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NMX-J-1914 I7 y6 E8 C4 q
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
" H, x% t3 }2 J' Q7 E8 qConductors – Test Method, v) E, d% {2 O
$ g* p7 I: P( f1 f S( s7 g
j+ n* D$ s7 u) \' I5.1.3 Deformation
8 I% V1 T! \+ {5 g/ F& ]5.1.3.1 Insulation2 {. R: Y' {# I7 S4 [3 B7 ^5 h
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of
1 y, g4 F3 W6 G$ ^7 R1 Xparallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a8 H2 x6 b2 i+ f. L5 _- B
mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.& y# f: V3 h+ N7 d
5.1.3.2 Jacket8 X* A% g- c4 q; A5 Z4 f
Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
# u: y; N; x$ sthickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
4 w0 M% d# U/ a; l' fshown in Table 40 for 1 h.
( y( s4 o' Q# R5.1.3.3 Method! `1 p8 }8 w( x) c/ n# Q+ A
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method. s) Y: H4 {; V8 @( ^- @" A
described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.+ `8 a& b' d9 _) S4 n( b8 f/ X4 K
$ x7 m$ p/ k8 R: d
UL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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