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仔细品读以下条款:
1 Z" U, e/ E. t W) o8.5.3 A device shall be tested as follows:
/ T- B! z2 B( E9 M1 H" f1 D7 |a) If the device is capable of being installed in the smaller test fixture shown in Figure 9.1, it; P L, j2 j! T% X; V q' D6 [
shall have temperatures measured with the device mounted in the test fixture that simulates2 n* L. _& t( W8 |: K
operation in a typical recessed luminaire. The device shall be tested base up.$ q9 p( z% K) a" o/ O7 K$ H- Y
b) A device that will not fit in the smaller test fixture shown in Figure 9.1 but that can be
1 _4 x3 L: e# Binstalled in the larger test fixture shall be tested in such a test fixture. The device shall be tested
* V m- K7 i% _# Pbase up. |
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