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2 g0 M+ S# y# M, M& p | Capacitance
" x; k+ o% ?* r$ d | 6.3.1.3
$ W/ _9 {# N! O. y! ~* U | 61010-1(ed.1);am1;am2
" A' l5 `0 B* X | * \4 X/ T) {' m. p& F% k
2 b/ t9 f' s) U" a, [Standard:
@5 G& K/ ]2 [+ b) w" jIEC 61010-
7 S- y6 \0 w- ]+ u) k& x: b1:1990+A1:1992+A2:1995* {/ ^4 \+ e% ]$ I7 q. B
Sub clause:
3 \% [4 t# u1 T" c- f6.3.1.3
3 S' r7 i; L. @- m9 ^Sheet n. 302
4 Y' k; i$ N) KPage 1(1)! q' n* Y/ x4 Y% E6 T. b6 B
Subject:
8 i- M0 T7 F6 M& ]+ Q/ {* ICapacitance
( S- N) }7 [- n$ QKey words:
6 Z8 H& n& j$ V& k- o5 T- Capacitance$ E, `. f$ b9 H) `8 K# F$ t
- Charge
, B0 P7 w* }1 l2 r. PDecision taken by
% N7 k4 [- P9 g# h2 l( W, I: ^ETF3 and confirmed
) k( T/ n3 B/ O* W4 E. n2 Wby CTL at its 38th
' O5 Z% N# G: y6 _meeting, in Toronto
4 w9 j8 N8 e) S$ UQuestion:
# g" O9 z# c7 fHow can the stored charge be measured, in particular where the circuit is complex?
: \& z; x! r$ U& s0 R0 K0 C# E2 f" KDecision and Explanation:7 u: ?% I4 K7 ~( @8 L; L) e4 D) {
Only the charge accessible to the user is of concern under the standard. Therefore, where the
2 t- U; {0 b5 hcircuit is complex, it is considered that a method of measurement from the accessible part is1 \' W; v+ ]) L' c0 a' C
needed. It is, therefore, recommended that a procedure of discharge through a defined+ I$ o2 t2 ~% L8 G% q2 e. ]
resistor is used, monitoring the voltage – time profile to provide a method of calculation of
W3 g4 Q8 E6 G$ Fcharge." `! o: J7 r% D3 y$ Z" g& H3 ~. x
When this method is used it is requested that details are recorded in the report for the benefit
9 \4 T. d; w8 Y- Eof CB members.1 N$ b; c5 J, ~, w! [: K: h, q3 V
The method described in IEC 60950 Subclause 2.1.10 is recommended.
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