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; ~% `" E; u/ F# }* d% q, ~
' d6 k0 {0 o9 U" m" b DSH 302* l/ L+ i; x) y+ W' Y% G3 S+ {- F. ]: i# ~
| Capacitance
, Q; @8 k( `" V i | 6.3.1.3
2 Q C0 j2 V: L! E2 G( `! h | 61010-1(ed.1);am1;am2/ Q) ?- V, t! _
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- A/ [4 W# Y8 }$ t1 H' r# L- }( c) @/ D$ z/ s% D/ i
Standard:# q6 Y# G2 K% _ R
IEC 61010-
4 _8 ?' M# g% P* u ~" [1:1990+A1:1992+A2:1995+ }, I! y; {1 D4 P: m6 ?/ `5 v
Sub clause:( @$ |0 d9 F6 L
6.3.1.3
l" u& W! M$ D" F8 k! M: bSheet n. 302+ l* O0 t1 a0 e% [
Page 1(1)
* ^1 ]* U8 [: ~( k. {Subject:
+ Q9 A3 f" [5 ?; K# h$ a+ `Capacitance
( b. j- o* |3 n" i1 \Key words:2 z0 d+ n' d3 c! P: ]7 z) s
- Capacitance
' t$ c7 ~* b i, T/ T- Charge
# q; y6 ~; T$ L8 E; GDecision taken by/ c g8 D& d. ~7 d0 H$ O# V
ETF3 and confirmed
]- l" D/ E: C5 f& `by CTL at its 38th
/ ]6 V. R' q/ k2 h! hmeeting, in Toronto+ o; t) q6 s2 `4 Y: ?
Question:
* K8 i/ u0 V u% x4 L* jHow can the stored charge be measured, in particular where the circuit is complex?- }: G I, v0 V9 M3 o5 s
Decision and Explanation:
) C+ I) N& u4 o0 j9 MOnly the charge accessible to the user is of concern under the standard. Therefore, where the
- @# D& \9 L: U2 M& bcircuit is complex, it is considered that a method of measurement from the accessible part is+ _/ o& ^9 T, d, W n( R0 E
needed. It is, therefore, recommended that a procedure of discharge through a defined
" z2 l: k- _- Y2 y( L0 A" ^resistor is used, monitoring the voltage – time profile to provide a method of calculation of: @4 | H! Y* N7 x; J/ e7 S
charge.
% h, r u+ Q3 P4 E: _* DWhen this method is used it is requested that details are recorded in the report for the benefit6 P9 w9 }, B) i6 [4 P1 J8 u5 N- F+ E8 Z
of CB members.
; _5 F1 ~* J+ n( v4 [The method described in IEC 60950 Subclause 2.1.10 is recommended.
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