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IEC (EN) 61347-2-3 - Year 2004
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" E* c, @0 P9 U3 y5 t# `: A+ O8 _GB-19510.4-2009
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. v& P) P% N1 `/ ]Clause 17.1 5 g, ]7 G% W: E
4 [, ?) Q/ e# K2 F' W" x# J17 Behaviour of the ballast at end of lamp life/ ]2 Y- G k8 @; p- a
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17.1 End of lamp life effects
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# o; ~- ?- m( ?% _* o$ ?. pAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.
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n8 s" _6 \# u! H% J8 l7 b6 E For the test simulating end of lamp life effects, three tests are described:
7 B( U' `$ ?5 x8 `5 i- ^a) asymmetric pulse test (described in 17.2);
; T1 Q5 |0 k" z5 p; y% Y' ]) cb) asymmetric power dissipation test (described in 17.3);. N& s, I& S0 I1 @8 [" Z
c) open filament test (described in 17.4). 9 i/ k- t/ R/ {$ W
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Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
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$ h3 c- k$ E/ |. E! j2 R NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.) C% k' d' m$ \ [4 t& y
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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