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[POW] DSH 659 Problem of setting a current applied to ACB of high current rating in in

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发表于 2012-11-7 18:18 | 显示全部楼层 |阅读模式
广东安规检测
有限公司提供:
DSH 659
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Problem of setting a current applied to ACB of high current rating in instantaneous tripping* T- I& }$ D, F7 ^
8.3.3.1.21 d& ?5 q8 \6 g( X5 ?
60947-2(ed.4)
5 c5 I2 n7 F: `" q/ ~2 \/ [) Q
( Q; ~# j  a% q& {% p; S
Standard-: Z% M2 r& ^$ ^  v6 R$ q. k0 i
IEC 60947-2 (2006-04, 4th Ed.)& T1 Y) R2 s5 W) k" F9 i4 h
Sub clause(s):
" [1 v, L$ a, {/ l* x. ]8.3.3.1.2
5 s7 U0 A" ]# z) B* GSheet:( j, g. k, T4 b) f  T7 o8 ?
DSH 659! `' O4 |# e) G% u; h
Subject:7 x) ~, m- l0 F# i
Problem of setting a current applied to ACB of9 O7 j; I+ O8 J6 M: n
high current rating for instantaneous tripping.
# v# B* I& s. U7 [! KKey words:
# {* [# K0 x; Z, ETrip limits &: J1 _1 K) u8 |
characteristics
" u' Q9 d# R: e9 j. `' [: F$ sApproved at
, j& y" m/ J* x& e* h" l/ f$ P# ~the 45th CTL
( T% g/ P8 \  G- B. sPlenary5 n/ Z4 u" w. q% Q' ~. `# e$ q
Meeting in
, P- c$ f& P, ^$ q! `) IPrague in 20086 w' r- I# K( J4 y" g* O9 M
Question:) w& ^6 a8 x5 e+ D- J) Q4 |
According to 8.3.3.1.2, when the over-current opening release is a built-in part of the8 \( }$ X# ]/ r( T" M3 {, v+ X  K
circuit breaker, it shall normally be verified inside the corresponding circuit breaker.
, j$ S- ^( }  ^/ h+ j% QFor example, in case an air circuit-breaker (ACB) has a rating of 6300 A with an% [8 B2 |  f9 y" Y+ {  H; Y
instantaneous trip release up to 16 In, do we have to apply 80640 A (16 In x 80 %)2 x- X- g' o  l3 E
and 120960 A (16 In x 120 %) to the main circuit of ACB by use of a high power
5 S9 \" ?( j+ ^testing facility when performing the trip test of SEQ. I?+ b; h/ A  s% a8 C, h/ t
Rationale:
+ a7 z* i" D( ]2 `7 y* l0 O( iIt is not so easy to conduct the instantaneous trip test using the high currents
; i  f) K0 q" x% P2 ?( v( y/ Imentioned above, because to do so a high power testing facility is required. In$ t) |0 W6 E+ k3 W' c
addition ACBs often have several ratings, which are determined by the specification
0 ]: S. h& Y0 D9 r$ u' tof the CT in combination with the trip unit, and the trip unit is usually the same for all1 b; u0 Q( z( n9 s
models.
) N" y( n& \* Z6 KSo some accredited testing laboratories have performed this test by applying the
0 T/ Z4 E2 X5 C3 @: p7 d7 Xsecondary current of CT (normally 5 A) to the input of an overcurrent release. This: u2 b+ k" S/ j
release is connected to operating mechanism of contacts to check the mechanical0 n$ f( N9 d+ x8 u* S/ u
opening of an ACB. But by use of this method, we bypass possible problems such
2 R1 m9 Z; P6 T  r  o: |as CT saturation, thermal and EMC influence on ACB, especially on single-pole& G+ H, Y/ V! v6 r0 [
connection.
4 n9 Q: X" d2 W& c* ]- @. ^+ t9 bDecision:! T' t4 D+ g% I& d& L6 b* \
The secondary current of the CT (reduced current, 5 A, for example) may be used$ V$ D6 S4 f) n! c- \# Q* F
for trip tests of ACBs integrated with electronic OCR for all ratings of In, but only for
* @3 U4 D  Q, s" `1 `+ _/ Y" msub-clause 8.3.3.1.2 of SEQ I.
+ }" H( x6 e% N' F% IBut in addition, followings items shall be verified to fully cover the safety aspects of
5 l4 M. v7 r) \* e% fthe standard:' ~4 B0 J% ]/ V3 y! D* |5 E
1. The conformity of the performance (at least turn ratio and composite error)
0 D7 [* [3 [% \: A. zof the CT or Rogowski coil, if any, shall be verified by specifications, test
* u8 z* G& I" z# v( G1 h7 ?reports or certificates. All CTs of the circuit-breakers of the given frame
4 P  ^  a/ V. T5 G! z* zsize have to show the same performance characteristic.1 c. ^6 p8 D1 a
2. The single pole short-circuit test with a current equal to 80 % of the
1 i  l9 R6 j- R8 |6 }maximum current setting of the instantaneous release and equal to 120 %( w- b- \$ k9 P) I  c5 e
of the maximum current setting of the instantaneous release shall be
$ c7 x4 d( c0 ~/ [; f; rperformed at any convenient voltage with the current in the main poles of
, T8 ]1 j" c! d( S2 D9 @8 Fthe circuit-breaker. The other tests required by the standard may be
' x" r$ _% `7 Kconducted by use of a simulated input signal to the tripping unit.
; R, f' v; f* t; n) }, S5 f
, u* `' T8 {7 k6 n: Y1 u  j3 B! D& Y7 V& a1 \

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