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1. 2.1.1.1 Access to energized parts; d! W: R8 A, H1 G, h4 O* W
− bare parts of TNV CIRCUITS, except that access is permitted to:
5 ~8 w+ ]! U/ ~* N6 F% a• contacts of connectors that cannot be touched by the test probe (Figure 2C);
, @: r. G8 m2 I V- l" N' R# r- a4 ?d) A test with the test probe, Figure 2C, where appropriate. 标准里面这句话以下有说明。
4 N& v# f0 p1 }1 K
) v8 r! _: b' C( R" f2. 6.2.1 Separation requirements
/ ?: v1 ?8 _; t1 i* S0 t5 |9 ob) Parts and circuitry that can be touched by the test finger, Figure 2A (see 2.1.1.1), except
$ |0 m, P( S2 y( ]( Mcontacts of connectors that cannot be touched by the test probe, Figure 2C (see 2.1.1.1).其实就是上面的。 |
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