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Question
" B9 }: t) y) P6 _: Q# ?In which way shall the temperature rise test be carried out on a device composed of two or more
3 w7 C- ]# ], x1 v) uswitches, having the same or different pattern number mounted on a common body?
) l& }9 L( a% PThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
; t: y( w B7 e! n3 gin different ways in clause 17.1.
! {9 w( f# E3 a2 C; MDecision
+ L* H5 m7 O* U* t+ l; zThe temperature rise test shall be performed separately on each individual switch on condition that it
7 Q7 H) y1 r. G6 u) V4 [is a single-phase switch.7 f0 b* n% d4 b3 Y, W( b4 C. [; s& @
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+ a% [. K( _/ z) s3 \* M3 E7 g7 l: W- A$ I) v. {
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