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IEC (EN) 61347-2-3 - Year 2004/ r- y, f, N& j0 D/ [! t
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GB-19510.4-2009
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Clause 17.1 & U+ M/ h' J1 n* M5 o9 ~4 H" |: d
9 n% ]( V) K7 B5 j2 F9 k" {" i9 _17 Behaviour of the ballast at end of lamp life& m) ~( D2 b( V5 @! P+ |& m
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17.1 End of lamp life effects
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5 F5 C e; j% \! ^3 j# CAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.) v; m) G- m4 `' v, E9 ^( G- e3 N1 d
5 a! N. N! a5 @* y2 N5 G For the test simulating end of lamp life effects, three tests are described:
2 {" h# W9 b4 p, za) asymmetric pulse test (described in 17.2);
" g' G/ @; S4 b8 T5 P) B" G' ?b) asymmetric power dissipation test (described in 17.3);
) z h- n7 G+ _% o. yc) open filament test (described in 17.4). 7 i+ s0 A: j0 X0 i/ [
2 U# |1 u- d7 v; C, r# |: \" oAny of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
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NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.$ k9 r5 E/ `% d* b/ ?. C
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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