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NMX-J-191
! b5 q' I, `! W* D r/ G* P$ lHeat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical6 c8 k+ e" F5 q$ I' d: j* z
Conductors – Test Method+ p% J$ _ }; n3 C
9 s x: S" W. W
" T% l$ c3 B; i2 `) y% }' \5.1.3 Deformation. C) M4 w o8 v, {( g7 h1 q
5.1.3.1 Insulation
+ S) r: h' a; [The insulation on single-conductor wires, and on the individual conductors (separated, in the case of% B0 u) t- d8 h3 Z5 Q8 g
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a8 J$ m- p$ h% F& z! T* [
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.; l4 j7 K, t, X; L! r8 \8 ]: W
5.1.3.2 Jacket
6 m" Q) e% D% D7 t1 @" aSmoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
* o) o, i1 W6 T. `2 lthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature6 P$ R( C0 B* c8 n
shown in Table 40 for 1 h.
; x& G; `0 p* i) b5.1.3.3 Method% \) R( F f) i' t
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
) T5 Q. V, o) l- Q8 G3 r' Q4 Cdescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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