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本帖最后由 chinatown 于 2017-1-7 11:25 编辑 . u& `, J& |+ ^$ N2 c2 M; Y
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Question9 ~ f9 a; O! H& {
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC9 s; z/ {) r1 H/ I, x
60831-1 for shunt power capacitors?
3 F5 b: u" b7 `Decision
. K; F* J6 v0 f. gFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
7 U6 B3 p. Q! @& P: P6 s5 ^type test schedule shall be applied:
) \/ s1 Q7 R3 n. G' S; yType test schedule:
3 _6 e1 q* _- bTests Subclause Number of samples to be inspected) [% w3 k% _; C% e# u2 n+ `3 g p
Single-phase
' T& c/ \0 H5 m# O5 ~! X: n, Aunits# |+ V4 ?% [, v$ E( e
Three-phase units( O3 J- l( v7 Z& L
≤ 10 kvar > 10 kvar* [0 Y) k1 U6 q9 U3 E# G# |
Thermal stability test 13 1 1 1
( ^/ O% ]: W: m9 C' Y9 XMeasurement of the tangent of the loss angle (tan δ)
* T6 P+ ~1 s8 I7 m* \of the capacitor at elevated temperature
1 {+ t) J: C7 H( w) D* o9 K14 1 1 19 d2 h! S6 k, s C5 I! E- U% Z- ?6 n% o
Voltage test between terminals 9.2 5 5 3# l* |5 @; m4 V4 L
Voltage test between terminals and container 10.2 5 5 3
( R5 u. M4 g" VLightning impulse voltage test between terminals and
6 d/ J" `: J- D2 K1 _; A5 econtainer* K& E( i$ `6 F% ?* M/ D7 {& v
15 5 5 3
" }% s. X# L4 k' uDischarge test 16 3 3 3
1 N5 E# ~ p. T4 ]0 {Ageing test 17 5 3 28 H) ?6 m( U* |
Self-healing test 18 5 3 36 M, q' ^5 S' C5 S
Destruction test 19 5 3 2
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发表于 2017-1-7 11:22
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