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由于我的标准上有公司名字，就不直接贴上了，差异部分如下2 u* [& n7 v, O- F& S: x
5 a; E2 i- W) a2 E. w: d3 z
Page 9( @/ D& [. l1 E
1 Scope and object
9 j% Y( ~% s8 O# F! \2 g8 iReplace the title of this clause by “Scope”
9 v( }* H$ E7 z; j& Q, d0 h" \+ C1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.7 D* J1 e6 U, I7 Q2 ^1 F U1 J! i
Page 11
1 T P' R# i# R& M* F. B7 ]3 w! u2 Normative references6 j. y5 e0 `# F0 |( f) @% i4 P% M; a
Replace the text by the following:
p! Y$ ^1 {& m" w5 T4 r# BThe following referenced documents are indispensable for the application of this document.
9 h* x# W5 Y0 u$ [, ?For dated references, only the edition cited applies. For undated references, the latest edition5 D; c$ x7 T# U$ y* U* g
of the referenced document (including any amendments) applies.9 A/ J5 y- o5 s8 D2 s4 @
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:+ h& c0 W( G( U7 j2 \4 r' ?8 H* {
Electromagnetic compatibility `4 C) ]. W o M5 P
( i/ W- \8 b3 Z- t
- n3 ~% o% U% Z) _, K' H/ {' DCISPR 14-2 Amend. 2 © IEC:2008 – 3 –; L" i. [3 n8 h$ ?+ {& E" O# O2 m4 }
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
' i: \5 W8 z- zmeasurement techniques – Electrostatic discharge immunity test0 o- m7 F, r3 O
Amendment 1:1998
, l: O# E5 c C0 | Y& ^' t, NAmendment 2:200017 h, T9 M# ]5 Q& [
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
: \# B# e3 a4 G9 \measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
1 t K! | v- N2 y7 A$ Q$ VAmendment 1:20072
, u' `# E) H% ^+ x: g/ sIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
& m2 s& }7 {4 Ymeasurement techniques – Electrical fast transient/burst immunity test1 F: U% Y. T5 ~7 M' M4 m$ \! D. i9 e0 m
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
% A' n3 v, a( ]# Z2 Bmeasurement techniques – Surge immunity test5 p& E3 P% |- t' `( g
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
% L3 ?$ b' e, {4 w/ F5 [measurement techniques – Immunity to conducted disturbances, induced by radio-frequency" R3 T F2 h a' y( E
fields) r# p$ W: n+ I( i
Amendment 1:2004
% w, i% [7 e& P& _! u% {$ ?) zAmendment 2:20063 x$ r: i/ ^, W8 P
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
" \7 n* y2 S: {measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests1 `) {* M) T w7 B! n9 v( W
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,4 E" E0 p) c6 i! d+ X
electric tools and similar apparatus – Part 1: Emission
8 |7 B) I6 R" _+ k k4 ePage 138 \$ I$ w; j8 b9 q. k
3 Definitions
! |" I, Z: d& Y# D) o0 _5 x; ~Replace the title of this clause by “Terms and definitions”.+ n k2 M5 `5 ?7 Z; G
Replace the first paragraph by the following:0 j6 l/ N/ l, }& T+ d; Q6 a+ S
For the purposes of this document, the terms and definitions related to EMC and related; M% F B7 X/ [5 f. h" G+ |
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.8 ~0 x% G+ m2 ]9 s% T- c3 ]
Add the following new definition:& _2 k: ]' ?8 i% Y. z
3.18+ ?+ j4 @8 ^+ f2 N
clock frequency! W9 i. F' o1 R9 p' u
fundamental frequency of any signal used in the device, excluding those which are solely) }) T6 J# G* ]: s' O2 `- w
used inside integrated circuits (IC)
; f! f( P8 l) S: NNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
: F. F! ^6 v1 Z& h4 Jfrom lower clock oscillator frequencies outside the IC.8 `9 ^: q: i3 D/ I Y" k" Q: X
___________
/ A$ { X2 N- |5 t1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.3 L( d# g; z$ W. E: q6 r, S( o9 g3 z
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.! |+ b- E8 ]! J/ m
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.) n1 j- c, W% K
0 l7 w3 \; [3 @& Y! S% O+ J
4 Z$ u) Y2 K8 j. @– 4 – CISPR 14-2 Amend. 2 © IEC:2008
8 ~$ J, ]. U5 P7 H2 Z4 KPage 13) W7 W8 E% ^' ?" W
4 Classification of apparatus
; F! |* a7 I& c. f, S3 x4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
- i2 |; g D$ i! C- y6 jPage 15% z5 p N0 D( q, Q' Y) }7 F
5 Tests1 Z5 O7 U+ p, j _
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.: u3 S0 |3 g3 O5 T0 v2 n
Page 21; H6 h% N5 V% B" @" O! \) j- ?
