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由于我的标准上有公司名字，就不直接贴上了，差异部分如下3 ?7 f! ]! m1 ^7 |
7 s3 c8 e" f2 K+ N- g6 @" V
Page 94 j& r( a# I: k
1 Scope and object: h4 D7 z# P" y, y
Replace the title of this clause by “Scope”4 S, Y( V. D9 a% k* p8 p" y9 \! a
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
. s* D! U. C, ^9 OPage 11
V2 }$ Y4 d& P& t) [$ C4 P2 w2 Normative references' N$ y9 k% s1 L7 L& ^8 a7 P
Replace the text by the following:$ _4 D# P) `; c2 i2 Q' W
The following referenced documents are indispensable for the application of this document.# t# @; }6 s( t5 U/ r: y
For dated references, only the edition cited applies. For undated references, the latest edition
, [/ k/ K4 _) V/ n' [0 i3 L; q" Vof the referenced document (including any amendments) applies.
% u! q5 Y* o; EIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:4 Y9 |' g: |( t6 Q& D! b- m. T- p% |* Y
Electromagnetic compatibility
7 u/ \+ T- k% I5 ^" h+ c" L" O8 T* }% x
+ V" j& U0 p, e* T4 eCISPR 14-2 Amend. 2 © IEC:2008 – 3 –
+ y# P6 [ ]- q8 G4 i7 w$ u4 S; eIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and+ y; s, O( n8 R; w) S: d" F
measurement techniques – Electrostatic discharge immunity test
0 L+ h$ K+ ^+ o7 [" L; O# TAmendment 1:1998% F% E% v- u' b# i F
Amendment 2:20001
/ l! w( z, Q Y; JIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and* S/ Y9 Q. D3 `1 |- O2 Y" | A- V
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
) N/ I+ {7 b/ P% Y, k) S5 f9 mAmendment 1:20072
+ w J/ N5 j% ?- b% [IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and; Q9 F7 A3 J& c g, [" g
measurement techniques – Electrical fast transient/burst immunity test' [ C7 J" e2 o& L
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
( k& O/ X: S8 L0 y7 H2 ^" Omeasurement techniques – Surge immunity test
6 z+ s/ {) ?1 M; p2 C' iIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
" d% X8 E6 E; umeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
/ v$ u! ]% E) V V& N+ a; H; Tfields1 G8 w ]) J* a; |1 E
Amendment 1:2004& }* j2 [* ^0 U; a. A; u
Amendment 2:20063# M% Q; C6 m- m
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
% V( ^3 U- i: b# X# T9 xmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests" T. s8 y1 v9 B$ F `) i
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
8 p% p z+ Q5 gelectric tools and similar apparatus – Part 1: Emission$ R/ J5 ^, w+ v; T" v* v) m" O
Page 13
, Z( Z- B# a4 F/ J3 d3 Definitions
$ z3 E) t- ^$ v* X& JReplace the title of this clause by “Terms and definitions”.
- p* s/ u9 _+ v1 K$ IReplace the first paragraph by the following:
. c9 h7 Y. @, u& o& s' D( M1 HFor the purposes of this document, the terms and definitions related to EMC and related# j9 W6 {# d, h" U- Q" S
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.9 R- s! t1 o' G3 e: D, @
Add the following new definition:; D4 Q0 Z) [; n& @( @8 Q) y
3.18
; \2 b; ^; Z% B4 fclock frequency
2 T& s2 H+ I/ Q; X" |( zfundamental frequency of any signal used in the device, excluding those which are solely
9 L# x+ u1 a1 vused inside integrated circuits (IC)
# {& L, k, F" G2 FNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
! a' n, e( Q, P* n; k; ]7 c& ^from lower clock oscillator frequencies outside the IC.- o( x( h* e+ v" f- x0 F" B' b2 _
___________; f) L6 X) J# X/ {
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
; [1 N- j: t6 F- Z. y( N- B9 n$ O2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.4 \( g$ o0 Z) Y! b
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.) o( H/ N! @) i& y" z
1 D/ v* e( y( a6 [) O9 @0 S- J
" b# x* L" Q. B3 X. ]
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
5 F! T* P2 j- F5 h8 TPage 131 s8 ]% n3 [; E/ I: U2 X
4 Classification of apparatus+ S1 ?9 z! @ m
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.* F- v% E8 b" @( U: c
Page 15' z+ r2 _9 U( M' C" i
5 Tests
& H0 h5 o9 h# @' kThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.8 ~3 \2 h+ _0 I2 Y
Page 21( t7 o% s- U9 E
5.6 Surges4 x2 h; A) p3 D4 \) e
Table 12 – Input a.c. power ports
/ S# k6 X5 \( v$ m- ~+ _" L* t7 w+ v7 pIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
C1 U, k f r T7 {+ y# m: J) P$ K5 Q"Line-to-Line with 2 Ω Impedance".( p, U+ n8 \, k. x9 V4 H3 s' s
After Table 12, add the following paragraph as a new second paragraph:
! u; G7 ?9 J/ H7 | |+ dThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the5 f; O2 E9 a& D. F8 c
