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Question; @ X% o% ?! \! X7 h S2 u7 V' }
The first sentence of clause 3.4.3.1 of IEC 60384-14 states: ”Capacitors of each technology, rated
2 o* h( o: a9 Z+ Y G' E2 L, }voltage, class and sub-class shall be separately qualified”.
3 p- |; ~: e) e2 d! ZIf it is requested to qualify a dual-class X/Y capacitor (e.g. X1:400 V, Y2:250V), is it permissible to; M! h6 I9 w0 r! f# R% D, ~ T! z: n
perform one type test only by applying for each individual test the highest test severity?1 \0 T0 k7 l9 D
To qualify a dual-class X/Y capacitor, testing laboratories may have different interpretations of this
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' H$ H2 ^6 N* ]. o: S: m4 ?: O# yInterpretation a): Some testing laboratories test the same capacitor series once for X1 and once for% y! d* K% i: S/ L+ L) c
Y2 at the same time in separate type tests.# X# r; j. x4 @5 |$ \9 `
Interpretation b): Other testing laboratories follow the opinion that the safety of the capacitors is also
# ?, }9 J# e% S! ^- p9 Rassured if a mixture of highest testing (peak) voltages of both sub-classes is used. This means worst9 S) d3 u: H% k8 N" ]: c+ W; r
case testing, covering both sub-classes for certification.
# Y- S. g; m6 p, |Both interpretations may possibly lead to the result of compliance or non-compliance of the capacitor,
/ s; ^0 p8 z6 p bas in a) more samples are tested and in b) a single capacitor is more stressed.7 B @, c9 d; q
From the technical point of view, it should be acceptable to perform one type test only by applying the; M) U) k- f6 P2 L* M9 m- k
highest test severity for each test.
+ n4 g% S" ]2 I% V9 `) @& rDecision
@8 W0 |* U" S* w& e3 Q& x$ N! iWhen a range of dual-class capacitors (X/Y) is qualified, it is allowed to perform one type test only, if
, b u+ t ?+ a9 F' xthe highest severity of the X or Y class is applied in each respective test. K7 {7 [; q2 s: p7 c2 z
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