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| DSH 405
* {2 y, @9 J, l" c% h! [
. y6 W/ K. O1 t; p$ q | Leakage current in secondary circuits- Q6 V q& u! Q5 F+ x# s
| 17g)8 I4 R) I1 K" T0 H; f; E; v
| 60601-1(ed.2);am1;am2+ P3 t+ W. W% i: B- k
| - X' u0 `% S, Z5 W
Standard(s)- (year and edition):: _9 ?& ]% V4 X% E& V8 H1 ~
IEC 60601-1:1988 Ed.2 Am1+Am2: U4 P" J3 I. N- ?% C! h
Sub clause(s): 17 g)
O& `( E" n0 p2 H: P) d! YSheet n°: DSH-405+ E5 k# P# v) D& |* }
Subject: Leakage current in secondary circuits
/ Q v( |5 W+ z5 N) hKey words: Leakage current, secondary circuit: U# B. l) u" m) ~1 Y6 p
Confirmed by CTL at its 39th meeting, in Cologne4 l4 H1 e& _. C1 ^5 A
Question:
- l* k& s4 |' oIf secondary circuit impedances limit the leakage current, is further investigation of secondary
* _; W J4 E g4 s; W; p" lcircuits required? (refer to sub-clause 52.5).
7 \$ D* g, D4 WDecision:
4 m* |( k% m# I8 }Secondary circuits providing protective means after short-circuiting of inadequate AIR
$ s: e0 ~. C7 P1 T( V* jCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in
, v. }3 O n5 Kthese circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such7 y# a/ J! j7 [
components shall be investigated as a SINGLE FAULT CONDITION.
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