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
" c( X* n$ i8 @( T: RAmendment 1:20072. H- I, L6 O: @3 f
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
* M A$ s( g, o/ ^7 X$ Nmeasurement techniques – Electrical fast transient/burst immunity test
0 x: u0 o) }, U5 a. rIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and& F! _' s( \% T# L$ R. G
measurement techniques – Surge immunity test! d) p* I: t# ]
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and2 U; w9 A. J% V+ h
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
1 U2 t* V6 H" A( z9 Ifields$ Z; S; c2 m$ I5 N3 w1 h& l8 G
Amendment 1:2004! k4 d j6 }$ m+ B: ]& U& Z
Amendment 2:20063
! W& n* A0 a k; M, N, wIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
k" i7 Y: D3 F1 _1 L# vmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
5 j0 s- a; _8 e, [( G$ c( ZCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
- H, f' p% q) M! h' }4 m. s# Telectric tools and similar apparatus – Part 1: Emission
$ Y+ {) ` Q9 i: k# @7 `$ G( Z( lPage 136 Q) i* a- R- o! `7 T% n* z
3 Definitions3 F+ G$ y* W- ]( @# f. c6 l! i$ |
Replace the title of this clause by “Terms and definitions”.
$ F4 F2 R( i, h. Z. oReplace the first paragraph by the following:
7 U+ `8 L- I2 W& K( ZFor the purposes of this document, the terms and definitions related to EMC and related# g0 d. d7 u2 b7 ^0 m8 P
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
2 ^8 S( r1 @% M: f0 v8 OAdd the following new definition:
4 X/ o' K! z; @& N5 ?% G3.185 b% T! A; y9 O% e2 ]% X
clock frequency
; W) d2 c7 Y \" gfundamental frequency of any signal used in the device, excluding those which are solely
* `6 P+ p+ D9 H8 V0 y$ rused inside integrated circuits (IC)
" b5 D$ o+ m3 ?/ b W, n/ Z% iNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits8 Q8 Z1 u, K; A9 Z) o$ t
from lower clock oscillator frequencies outside the IC.
* G9 Y2 v4 Q1 n" u0 T P. G7 P1 j+ `___________
6 F# T- ?9 Y" V0 U7 g1 A, R1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.6 r5 ^4 s8 e9 r1 A! b6 Z. D' \
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
. e! F: R s8 H9 y# ^" b; r3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.! [, r% e9 f" w5 ~( I7 t1 r
; p8 ?2 J3 n# D* l# @! J7 F
6 ^3 G1 r/ V- A2 {+ [: }: a– 4 – CISPR 14-2 Amend. 2 © IEC:2008
/ t, J1 g- r. o V* I5 k8 O0 O$ S0 ZPage 13' O& c# y) R$ p" ~1 r6 j
4 Classification of apparatus3 S! ]/ Z9 h2 _& V
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE. r9 E3 C9 U' N" D4 b, l
Page 15
2 @0 X1 P% p" ?! g6 l5 Tests
5 B8 p# e% ]& E" B) x" k! ~0 HThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.+ q) W$ G7 C. N' {3 ^
Page 21
, K; e! G: }# K9 P" ?# T5.6 Surges% F- P: C' k- m+ b/ q+ A. W+ |. g
Table 12 – Input a.c. power ports1 ]+ J) u: k' p7 ^+ R0 a$ j0 {4 f
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add$ M8 d9 J5 Z# U5 U, a' }' b8 z5 Y
"Line-to-Line with 2 Ω Impedance".
