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本帖最后由 chinatown 于 2017-1-7 11:25 编辑 # U% v8 ]3 \, ^) p* ~
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Question, q& @$ `; v: _
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
1 X: T/ o, p5 ^6 o2 g8 h( z0 `60831-1 for shunt power capacitors?
" A, k% g! ]1 }1 J4 F8 @Decision
+ N1 ]( p, W! q( O0 I" g& I, bFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following' V# H9 @& Y$ c- K( c
type test schedule shall be applied:
6 ~/ N7 R8 l3 o" f* m0 vType test schedule:' r, }# z+ j) Y4 T9 U+ T
Tests Subclause Number of samples to be inspected
# W+ ]) @* Q5 B: j+ jSingle-phase
4 a3 w: z1 n- A2 b2 {4 S( L* ]: munits
( n5 x! d0 V. Q, LThree-phase units/ \2 C/ [( s; i9 B2 x
≤ 10 kvar > 10 kvar
4 s2 ~! x+ v: D% R1 F3 S6 B. s% AThermal stability test 13 1 1 1
4 O2 Q" |) ?; E& r: N; gMeasurement of the tangent of the loss angle (tan δ)
# ^7 a2 o% {' B. Q" f; zof the capacitor at elevated temperature3 B1 i; B) f' [6 z% O9 A& z1 R# [
14 1 1 1/ B" M8 q2 p# g$ j0 p% @
Voltage test between terminals 9.2 5 5 32 H" ^$ A# f2 l" ^& s
Voltage test between terminals and container 10.2 5 5 3/ k! v4 x4 M8 U! ?! ?6 i
Lightning impulse voltage test between terminals and
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15 5 5 3
' E7 d6 S# B. ^% z4 g7 ?5 G, l; }3 aDischarge test 16 3 3 33 D2 P* a) I6 |" i! A% t
Ageing test 17 5 3 2- X P$ l3 C0 G1 t& O* U
Self-healing test 18 5 3 38 U9 A& x+ q& s( m
Destruction test 19 5 3 2% ?: `9 @# n% r% f
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发表于 2017-1-7 11:22
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