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|
|  DSH 493+ I. `$ }5 L: b. z' N) z- ?7 d
% M$ ~3 O; {8 w. H+ a
| Abnormal operation& f. B4 f) l4 b4 |: l, e1 q
| 19.11.2! Q$ x/ P0 z) ^# }6 ~% v. F
| 60335-1(ed.3)
0 M" Y& U7 J9 q: A7 B& g0 ]# Q |
+ k# }3 U5 d8 A+ VStandard: IEC 60335-1:1991, 3rd Ed.0 s5 I1 F: N. }2 f! Z
Sub clause: 19.11.2
, F* j r2 p* a) X3 U5 mSheet No. DSH-493: C+ a Z# O( C) a% {, r! p+ M
Subject: Abnormal operation
, r$ \. |% T( G/ k; g3 dKey words: - Microprocessors8 ?2 @% n* s4 @* u7 Z/ ^5 u( ~
Decision taken at the 40th CTL meeting 20035 f' x* r& n6 \0 G2 t, k
Question:
y8 m# g3 a XShould faults be applied to microprocessors ?* k7 a ?4 F3 L9 B% [! C
Rationale:
* I K9 a1 d! ]5 h& }* n1 \See question.5 w j {" R+ c n7 z% } o
Decision:
6 p2 }: ]' X# G' U# BA stopped clock of microprocessors, is considered, as a relevant test, but only when the
$ M) Y, M% S( G( I# Z* Wclock is stopped after one interruption or short-circuit (one fault).
( F, K8 F/ h; v0 ~, h# I+ y% k" E' h8 L8 {
; d; B4 t3 ^8 \5 b |
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