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Standard: IEC 335-1, Ed.2 ; s9 {; q; K$ ?7 `
Sub clause: 30.3
4 N8 H8 D4 y$ k4 I& ESheet n. 253 A8 a. c6 i( r$ m+ n: F! \# T2 h; }2 I
Subject: Resistance to tracking
6 O1 t6 D, G+ O7 G% }# h6 v1 S1 [) Y9 HKey words:, t a9 b# ^. H4 `! E3 @1 z
- tracking
6 U3 g# ?2 P& u: Q5 D2 J6 `8 ^Decision 16 of 34th meeting/1997. R/ s8 K7 T( p8 ~1 K! |- }
Question:
% o9 ~9 w+ |7 N/ GWhat is the minimum potential below which a tracking path is not any more liable to& K3 q. y' o6 F: t1 ]% |* l
occur and therefore the test is not necessary ?& V7 ]; W- l# L! s3 A5 M' v
Decision:
4 t- u: i+ k8 U& dBased on subclauses 2.9.4, note 1, and 8.1.4, no tracking test is needed for SELV
/ i/ w, Y; S7 q, ?* ~and PELV circuits.: ^4 C z3 I6 A T2 q
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