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| DSH 541
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, t9 ^: _9 t, A" k' Z1 a% d | Transformer overload
0 ]3 m" T" o: U' m8 R0 M3 V7 D. D | 4.3, 11
% }. ~+ }0 D( l9 N | 60065(ed.6), E7 @( [( }0 x9 w. D
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/ Q3 _. N7 f: H9 q5 KStandard(s)-(year and edition):( f" k1 z& w$ k! O
IEC 60065 (1998) 6th Ed1 h% c, {7 o6 e0 `+ r0 n' V9 l4 l( j2 A
Sub clause(s):
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Dec. No.
! {# _7 F" b- i' G4 u! y% d) bDSH-541
9 k2 v# c- m4 q2 A CSubject:
z& R- Z% w, u& l, H' T: g6 eTransformer overload x% g" A$ U4 N1 }5 ~6 \4 l8 R8 i
Key words:
7 U! U% d& E2 n% J# e, Z1 t6 MFAULT CONDITIONS& R' [0 z( m5 @. j2 r. |
Decision of:
3 C9 U/ e* y5 i+ }40th CTL meeting /2003
, s1 g$ T1 L R! ?; R5 y3 eQuestion:
8 |, c9 S% E1 ^7 c3 T7 G$ P! MThe standard does not specify a transformer overload test, as there is, , for example, in IEC 60950.,6 e x' R/ P* |+ N" K* S
If it is obvious, based on engineering judgment of the technical design of the product, that0 {) a. v/ {* I3 V* M
due to a single fault condition (e.g. component failures, short circuit of functional insulation)
, r; M; x1 x5 k. [) g: t4 | t; w# wan overload situation on a transformer is likely to occur, which approach should be
2 F) r+ A. }, w8 I* q2 wfollowed?* @$ Q2 j4 H9 M2 \
1) The actual overload on the transformer shall be performed, taking into account the 'characteristics' of
0 k# }7 a0 _# B# e: T- Neventual protective devices.
4 ?5 }7 b. b5 `+ {0 L b; m6 j2) All possible single fault conditions shall be performed. For those situations where the protective! h) g- y. s( E! `, i( z
device reacts, the current through the protector shall be measured and the characteristic of the
( {9 {. @# Z/ {3 Y! r6 Fprotector shall be taken into account.0 ` q+ _$ e. C9 t
3) No overload condition shall be created, since the standard does not specify this in wording.8 S i* T! T" Z' p3 a" T% v; M, ^$ E6 j
4) Other possibilities.
! \+ U0 V3 T7 a) F8 K" sDecision:
9 [1 T1 d+ I4 `( r5 N$ K, lFollowing the standard option 2 from above has to be used.
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