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
4 `+ ?0 X( Y2 O& [) ~/ ?the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
7 F- _. p3 j& H7 l# Sgiven in Table 12 are not required.
2 [! X* z6 [) O# ^! f5.7 Voltage dips and interruptions
) {/ l1 E( m1 ?) oTable 13 – Input a.c. power ports1 W% L0 x, S: ^
Replace the existing Table 13 by the following new Table 13:
; i- C6 P+ q9 L/ E; q, z' UTable 13 – Input a.c. power ports
# x1 k" {6 ]! F8 [7 S K- U% i# z2 c4 P! FDurations for voltage dips! X) C. h! E4 O2 @: Z" a
Environmental Test set-up9 c# L2 \" C( k; b/ k! r4 I
phenomena) F7 L) l4 d5 C# y5 j8 O
Test level4 x/ S" `$ d- l% n" `
in % UT* t+ C0 b L; d# M
50 Hz 60 Hz: e/ h# z3 a8 s$ M2 a6 m+ C
Voltage dips: I# {. o7 h/ o- L+ S4 r
in % UT
# | k, M* K/ {9 u( F) |! L. N100, Z: M) @! ~+ W* u B- f
605 B! Y$ l" o# K8 j) d+ `! B0 h
30* M2 l6 L2 B# P+ k/ h: ]
0$ Z! _( s9 [! |$ _- m
40
}1 r. `# q, J$ ^; o! a; F70# J9 ~# V" N' n' X' L3 P5 @
0,5 cycle. ^/ G6 w, m" h
10 cycles
( \) u/ i+ w; C" g% V25 cycles
5 Z7 a6 i6 {0 c, k( f4 i% E0,5 cycle
6 _0 c! ]" H; r7 X$ }- h12 cycles
( k% p4 h3 A. j: H8 d5 P0 N. n30 cycles& r* D0 R T' J, W; q( m @- R/ ~. F
IEC 61000-4-11# y5 A% v2 |$ R( M- C
Voltage change shall3 m' ^; }% V, N4 e7 |
occur at zero crossing/ J7 P4 y% b5 I; [$ Z6 k% |2 Z0 |6 L
UT is the rated voltage of the equipment under test.3 K, X' X e3 B5 i
% q, Z1 l: P& `; H6 [
% D8 g- W/ | Y$ d J
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –9 a: {2 @4 g) J0 G, L4 D
Page 27
9 B$ j+ o) ]6 H/ D7 I5 m8 Conditions during testing6 S \ J# u* y, j$ g H" F
8.1 Replace the first paragraph by the following paragraph:5 g+ Z( v% h0 h. t) Y0 A
Unless otherwise specified, the tests shall be made while the apparatus is operated as! I4 P }' I# d/ c2 C8 p6 D9 _
intended by the manufacturer, in the most susceptible operating mode consistent with normal
) F0 t+ ^7 L! c- R/ X) q$ Puse.
/ i l7 @& B: |2 o! n9 L8.4 Delete the second sentence.
2 r [$ y4 V/ u7 ^8.7 Delete this subclause.
) v$ a8 n( D3 j" m8.8 Renumber this subclause as 8.7: Q: A6 g5 h9 c& ]' C8 T; G& n; p
Page 29
# p5 T7 J' U! ?) T6 g9 Assessment of conformity
+ [3 g% L# k9 ?: ^9.2 Statistical evaluation
, f8 h5 C8 T- t$ v. f5 pReplace the existing Note by the following:
k# I4 m3 ]7 l& r" WNOTE For general information on the statistical consideration in the determination EMC compliance, see# ` \7 H/ ~( E5 K
CISPR/TR 16-4-3.
9 ]2 u+ g2 h* I5 mPage 31
2 s ]- R4 n; V/ b* }2 W2 T10 Product documentation
7 S g5 e$ q; C8 u# r9 H6 MDelete this clause.' h$ g: x1 `5 e! @& n% n1 O. u4 M
Bibliography0 I+ w1 ~: ]0 c- c& M. |
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
. ?! u K0 `- E! I! \( KCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and' Z o9 a- s; Z# `2 ]/ ^2 F; J, W6 P
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
' Q. M- I9 t: _; wthe determination of EMC compliance of mass-produced products (only available in English) |
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