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不好意思,贴错图了,应该是这段话, V" n! m. _/ R7 V! \
D.1.5 A device employing a solid-state component that is not relied upon to reduce a risk of electric shock+ X) x* j/ p$ C) x4 V
and that can be damaged by the dielectric potential may be tested before the component is electrically
+ T i& t3 k" Vconnected provided that a random sampling of each day’s production is tested at the potential specified: w, l, w2 R- r* }
in Table D.1. The circuitry may be rearranged for the purpose of the test to reduce the likelihood of
% C4 } _6 f1 j" d) @6 k+ |3 }solid-state component damage while retaining representative dielectric stress of the circuit.
" a4 ]" c1 I {6 f* q |
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