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|  DSH 253A
2 z& b# y8 y) c& n' k
+ T: k0 Y$ ^$ q! i3 e5 G2 h; r; b | Resistance to tracking
/ D( n/ q1 @4 l: `7 D) l' ? | 30.3
( i( U% K; b7 Q | 60335-1(ed.2)
* @" V7 _ o# Z% ~9 _7 r; E2 y- i |
/ {* S. B3 q7 i7 k! g! k
Standard: IEC 335-1, Ed.2 ! ^: v; f+ L0 h4 g
Sub clause: 30.37 P% j; c" S3 ^- X% P! R
Sheet n. 253 A
]- P3 \6 w- JSubject: Resistance to tracking
$ [( V6 F% B8 Q& D$ rKey words:4 R; L( q3 C, ?) V- w% z
- tracking/ `- {( L. n7 P4 b7 q5 r+ [
Decision 16 of 34th meeting/1997
% _, V5 H6 |5 }. }+ q' ]+ @. \Question:
( e, w; i9 V H, YWhat is the minimum potential below which a tracking path is not any more liable to, I, z3 u9 y( e8 L3 C8 [" k5 y8 n
occur and therefore the test is not necessary ?3 x* u( S" {4 H8 K: J7 i
Decision:4 P, p* y% u3 q- E
Based on subclauses 2.9.4, note 1, and 8.1.4, no tracking test is needed for SELV9 }2 w8 L' Q h% y$ @& R" J9 Z
and PELV circuits.$ C5 X" s6 A' }$ y# {7 g
( P) I6 N* ^; t1 B
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