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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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+ E ]# D* r# J) EQuestion
4 f0 D1 R! V' W( Z7 X3 z3 jHow many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
1 u+ ?! b) Y) N! ]+ b2 q7 v60831-1 for shunt power capacitors?/ h+ E. h2 u' ~" }$ f! [
Decision( B: O% y+ |/ y, N3 w
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
* G; j7 [: t& |. N/ Ztype test schedule shall be applied:( n/ m+ d, @: c; m' z7 s6 ~
Type test schedule:
1 ]0 m% j) q+ n0 r' cTests Subclause Number of samples to be inspected9 g9 x+ I( D0 T( e2 Z6 N3 N
Single-phase
: m) k8 A9 S7 g% runits3 Q! Y8 a6 a9 ]7 M( T
Three-phase units2 j, l3 F* D- D- I/ y a) x
≤ 10 kvar > 10 kvar
% r( i/ p- E# qThermal stability test 13 1 1 1
* ~( H1 _9 v% E$ Z* rMeasurement of the tangent of the loss angle (tan δ)* `+ \% X3 S# c( B& w
of the capacitor at elevated temperature4 z( f% N( ^- i3 }- l6 m: z3 @- o3 I
14 1 1 1
: o- r, t- J |9 q7 j. d2 ]Voltage test between terminals 9.2 5 5 38 Q4 N$ S/ [- L
Voltage test between terminals and container 10.2 5 5 3) L; D, J$ m! Z9 g+ ~0 ?0 ~
Lightning impulse voltage test between terminals and
/ Y( ~' ?5 \$ q# |. [: b7 M# Gcontainer
4 T, e4 Y3 Y4 ~* y15 5 5 31 ?& C5 D) ]0 u& y
Discharge test 16 3 3 3
' y; E& @/ K) \9 N A/ _* `Ageing test 17 5 3 2
. {4 c* E- K8 R) X+ H) _) j1 jSelf-healing test 18 5 3 38 N) C0 |4 o A3 A+ W
Destruction test 19 5 3 2/ R' p5 I; l5 ?; g p+ x/ b
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发表于 2017-1-7 11:22
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