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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic' _( o/ }; j/ J. e+ i
devices in plastic luminaires! I8 c3 Q+ z) @' j0 D# G
The test applies only to luminaires with a thermoplastic housing not fitted with an extra
* ?- b$ F. P! y; ^6 {" r" X3 c$ Jmechanical temperature-independent device as per 4.15.2. ?$ G$ c9 o- f% T
8 f/ K' i) E$ ?( `; A1 Y _1 h
12.7.1 Test for luminaires without temperature sensing controls
2 c- J6 x" e/ I, XThe luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of! ~, {8 |7 U9 H4 _: `; Z5 ]$ _ ]* S
12.4.1. In addition, the following also applies.
4 [$ U, ?8 T# i% B- m" j20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be+ m p& q6 s" d8 R' _
subjected to abnormal conditions (see item a) of 12.5.1).5 L# U5 h- j4 f& c f, x0 R4 b
The circuits which have the most thermal influence on the fixation point and exposed parts
2 H* a! {1 X7 Eshall be chosen and other lamp circuits shall be operated at rated voltage under normal5 |$ O Q1 m+ _+ H3 S8 E+ w
conditions.$ q3 e% Q1 T" }2 t6 a' Z
The circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage- h. A$ ]$ |3 Z
or the maximum of the rated voltage range). When conditions are stable, the highest winding7 m0 f/ O* c0 D! l8 }+ O
temperature and highest temperature of fixing points and most thermally influenced exposed+ Y M" e3 g" g! M
parts shall be measured. It is not necessary to measure the temperature of small wound( I9 ]1 o! z: y6 J1 W2 p6 G" L
devices that are incorporated within electronic circuits.; f. I9 U# f7 d5 o
Compliance0 l" _/ |0 T6 V1 R/ H
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
9 y/ d, Z/ R6 x! i( Z! }voltage or the maximum of the voltage range) are used for the linear regression formula in
4 t2 o, }# W! k# t) O3 K- Scalculating the temperature of fixing points and other exposed parts in relation to a
) @4 p1 J8 c, Q, Y5 f; J( M( Lballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the
6 H0 D; F; t; b) J7 M Y* k) mtemperature of the deflection under load of the material in accordance with method A as" w1 Y! N r( H) O9 w% U/ F( i6 _
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection, Y' j& r9 J" @0 A0 H
under load.! l- E; x7 m$ B) r3 k) e
12.7.2 Test for luminaires with temperature sensing controls internal/external to the, A0 E# T* C. t/ n: ?: ]
ballast or transformer
: ]" `0 W% _) y, H- |. A# ]The luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.% ^. h2 ]- s8 b" M) r
; G* g5 L" D! b
The circuits subjected to abnormal conditions shall be operated with a slowly and steadily
5 h! }2 e8 u5 sincreasing current through the windings until the temperature sensing control operates.
; V! Q% ?4 E: n; n8 E- Q; W) Z7 OTime intervals and increments in current shall be such that thermal equilibrium between
* c+ z( q* z& v3 cwinding temperatures and temperature of fixing points and most thermally influenced exposed
% [9 {9 `; c0 P# P7 A3 xparts is achieved as far as is practicable. During the test, the highest temperature of the spots R5 a; j; r( ?. i0 T
tested shall be continuously measured.
6 `4 K! N" c4 @0 F6 J/ W) v6 z. lFor luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
& S# x" ]6 u* H! u8 E! E1 ?2 W- utimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out
9 W, B R: v. i8 [6 j7 z9 K4 bshall be reset.% J5 [( N2 C& l
For luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a! u6 ^7 U; x+ ^# M9 Q
stable temperature is achieved.& B) P* C# ?- f5 ~. e; T
Compliance
3 t" V- [1 { k1 R: nThe highest temperature of the fixing points and most thermally influenced exposed parts,
% C1 H5 T/ l5 R" zshall not exceed the temperature of deflection under load of the material according to the
! _+ Q% M, K. t6 \2 _" u/ e" zmethod A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
- o. q2 F4 B% \" g A) tthermal cut-outs, and auto-reset thermal cut-outs.
& n4 P7 S t# R4 ~ [% pIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:
8 S- C+ |& x% ]2 j2 mNOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the3 C H/ Z0 {! R% M2 H: k! Z* b
mounting surface.
N4 \6 l1 C3 Y2 n
/ {3 g; {( ]3 s- lNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.! ?8 X- k# F; F0 M% a% E! J) g5 j# ~
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or) r4 S$ M! ~- k+ l' u( t
parts providing a protective barrier against accidental contact with live parts, as required by section 8 of this# }- l3 S- k2 _# p3 \4 r" \
standard.
5 ` p) D9 k4 F: N( V* nNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on( B" q& c1 \8 T& J8 D5 B9 s1 z
the internal surface of a luminaire enclosure not the outer surface.8 }3 W k& s5 m7 a
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both' n' y# s$ m1 O& g0 ?: u
mechanical load and no mechanical load.
# F5 Y" ~. W/ ] }+ O% eNOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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