5.6 Surges
% r7 w6 l) B, L0 WTable 12 – Input a.c. power ports' _& M6 w- v4 F9 ?+ x
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add0 [/ S; c1 r- L$ V- W
"Line-to-Line with 2 Ω Impedance".' M; e, r% u- \. H
After Table 12, add the following paragraph as a new second paragraph:
& `: \: s0 i: F# p( H: Y, o' VThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the1 H8 ]! Z( q/ S8 }6 ~
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
& W" {# N2 A& V2 k% nthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those( m9 H0 A+ f4 t2 |4 Y7 a( @
given in Table 12 are not required.
1 k5 m+ M1 A+ I- q, F i" j5.7 Voltage dips and interruptions0 i8 a8 @# B9 f9 j. R
Table 13 – Input a.c. power ports. v. b3 p* n0 e
Replace the existing Table 13 by the following new Table 13:7 f6 D! ]5 j; R4 J7 l
Table 13 – Input a.c. power ports9 h# Y+ y( P) N
Durations for voltage dips
; U0 B& n$ B$ F6 F* M1 }Environmental Test set-up
% y2 {7 r2 \2 G; d$ L! lphenomena
% i( j! K1 U* x# H9 `6 J9 nTest level
3 _( L; F6 }" S' iin % UT
6 [# a# q. A" t9 F* ?+ h50 Hz 60 Hz
: n5 A- q4 }: rVoltage dips
0 u0 L0 E! {! a* p: ^1 K: ^! Yin % UT
) ~4 b, ]0 E! D+ {% c! {100
1 X2 G2 \ W& v6 v: g; Y3 I2 b" B601 A9 p) D, I- ^+ [3 @/ X0 B
30# [8 i( q2 ]$ H3 j7 t7 _
06 u0 u( Z; f2 D7 m, h6 b) j
40
4 P6 M- w8 `3 p6 K9 o/ H70
4 d2 Z& E, f1 m( {0,5 cycle
# a' z9 {/ \# K) P( g10 cycles
) E( e/ {2 B/ e& I2 ^, q2 o& K25 cycles
" P0 }& W7 s. O: O6 v; f) ?9 D& e0,5 cycle4 k, W/ s( Q$ v! d1 q* o) f
12 cycles
% E4 [- q/ V( L) N$ v30 cycles/ e6 C2 \) y8 n: Q
IEC 61000-4-11
5 v" t6 @, ]$ z$ GVoltage change shall% z+ z; M: a+ [3 U6 O/ b
occur at zero crossing
8 l2 r; o, ^+ F* v LUT is the rated voltage of the equipment under test.
9 m+ E) v# S* k6 {/ M1 p! y: d9 D
6 I- W8 C1 N, p$ E
/ Q9 w1 J6 D; m' S6 jCISPR 14-2 Amend. 2 © IEC:2008 – 5 –6 m- Q# y7 _6 [7 \: n- [% j+ v
Page 27
$ P! E0 L7 S/ F8 Conditions during testing
8 B/ `+ a% L0 M' ]2 D! j$ h8.1 Replace the first paragraph by the following paragraph:. ?5 X; a4 c5 y `7 B/ U) S
Unless otherwise specified, the tests shall be made while the apparatus is operated as
3 \/ m$ B4 i8 F! ^/ I# P Wintended by the manufacturer, in the most susceptible operating mode consistent with normal
: i# K5 ^ ^! @4 G( U0 d3 D# quse.. i, |! t% j$ e7 G
8.4 Delete the second sentence.
) L( W- n4 [9 M0 y1 J; n6 E0 k, R, x* J# q8.7 Delete this subclause.0 T. t3 F n1 X1 q
8.8 Renumber this subclause as 8.7
9 Z5 v( w# T# f: mPage 29" G7 f t) i" x, ]3 p7 A. `2 Z4 D. G% l
9 Assessment of conformity
( m! H; y4 ^4 \5 S* I7 k9.2 Statistical evaluation
( p) r: E% A( r6 f* U, Y7 P" i$ T' aReplace the existing Note by the following:7 N: Z0 o9 u5 r: g2 ~
NOTE For general information on the statistical consideration in the determination EMC compliance, see! }$ n) F, _3 J$ u! b
CISPR/TR 16-4-3.
0 q k) l' j6 c" \' _. F, \% ?: B( uPage 31
6 a! |+ O7 [8 W4 F6 s2 Y10 Product documentation3 Y, {2 O% `. T( Y9 n
Delete this clause.
# x& m1 w0 C7 Z$ P* C: WBibliography- d& J2 P% n7 E2 J! ~
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:# |7 Y/ I) y# z+ v& Z
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and. N! a& }0 h0 K) f
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
3 L2 L' P$ X; Z' ~0 J- o$ _* sthe determination of EMC compliance of mass-produced products (only available in English) |
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