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[POW] DSH 659 Problem of setting a current applied to ACB of high current rating in in

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发表于 2012-11-7 18:18 | 只看该作者 回帖奖励 |倒序浏览 |阅读模式
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DSH 659
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Problem of setting a current applied to ACB of high current rating in instantaneous tripping% s1 v+ I# o+ C9 m- s
8.3.3.1.24 ]7 k* e4 d5 H. G# D. n. X7 n
60947-2(ed.4)! C3 `6 y0 T% i* b" v

2 O: C2 \) }/ D7 f" S: ]) ?Standard-( q% q. ^! v1 Q3 t
IEC 60947-2 (2006-04, 4th Ed.)9 h2 \0 {8 @6 g' X/ V1 T% d, o1 U$ r, }
Sub clause(s):
3 e3 K+ L5 x9 Q- a8.3.3.1.28 M5 M/ R6 S! n0 w& b+ F. P! f
Sheet:
# ?  |' D1 R. L$ ]DSH 659& K8 |0 h, x. J
Subject:
3 R$ p! N; g7 N. k7 s+ uProblem of setting a current applied to ACB of* y6 N) U) m/ i  d
high current rating for instantaneous tripping.5 c- X4 [- h) k6 ?/ O) z( z  T& }
Key words:
9 Y* E+ j( R' ~* M* _9 ^; ATrip limits &9 C- s! u! S1 _; r
characteristics
& R  `. {: `. p) [Approved at. V; X6 v* T/ Z' n& X- M
the 45th CTL/ u* c# c) C5 c" u  [9 Q
Plenary
3 U% c. A7 n/ Z" gMeeting in
/ @5 l' C7 X) q0 B6 s3 ePrague in 2008
6 ^/ Q: i7 X8 d' g3 y1 L1 PQuestion:, D# q" d2 a. _: {9 w
According to 8.3.3.1.2, when the over-current opening release is a built-in part of the
8 u7 i- ?% N% Mcircuit breaker, it shall normally be verified inside the corresponding circuit breaker.
9 L- ?& c# {/ @) k, @For example, in case an air circuit-breaker (ACB) has a rating of 6300 A with an7 q3 |5 [! Q( C3 m
instantaneous trip release up to 16 In, do we have to apply 80640 A (16 In x 80 %)# r% @* I: b' g  s
and 120960 A (16 In x 120 %) to the main circuit of ACB by use of a high power  b% ]; V( c0 P1 V$ s6 I+ o
testing facility when performing the trip test of SEQ. I?2 C! N( Q9 \; R; {2 p# Q
Rationale:7 o6 w; f+ ^/ b
It is not so easy to conduct the instantaneous trip test using the high currents) g3 {3 z4 n5 h9 k3 t
mentioned above, because to do so a high power testing facility is required. In/ o" R. @/ m, H& o
addition ACBs often have several ratings, which are determined by the specification
7 C: u" A  e9 ^- v$ Z% {of the CT in combination with the trip unit, and the trip unit is usually the same for all
! s/ X' c; q! L1 ]2 ]9 x5 k0 ]) D7 Omodels.- j1 q/ {9 g% e/ n" B  P6 [
So some accredited testing laboratories have performed this test by applying the5 b& g* }2 m  i" O5 e
secondary current of CT (normally 5 A) to the input of an overcurrent release. This& }5 E$ o$ y$ p, _$ j. p
release is connected to operating mechanism of contacts to check the mechanical
" O2 p) c3 N) z) ~/ i& b( s$ kopening of an ACB. But by use of this method, we bypass possible problems such
0 a' t3 ?! H4 w/ I/ o. oas CT saturation, thermal and EMC influence on ACB, especially on single-pole
% y7 m; j9 a$ \" C$ Yconnection.
: F1 [3 f) v2 ~: |& Z, IDecision:6 f# C9 ^5 t$ L% M( Z! w; P: B4 E1 L
The secondary current of the CT (reduced current, 5 A, for example) may be used, q  n* C8 ~: G* F; N1 M, I0 }
for trip tests of ACBs integrated with electronic OCR for all ratings of In, but only for, e3 _. Y9 K+ B' [9 K
sub-clause 8.3.3.1.2 of SEQ I.% e- e' n' r2 u7 F5 D" R5 p% x
But in addition, followings items shall be verified to fully cover the safety aspects of7 g  `3 \  E' p5 d% a' c2 c; m
the standard:
  `) s3 L/ z- B0 H9 \/ u/ ]% h; o1. The conformity of the performance (at least turn ratio and composite error)- N  f2 C8 m6 z+ m5 V1 D4 q
of the CT or Rogowski coil, if any, shall be verified by specifications, test- w8 n4 T" G5 X1 Q4 F
reports or certificates. All CTs of the circuit-breakers of the given frame
- M2 g8 X) U1 T  _& u' b6 wsize have to show the same performance characteristic.
) u: Z; d; `! m8 d4 t* f% l2. The single pole short-circuit test with a current equal to 80 % of the" Q7 T' r& ^- \: G! o) p
maximum current setting of the instantaneous release and equal to 120 %, C; |' _& Z: j6 w6 m7 D+ I: e
of the maximum current setting of the instantaneous release shall be
- U* X2 h; K+ y, A' F5 A, Yperformed at any convenient voltage with the current in the main poles of! E2 d. z, I/ E* {( B- O6 h) _
the circuit-breaker. The other tests required by the standard may be8 h& Q) y7 a4 W+ w' f
conducted by use of a simulated input signal to the tripping unit.
2 _, y. H/ f- C' T  E0 A1 T3 ]7 `) A
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