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不好意思,贴错图了,应该是这段话 r% H) T3 n: H; Y
D.1.5 A device employing a solid-state component that is not relied upon to reduce a risk of electric shock+ n# A& c: K$ @
and that can be damaged by the dielectric potential may be tested before the component is electrically" L4 t$ I5 o$ z* B$ o8 v4 I; R
connected provided that a random sampling of each day’s production is tested at the potential specified8 ?: i2 a" r( J% o
in Table D.1. The circuitry may be rearranged for the purpose of the test to reduce the likelihood of; v. j0 c& C h6 x" c$ D7 Z, N
solid-state component damage while retaining representative dielectric stress of the circuit.3 n, R. N3 u9 I
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