|
不好意思,贴错图了,应该是这段话
. [, W7 t, G( X* i P1 GD.1.5 A device employing a solid-state component that is not relied upon to reduce a risk of electric shock
, N$ i, H% G$ L- K% M4 Y1 O Uand that can be damaged by the dielectric potential may be tested before the component is electrically3 u# e- x4 ^: Q9 }. {
connected provided that a random sampling of each day’s production is tested at the potential specified
' x+ n& } D! w& g3 ]5 Qin Table D.1. The circuitry may be rearranged for the purpose of the test to reduce the likelihood of' ?0 J; s5 V; T4 z3 C( x
solid-state component damage while retaining representative dielectric stress of the circuit.; o' R0 v! Z& S; N
|
|