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IEC (EN) 61347-2-3 - Year 2004
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GB-19510.4-2009, L+ c$ Q* ?. B2 Z, j- g* h, E
http://www.angui.org/read.php?tid-65084-keyword-19510.html
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Clause 17.1
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( N/ ]1 w F: s, e, i17 Behaviour of the ballast at end of lamp life7 z) K! y/ |9 |: j$ _' z4 e
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17.1 End of lamp life effects
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! r4 A5 _8 H4 D: tAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.$ q# b; t5 j# R5 j( X* a7 j
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For the test simulating end of lamp life effects, three tests are described: + X) k1 @4 |5 C0 O- R* R I" L& R
a) asymmetric pulse test (described in 17.2);7 Y+ T4 @* S$ `6 n: p2 k
b) asymmetric power dissipation test (described in 17.3);
% Z9 c8 y6 o. H8 n- n( o6 xc) open filament test (described in 17.4).
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: ~3 a6 o& V! |( Q5 ~, `Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
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8 ?; [0 {9 q- P- Y# w/ s- h NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.% M2 H# H* T$ X2 v0 W3 S
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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