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Question5 S( |- {2 L* y# D! F
In which way shall the temperature rise test be carried out on a device composed of two or more
. `5 R1 O4 g/ {/ }5 h# p2 d* N' U L8 `/ iswitches, having the same or different pattern number mounted on a common body?3 x" R. l" k! N8 f
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
0 f& o$ M! R' u5 \# Z# u! tin different ways in clause 17.1.4 X. V8 i5 ~6 m: ~
Decision* ?: N9 g7 I% T- z$ ?
The temperature rise test shall be performed separately on each individual switch on condition that it4 V! m+ f6 U$ ^ f! n+ l
is a single-phase switch.; {+ [& Y9 |) d5 b% F3 K
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