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NMX-J-191- o% a3 x* A" Q* Q2 J) a
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical. O: \; i8 s, s2 Q0 L5 W8 f) D+ T& p
Conductors – Test Method* _! ^% G7 m/ q2 `
# V7 E. S# D1 y' b) g& P* Z1 H7 ?! b& F- ~. h* l, C0 p' S
5.1.3 Deformation& D- [9 x- m2 N- r
5.1.3.1 Insulation% s2 _0 G7 y( H5 z* D: p& u/ b6 I
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
" F* Q* }) z' [& {3 ]6 eparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a: { a8 ^; x2 ^! P% y+ j
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.: m$ N! o( a" o2 F
5.1.3.2 Jacket
5 A# C: L( }1 @0 W5 a d# V/ eSmoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
! J6 l; Z8 N7 E1 E W7 I$ vthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature6 o& Y. K) v z9 I! x; Q* g
shown in Table 40 for 1 h.1 r) `$ J- E& C6 g
5.1.3.3 Method- \% u4 n V! j, T
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method, |2 m* b* C" n9 M+ @8 m
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.' N( P% z& Z) O& y
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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