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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
( q& }$ b8 ]# l4 G/ y
, m6 H* m- w3 o/ U/ p' A8 RPage 9
: P: ^( q4 c/ X1 Scope and object7 u9 L/ ?1 R1 S) U8 U
Replace the title of this clause by “Scope”
5 d, o2 G- W9 Q1 A; b) }" P1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.' o3 h* T) z$ F4 K2 K: m4 |
Page 11
2 y0 J% }" ?2 P+ X2 Normative references
& ~" U( \5 C& JReplace the text by the following:
! G0 r4 b% Z5 x2 i- r4 ^( I NThe following referenced documents are indispensable for the application of this document.
$ H2 C, X, p a, nFor dated references, only the edition cited applies. For undated references, the latest edition/ f+ K, b$ K7 i9 [5 `& I
of the referenced document (including any amendments) applies.8 u- n6 E7 u% u' K4 c8 V
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:' ~" z& u" ]/ B) T- i2 L1 i
Electromagnetic compatibility
; c+ M- m+ O% \- Y2 s; t6 S8 G7 s. N& F' N- m4 l" _# n
: ^# m f( M: K, b; o1 |/ y8 T1 o( ]CISPR 14-2 Amend. 2 © IEC:2008 – 3 –* t6 ?9 Z" F1 v; V: H1 B- d
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
( H' V9 t% z+ [- fmeasurement techniques – Electrostatic discharge immunity test1 g$ y! ` W! L% L
Amendment 1:1998" u& u' |4 N1 ^; i+ Y% S
Amendment 2:20001
, |. U% {, l" I+ e8 eIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and7 L1 |8 p$ F1 l% K" ^
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
8 @* X- ~. m/ r5 l) JAmendment 1:20072
' F" S: Z$ N" [+ o" g4 uIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and. g9 S5 J/ h3 M2 I8 X0 c9 W. O7 P4 T
measurement techniques – Electrical fast transient/burst immunity test7 X3 L# C9 ]+ E0 Z
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
# {5 \4 h2 e0 @$ ~measurement techniques – Surge immunity test* w0 {' w' B6 E0 l- @: l7 S: g1 k7 _/ L
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and: X$ `: K! m6 `0 Q O3 e
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
/ C" Y- L7 Z# Ufields
* x) I: m0 A' rAmendment 1:2004- m. \0 @4 Y+ j0 m% c. ~0 ~
Amendment 2:20063% z1 J: C7 E/ d4 @8 r# w
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and2 I- z3 |1 I. a3 s7 P; D
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
7 i! Z( P# t$ O$ O& L% |CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,* ~: @/ E4 E! n* g7 D4 c+ l0 Z/ x" K
electric tools and similar apparatus – Part 1: Emission. T6 ~" Q, a" G* P& U
Page 13( }0 b$ ^ c1 o' e) @
3 Definitions6 @) o9 ~$ D3 y7 y
Replace the title of this clause by “Terms and definitions”.
8 ?/ S3 v3 r& SReplace the first paragraph by the following:
- z1 a; o, x' j9 y7 y$ R; eFor the purposes of this document, the terms and definitions related to EMC and related
* D9 H7 q( r, w, S! ?phenomena found in IEC 60050-161, as well as the following terms and definitions apply.9 ?$ Z6 G: s8 ~& m( _
Add the following new definition:
: Z9 [! j- [$ n g6 U5 w# f3.18$ n: p( `$ s- _# A+ m5 z- ^2 `6 [4 h
clock frequency$ g& L# B8 n; \3 z8 Z$ S) g
fundamental frequency of any signal used in the device, excluding those which are solely; D) u& E* _# |
used inside integrated circuits (IC)
) P" s; ~; _$ Z6 g& \NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
. Z4 y. E( {8 M5 `from lower clock oscillator frequencies outside the IC.
/ N* a( B' ~" d% X2 u; E___________
( ]7 R: q& e, h1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
$ [0 N, I. Q( ^9 L( y2 m/ H% b2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.2 F# [9 E2 S6 D6 D, x: B
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2. m5 a. w) H4 B( [0 X+ ~4 r
