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NMX-J-191
8 K A2 D, q% t5 N2 H4 A5 b! r, wHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical+ w- y0 {- u' s! v$ e
Conductors – Test Method
9 @/ J" `2 X$ t0 ~) j; I2 {9 f5 c! R7 q
' ~7 A& M3 G b+ R$ Z5.1.3 Deformation
: W8 |0 k. A. P8 z! T/ i5.1.3.1 Insulation7 o6 Y6 E" g: `# l, Z. F! I
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
1 o- {. e$ x* r$ c* bparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
& l( Y) M7 g3 t$ X& [0 D9 r# ^mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.
6 ^- q8 i% w0 ]" R! B4 L w2 [: P5.1.3.2 Jacket; @: B8 l( ^0 J, _2 U) D% j
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in5 M: C* d( w3 O& |: o% _2 H; v
thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature6 g9 X3 [5 _' @1 }
shown in Table 40 for 1 h.# g9 i9 e/ E0 c3 V. A+ a
5.1.3.3 Method/ r; ?8 I: X) o
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
1 V# H$ e$ F# P9 A- ?; hdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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