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|
|  DSH 253A& I! \6 o9 h1 \2 \6 G3 ^
) g& K( _0 e+ c: B5 L& k2 M2 R8 u
| Resistance to tracking$ @" l; O5 V$ ?/ m% G+ P1 z
| 30.3
3 |" X: B: Q, p1 o2 d( c | 60335-1(ed.2)2 t( m8 S6 o+ S6 i
|
$ L# v* O1 ~) U/ y* s/ E FStandard: IEC 335-1, Ed.2
1 f" [9 v# s* w6 g; FSub clause: 30.3
2 b1 n8 b4 ?0 R- T4 }" }1 h1 a. \Sheet n. 253 A3 F3 v% [9 [( q3 U. U' ~: d3 e' c
Subject: Resistance to tracking
9 N5 U* i j; Y0 T/ DKey words:
& ^$ ?5 r# Z4 Y- tracking
2 o7 U, q0 h0 SDecision 16 of 34th meeting/1997
) B1 q8 V/ \) ^, S* i& d( @Question:$ b; u9 `' i# F$ ]: Y; g7 k' E
What is the minimum potential below which a tracking path is not any more liable to1 L. _5 A4 Z% D! }8 \8 B
occur and therefore the test is not necessary ?
$ i& N/ {; ?; E2 A* DDecision:
% u+ v( c' x4 @: x5 N4 Q. J0 ZBased on subclauses 2.9.4, note 1, and 8.1.4, no tracking test is needed for SELV
, s3 }$ w4 Q5 x: \4 I" pand PELV circuits.
/ X5 K" ^+ B4 C2 i6 C+ n( G4 D1 r$ ~4 |' G& J C
: e% t/ }+ ~5 I: O8 E
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发表于 2012-9-14 13:47
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