* E# u2 M* {8 J8 YAfter Table 12, add the following paragraph as a new second paragraph:
% s7 [; B) c/ M+ g( D5 [The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the, P/ e8 R' J& {
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
5 Y" m* Q' ]3 ~ W/ v& m ythe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
8 p7 [" Q% P% H! X4 u9 w. Kgiven in Table 12 are not required.* V" e6 ]$ r0 V, `. B! w( _
5.7 Voltage dips and interruptions: Z7 q3 D' f& I* B4 g( U% m
Table 13 – Input a.c. power ports+ e/ j: p; M4 ~" F
Replace the existing Table 13 by the following new Table 13:1 e" f' R, y4 G. O3 T
Table 13 – Input a.c. power ports
* |( {3 D3 G3 r1 C2 ?& EDurations for voltage dips k- n5 g; [, W! M2 Q* g( E/ C
Environmental Test set-up
$ ^6 Z) l. [" ^- |8 y* x0 ]3 Lphenomena
& t# q! S' t5 U! xTest level
# u) ]! q7 D3 W5 C+ M% Fin % UT
, Z" `+ N- p: _( P# L Z- G50 Hz 60 Hz" _7 q$ y& i/ f1 v ?: H
Voltage dips
9 i; v2 ^" N( D7 jin % UT, b1 }% j+ K! Z; x
100
; y2 Z% ?; E* A: T7 f1 R! `60
& ]; f6 E9 u& I. P9 `) W% _3 M3 B30! I Z6 t, |. h- \/ X
0; [ s' w9 o/ t' T9 J
40
# k% a, r& \ G1 [1 p70
' l0 N4 a7 D/ X( y }! Y0,5 cycle
9 L! E3 T' P Y: G8 p# E$ ]10 cycles
$ j$ j- [- a3 b6 a' v/ |. ?" p! ^2 N25 cycles
6 D [: s# S# y$ q W8 D0,5 cycle" y$ X2 @- d) a! I/ r
12 cycles
0 A2 J0 f2 Q' L30 cycles, q( X2 K: b8 ^& l8 U
IEC 61000-4-11
3 n4 a# _; S0 ~0 S8 I2 N1 u" T" gVoltage change shall
5 s- y3 B* z5 T7 b1 b! xoccur at zero crossing& q& {* O5 Z2 {! L D, Y
UT is the rated voltage of the equipment under test.2 R$ i( x/ E$ p: z6 ^" t, O
8 U. ^- W0 k$ w9 _
5 r+ o0 F0 b" `8 ~* L" Y4 \
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –& Z- q O1 S0 l
Page 27 ^6 W7 q' q0 _; P( C5 }
8 Conditions during testing
% K, T- j" R' A* T+ P- v8.1 Replace the first paragraph by the following paragraph:
, b* N$ V+ L, H2 t7 f4 N, W2 AUnless otherwise specified, the tests shall be made while the apparatus is operated as
! p" l6 Q, z2 U' B" C% ]intended by the manufacturer, in the most susceptible operating mode consistent with normal8 f4 P5 `7 n) S7 U. X
use.
4 i# }: b+ c# U ]) W3 A1 ^' a8.4 Delete the second sentence.4 a4 ]) _ ^& @' y2 N* X8 ^
8.7 Delete this subclause.6 E' M: h! X0 n5 T# d3 ]6 L8 {
8.8 Renumber this subclause as 8.7
4 x2 V s. A6 i% q# dPage 29
& d7 |8 o+ ?) h" }7 f) Z9 Assessment of conformity
7 r5 v5 O; g; r, s4 ?9.2 Statistical evaluation" b' H0 j! i( t2 s
Replace the existing Note by the following:
; X- {$ p8 r. I& n Y4 G& q3 zNOTE For general information on the statistical consideration in the determination EMC compliance, see* ~- Q1 ?9 X7 p9 N
CISPR/TR 16-4-3.
& }* z: D( Q3 {5 E; KPage 31
; M- e" Y# x8 [' O6 j10 Product documentation
' O6 f9 P& H, g* ~! O+ \Delete this clause.
1 T* p1 G. g4 B) Z( _; {Bibliography$ z% K4 @; i* d9 ^
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
0 l/ `. h5 Z+ M( O, o6 [CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and: w" N! ~0 P, q' \$ G
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
6 n0 t6 T) m" ~5 Q, k; ~$ gthe determination of EMC compliance of mass-produced products (only available in English) |
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