3 K) R% \- w0 ~2 l E1 b, V8 A+ J9 E
9 j Q+ a4 E0 _. Z& ^! V9 F– 4 – CISPR 14-2 Amend. 2 © IEC:2008
5 Y7 G0 R% r; `. j9 lPage 13+ _ N# _2 g& f8 W/ z/ m
4 Classification of apparatus9 M5 S: F& S( X) Q+ j+ @
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
7 d# C' D _4 V. a1 R5 FPage 15$ M7 d( w7 M/ i
5 Tests6 Z1 H% X7 K$ p$ t
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.# A; a( L: F* ^. G6 G
Page 217 E$ E" B" {, C" O6 n! F
5.6 Surges; D# _2 u; ~4 `
Table 12 – Input a.c. power ports
3 p' g% u( w* g4 Q1 IIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
7 E3 f& _ ]% m# S' k r"Line-to-Line with 2 Ω Impedance".
; C1 f9 H, b: q, \After Table 12, add the following paragraph as a new second paragraph:+ t) C1 q- L l! O
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
: l" I% R, h9 `9 D: Dequipment under test, and the negative pulses are applied 270° relative to the phase angle of- x- Y, Q7 L/ d7 r+ `, X: z
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
- E3 e" {- T& ^( J1 Q. s. ]7 Ugiven in Table 12 are not required.6 h& F% A$ B7 r6 v! f
5.7 Voltage dips and interruptions* n B+ U3 k. ?
Table 13 – Input a.c. power ports
* ~" }: v Q6 E, E; I' \; iReplace the existing Table 13 by the following new Table 13:
0 g0 d) u5 O/ Z- o+ h7 |% i6 W* L0 JTable 13 – Input a.c. power ports+ y6 k! R0 S- i7 K4 P$ [
Durations for voltage dips) L3 W$ L" ?# D4 w& z
Environmental Test set-up
# A" j+ u, O' J; v4 c1 L9 cphenomena
9 m; {' s1 V, b- J$ G) x( lTest level
9 Y$ I& d1 i- Y' u$ \0 B0 o' xin % UT7 b) ]5 f8 [" S: N
50 Hz 60 Hz" v" I- @* q1 Q7 |$ |2 t0 k7 z
Voltage dips
* I# U z" `" o. ^6 Xin % UT8 u# b q) V2 U: {
1004 f% k7 `! Y+ v# G8 V+ R# z2 j
60! o" g) W5 ]) M6 Y/ ?
30& v. Z/ j: y( L. f3 @" T
0
- f1 u/ I) r8 S7 l4 z; x40 Z' X. y5 F4 ]' x& g
70- t' k; E3 s, [5 \
0,5 cycle/ B, V& X, ~/ h) u" e8 A) l2 e
10 cycles
" n5 D* |0 k' e- u6 u! x25 cycles
6 M T4 {7 P, s9 P+ z7 Q0,5 cycle
4 |; |% Y% q! `9 j2 F+ y& s12 cycles
, K# F% f2 \( O7 W3 n7 S30 cycles3 ~4 Z3 r0 a/ s; I
IEC 61000-4-11
1 ]; N" t/ J4 a O1 G% _* Y% ~* bVoltage change shall
1 k7 l) S! ^. p- Xoccur at zero crossing* ?/ I: Q/ B) n: a8 | g
UT is the rated voltage of the equipment under test.
2 N. P! T0 T- e& U
$ c& X Y1 Q! A: b2 ~; f
6 j, J; P) a' [% |6 D& VCISPR 14-2 Amend. 2 © IEC:2008 – 5 –
: P0 b8 @% K( J+ j' v4 ^1 c7 z4 IPage 27
' v4 N9 _5 q* e! }! F8 Conditions during testing
k3 @9 u2 k& V- r8.1 Replace the first paragraph by the following paragraph:
: e# Y, ^' A; H+ f$ xUnless otherwise specified, the tests shall be made while the apparatus is operated as& r# H0 Z2 X; z2 x" @( k' e3 k' a, x
intended by the manufacturer, in the most susceptible operating mode consistent with normal" Q( Z2 F9 k) j7 U3 h7 ]2 d
use.6 z3 [1 G/ q6 g' ~& @$ O
8.4 Delete the second sentence.9 E8 u9 u. O5 {; f* y# h0 D) S8 m7 B
8.7 Delete this subclause.7 s" P7 W7 _) E D
8.8 Renumber this subclause as 8.7
$ r& ]$ y5 F; o3 L/ ^/ f$ DPage 29
) x! G* c. n9 o# D9 Assessment of conformity( _6 B6 ], F3 l8 y$ u
9.2 Statistical evaluation
, M$ |7 m/ o! i. a/ n# nReplace the existing Note by the following:
# _1 c# I$ s: @% w1 D8 z" UNOTE For general information on the statistical consideration in the determination EMC compliance, see/ {2 B5 E+ K. A6 A! [( t
CISPR/TR 16-4-3.. Z4 ~0 {; A) ]
Page 31' k0 D5 y4 U$ g4 \
10 Product documentation
& U$ n( | d" Q1 _" n" k, V: U KDelete this clause.
! E. ^ w' S* N7 o) kBibliography9 ~; M1 Z% ^# w( U4 p7 { H
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:) T& v1 r2 g, k3 j5 O6 K
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
6 |7 ~1 l$ t0 P5 x; A+ Kmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in" @- |3 h2 s3 Q- p
the determination of EMC compliance of mass-produced products (only available in English) |
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