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[OFF] DSH 395 Separation of TNV-3 and SELV circuitry

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发表于 2012-11-6 17:01 | 显示全部楼层 |阅读模式
广东安规检测
有限公司提供:
DSH 3959 l9 b) [7 w$ s- x
3 y# G/ r* m( S* L) \: h. |
Separation of TNV-3 and SELV circuitry" |6 U7 r: Q5 E: P: ?
2.3.2
( e# l. m" F- H" T
60950(ed.3)6 v! x! b. G0 f- {0 f2 h
9 W. ^+ c7 a% B4 @( n2 M
Standard(s):
3 k: C( a, ~& j, O1 cIEC 60950 (1999) 3rd Ed.) N: A0 k- O) A
Sub clause(s):
+ ^3 p3 d- B# C& O2 u2.3.2
& z, m* D5 a- z' OSheet No.  Y# D( i5 I" D# a
3959 }# }  ?3 V) U1 }! [8 D( k
Subject:
# S. }. u: ?5 OSeparation of TNV –3 and SELV3 n. w7 w" u9 u% t
circuitry
. O1 {8 B7 _+ m- PKey words:
$ K. G+ @+ X/ N# u/ v3 n! k- Separation of TNV-3 circuit3 W! A5 Z) N. |  X! B7 ~& C
and SELV circuit% N9 [+ y$ g. `' {; S
Decision taken at the 39th
# y, B, N4 ?( B* bmeeting 2002+ W) {- S, B0 ^4 [. ]
Question:/ V* f) h% G. _4 o! f
1. Is it permitted to demonstrate that a TNV -3 circuit is adequately separated from a SELV circuit by
$ I* q; a1 O6 C) u+ B  _8 rmeans of single fault testing, in the situation where the spacings do not meet the requirements for basic
# O6 A. b; V4 {$ o3 k2 Zinsulation? (The dielectric strength test is still required under Subclause 6.2.1.)- l% t! L9 V' |+ X
2. If so, is it required under the compliance paragraph to short circuit the insulation between the TNVcircuit( }8 B& p& k9 N$ U; ]) f
and the SELV circuit at all points which do not meet the criteria for basic insulation, before9 }) u- O4 @7 m/ f: X# f" S4 Q
carrying out the tests?
4 I. F  L( Y) P3. If short circuiting the insulation before carrying out fault tests results in the equipment passing the tests,
5 L/ `" K& s0 v; N1 r1 M0 mwhereas carrying out the fault tests without short circuiting the insulation would result in the equipment
- _" f* U2 l3 u4 a3 kfailing the test, should the insulation be short circuited?0 J5 ^7 f- t# u% _  O  G
Rationale:
; A8 n/ M7 e; [2 J1. Paragraph 1 of Sub-clause 2.3.2 requires that separation between a TNV-3 and a SELV circuit be such0 J8 Y2 h2 x6 v- U7 A
that in the event of a single fault, the SELV circuit remains below TNV-3 limits. Paragraph 2 of Subclause
9 Z( ]9 n" h* ?0 a$ ?2.3.2 states that basic insulation will achieve this, but other solutions are not excluded.
' P, R0 X6 Q* f( H: g4 OEquipment is not required to meet either Paragraph 2 or 3. It can meet the single fault conditions stated
# `' T: \4 c# R0 s4 _: ~# vin Paragraph one and in the compliance paragraph.9 i9 T* V7 f7 {* T' s" W2 S4 w
2. According to the compliance paragraph, before carrying out the single fault tests, insulation which does0 i  q0 H" N) |
not meet the requirements for basic insulation is short circuited. Presumably this does not mean that
$ y2 T2 [- c5 {! R5 zshort circuits are to be applied between all tracks and components in the entire TNV-3 and SELV& D: l: S" H) c$ {2 v
circuitry which do not meet basic insulation, but that the insulation at the point where the TNV-3 circuit
8 [5 V! N$ k$ ?5 o' r% xmeets the SELV circuit is short-circuited.
. a4 ~) F% {7 y# B1 ~8 g, e6 q6 k3. It is possible to envisage a situation where short circuiting the insulation between TNV-3 and SELV
6 @+ P7 M# i3 N+ O5 ~/ i3 _  Fcould cause the TNV-3 voltages to be lowered. Fault tests under this condition would not represent the
1 y8 \& N5 C. J2 a) Gworst case possible fault condition# Q, V( Q$ ~6 t( d* X# t
Decision:
: N& C, C1 V% U' l: q7 a% `1. It is permitted to demonstrate compliance with Subclause 2.3.2 by means of single fault testing.
5 Q( g( [& v1 A1 L0 I$ m3 B( AThe limits in 2.3.1.b) shall not be exceeded in normal or single fault conditions.
. P0 @$ B, V9 p) S2. Before carrying out single fault testing of components and insulation, insulation between TNV-3 and
+ H* `0 ?  u. }  q' TSELV circuits not meeting the requirements of Basic insulation should be short circuited if this results in* ^+ z3 C! x6 m
a worst case voltage measurement at accessible parts of SELV and TNV-1 circuits, and at accessible0 t8 j4 O$ ^$ C
conductive parts during subsequent fault testing.5 D" A6 S; b  ?9 i4 ^" J
3. If the single fault test would be more severe if carried out without short circuiting the insulation, the test
( r* \+ z  n6 g# A; {  Nshould be done without short circuiting the insulation.
* k1 ^4 }  O0 e, I0 R0 q% U% o) u4 l. u

( H: X* G$ H: M" [3 p) a" U

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