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IEC (EN) 61347-2-3 - Year 2004
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GB-19510.4-2009) D8 b9 b: | x# u/ u
http://www.angui.org/read.php?tid-65084-keyword-19510.html
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Clause 17.1 ! p7 q/ [% \3 r9 ]- V, r" _1 j
4 b8 [. N0 @% l/ e6 n5 n17 Behaviour of the ballast at end of lamp life5 j! k) @. ^. }, F
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17.1 End of lamp life effects
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' S. O/ q `2 }# `, Y4 MAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.. L6 M' G& a. i5 i1 P& M) @3 R% u$ v
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For the test simulating end of lamp life effects, three tests are described:
/ r6 w) i% U7 m2 ^$ F' G+ Na) asymmetric pulse test (described in 17.2);
8 Z* I6 l) b3 l. M0 k; `b) asymmetric power dissipation test (described in 17.3);& b8 ]3 T: S8 c/ C6 F6 d' u
c) open filament test (described in 17.4).
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; L5 d! z6 }4 c, R2 k' A4 k/ h( kAny of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.4 W+ ~: W/ f$ w" Y) k/ ?% g4 h
: [# s6 z! h2 K* P' m; A NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.6 z4 T* x) X2 r9 | m
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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