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0 Y, D8 U+ Y9 t- M9 L2 P | Overload test$ r6 \: W) |: g2 q
| 14.7.2/4.4.2.61 a8 m/ p& S% T2 P' O" D+ c
| 61010-1(ed.1);am1;am2
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Standard:
; s+ K) Q- B# _IEC 61010-1:1990 +A1:1992 + A2
* |" ]' s6 z/ P( z4 O:19953 a( l! D' M: c( h# b
Sub clause:
3 I. v" S! k h+ H% S14.7.2/4.4.2.6
1 ]* [9 r/ j) A/ D; Q4 D/ pSheet n. 368
) e, e) M& j7 P: bPage 1(1)* D# s- M; t/ F! i, R9 x
Subject:
0 f% B c, S7 }; s& fOverload test2 r! y$ f- G& s; a# [
Key words:; v/ V, n' L1 w& [0 g" r$ K0 l
- Mains transformer
& `& {% ~0 x; V. f# L- SFC tests
9 s7 ^( J0 [: f! FDecision taken by( f4 [6 ~* i3 B
ETF3 and confirmed
: K5 ~! P4 n9 H) W, d( R# y) _by CTL at its 38th
$ g* s- a+ M+ Omeeting, in Toronto
. W; d3 o. B7 I2 V- ` s% V2 K aQuestion:; O& g. _3 c4 {2 ~/ a# i( J; r
What criteria should be used when deciding whether or not to do the overload test as there. t B( p& l! Q, ^
seems to be subjectivity involved when considering the requirements?
- P* C+ P! m8 M# uDecision:
3 t2 g& R; O' k! v6 ^ wIt was decided that transformers should be considered for SFC tests (short circuit and
/ X% b) Q+ q: V$ H- E+ s5 y+ Boverload tests) under the worst possible scenario.
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发表于 2012-9-18 11:57
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