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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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Question
4 B R( ^% X. p/ {How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
5 }. D& k* X$ X* B7 C60831-1 for shunt power capacitors?
8 ~8 m# m4 y, ?Decision4 }1 j0 e1 y7 d: r- @
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
# {6 f8 U; z7 s* ?. n$ ` Rtype test schedule shall be applied:2 s% I/ K$ x. j+ l5 ~
Type test schedule:+ v, K7 |- k% x3 g9 @( {) u! {
Tests Subclause Number of samples to be inspected
6 V E7 k! u8 c ~Single-phase, h; ]4 o' I$ [! b
units' g& r6 c, j8 M3 g' h9 B( T. B
Three-phase units I2 @. i% f, p, c' C5 i& c" k0 n6 _
≤ 10 kvar > 10 kvar& a: s+ U! E5 i
Thermal stability test 13 1 1 10 J: Q9 X+ h6 y5 e( w4 f$ b: P
Measurement of the tangent of the loss angle (tan δ)
; y, f. m2 T" g$ b# S, xof the capacitor at elevated temperature* z( @( s5 v0 N" I$ ?* p
14 1 1 1
, c; }5 C5 s, FVoltage test between terminals 9.2 5 5 3
1 |# C. m @* ZVoltage test between terminals and container 10.2 5 5 3
) O n1 N4 p7 s/ z' YLightning impulse voltage test between terminals and+ N1 ?) v7 _) @+ N1 ^# A. u
container
- Q: g) ~- H4 [# Y) Z/ L" w/ b15 5 5 36 r* ?, Q: {3 R/ S- b& \
Discharge test 16 3 3 3, v+ G) ]: p B0 n2 H$ w3 Q% T* f
Ageing test 17 5 3 2: f( e' S! }$ c" y. y8 ]
Self-healing test 18 5 3 37 }8 a7 P7 V# ~# z& ~* N0 m! p
Destruction test 19 5 3 2
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发表于 2017-1-7 11:22
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