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NMX-J-191$ [# f6 y6 w- e6 _1 H8 ^" S
Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical
* b/ N+ U B, g3 I+ ~: cConductors – Test Method2 c0 w6 X+ i2 W M
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" F; Z% j7 m. [$ T, k* r5.1.3 Deformation" x: U5 P2 D6 s. f! W' z
5.1.3.1 Insulation) S% U2 I5 _- D% C3 w1 T
The insulation on single-conductor wires, and on the individual conductors (separated, in the case of# B) x4 X, C" Y, l% F. e% S
parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a
$ ?8 }# m( v n% y! dmass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h.& d5 ^" q/ w0 e( m, ~! w
5.1.3.2 Jacket
+ }7 T3 U b0 z& USmoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in
' g( m, P" J( U7 S7 t' v$ Athickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature
! g4 f0 V% A7 Lshown in Table 40 for 1 h.8 C& e. G9 M3 |5 r$ O2 F! l# l( a9 ]
5.1.3.3 Method3 c, Y" l0 n" [: A/ @7 j1 d4 I
Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method
( r, |. Q/ w5 e/ m* ?( S. y! m/ ldescribed in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.
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4 U* S: @' G; S0 L3 D+ d2 D" OUL62里有要求做此测试的电线型号里,没有SVOO的型号! |
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