|
|
|  DSH 7316 T0 V1 f+ u: B N/ b5 F! J
1 G1 w, U, ~# `; b$ X
| Ambient temperature on tripping tests
* y! c9 g" R5 \& `/ j9 H2 E' G | 9.9.2.3; ?0 g$ p2 t1 Z$ [0 }- `4 W
| 61009-1(ed.2);am1;am2
8 ~4 v& q( l8 @' r |
9 f1 q9 H: p6 x6 r) s4 o# p. h: @Standard(s)- No. Year
0 b# s- [2 H; e& ?IEC 61009-1:2006-06, Ed. 2.23 y5 q+ K0 s" c" q1 D! C2 G, i4 @
DSH 0731 20090 _) W; I g! {
Category: POW, PROT
/ a, P: m( ^, R8 XSubclause(s): 9.9.2.3" J8 u B: t6 Q5 p1 a1 e- h
Developed by: CTL-ETF7
- r8 z# f6 T0 J+ Q0 LSubject: Ambient temperature on tripping tests5 F# L1 p3 H9 y6 r1 i8 R
Key words:
" p4 k- E; r5 I& s9 R. {% HAmbient temperature2 n& M: s4 u4 s7 U* Y( a
Tripping characteristic
2 J; k* v% r3 m2 \! |# rDecision approved at the 2009 CTL Plenary Meeting
2 i; t* n3 m6 MQuestion:
8 j( o# Y% m3 ~( m D9 sIn item a) of clause 9.9.2.3, is it correct to perform tripping tests in an ambient
3 G u; y( n: }temperature of 35 °C ± 2 °C above the ambient air reference temperature?; N3 w4 r( o- i/ m6 N- n
Decision:' ^- l3 \* B* P( p/ N- {
No, the word “above” shall be replaced by “below” in the sentences of item a) of clause
0 I% D: k; B3 U- P6 s7 x: h; Y, [9.9.2.3 to perform tripping tests in -5 °C.0 q, I+ J8 u6 j2 [7 z
+ h6 B. {8 M! ]5 o/ w7 E/ s J0 ?
& J, y: f5 b, j0 [; K( r |
本帖子中包含更多资源
您需要 登录 才可以下载或查看，没有账号？注册安规
x
|
/1 
|关于安规|小黑屋|安规QQ群|Archiver|手机版|安规网
( 粤ICP13023453-10 ) 
窥视卡
雷达卡
发表于 2012-11-7 19:11
提升卡
置顶卡
沉默卡
喧嚣卡
变色卡
抢沙发
千斤顶
显身卡