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" w3 ?3 M) V6 v, j% d/ K. o
) [4 A z3 t4 C2 Y6 n# ?+ q
| Capacitance
4 b7 b: v6 e9 K% B( \7 a | 6.3.1.3; R$ k0 S, {6 k4 k7 W0 [
| 61010-1(ed.1);am1;am2, k# e8 {6 U9 s# }1 T9 f
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Standard:
1 [7 r0 O& ~. [2 aIEC 61010-! B" E: G9 v4 V& ?( g1 Y* h3 d' J
1:1990+A1:1992+A2:1995
7 }# U/ L, ^6 { N* y6 ~Sub clause:6 |- U: K T6 g6 P) a$ L
6.3.1.3( [ s% C5 c, X6 \2 t
Sheet n. 302+ F/ y, L8 L& u- c( D7 X. Z
Page 1(1)7 d4 B( u7 E( Z9 G
Subject:
! U7 D% H5 e9 p, S. k, x9 }' s8 ?9 uCapacitance# ?$ O# t3 B) P+ H* ~% Q; M
Key words:) {5 r% v! x9 l0 }9 t1 L4 U
- Capacitance3 K( P- G1 ]8 W2 N
- Charge' ]( V0 p9 o3 ~" v1 M% @5 x
Decision taken by/ f1 U, [. J+ B, H$ A! A
ETF3 and confirmed
% D4 E' t) f M$ Q, ?by CTL at its 38th( m# v, n$ L0 i! i* i8 @
meeting, in Toronto
' b* D+ q7 s! j' B4 YQuestion:4 A n" Y ^8 o
How can the stored charge be measured, in particular where the circuit is complex?
9 }! u3 H2 C I% z1 DDecision and Explanation:- _6 E6 [0 ]3 z) i0 n' j
Only the charge accessible to the user is of concern under the standard. Therefore, where the- h" X4 e9 {# S: e/ S- M7 E
circuit is complex, it is considered that a method of measurement from the accessible part is* [: |' ?: C S0 s4 H7 N
needed. It is, therefore, recommended that a procedure of discharge through a defined
8 K- o8 m1 j: _) e/ Q+ Xresistor is used, monitoring the voltage – time profile to provide a method of calculation of/ r. w& r# q5 O" y: v* q. W# r/ E
charge.
6 N' H' ~) {9 @" @1 SWhen this method is used it is requested that details are recorded in the report for the benefit/ D. F" s+ b' {$ Y3 C
of CB members." D8 ^7 ]( V+ A% c$ w a
The method described in IEC 60950 Subclause 2.1.10 is recommended.
8 |" b1 g7 ^* w) Q& {
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发表于 2012-9-19 15:03
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