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Question: M) [2 M( x$ _7 G* [
In which way shall the temperature rise test be carried out on a device composed of two or more* h0 n8 g6 k3 W' C6 V
switches, having the same or different pattern number mounted on a common body?
) T3 ]9 a3 y. Y! j& b4 t+ ], g3 d% GThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable6 S" L9 @2 E' ?" x# k; P* O
in different ways in clause 17.1.4 S/ ]( Q: }) W7 C$ k5 a
Decision
: D9 g, q2 s: k7 NThe temperature rise test shall be performed separately on each individual switch on condition that it
2 _! I' u8 H! |( xis a single-phase switch.8 \1 D7 ? f& ]+ ^
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