|
|
各位大神,% I; B" i5 C: t
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
# ~' ~ |" k' Y9 o- ~; P/ m" S4 a
7 u9 n4 i$ D0 H9 }% I6 K9 W
, o0 z3 d) c! r. B. I- |% O( K1 \4 g; x% y) l
18.1 Dielectric voltage-withstand' h$ X" Z0 e) h7 @
18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.. E- y& N U1 T% j( i9 j
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied7 T( X. E9 w( P/ k ~
between live parts and accessible non-current-carrying metal parts, including parts accessible only during4 A$ j0 `% N* N6 W5 c" c6 ]
relamping.' d" E6 O- n4 A
18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
, @; D3 S1 }7 v! |3 ?, c5 r! {the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
" n/ w- A& B* j8 m5 p1.414 times the AC potential denoted above.6 Q. `* |1 D4 N! A" h \
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
/ {, X# Q. \, }6 ^test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the% p" J; w& s& _9 h5 O0 O
ON position.
' m# a b9 m7 z9 w! D18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
' t: \; H: \. Udecorative parts not likely to become energized shall not be required to be in place.9 Y+ Q' e5 E' B5 e; h7 g" h
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
. M2 A$ M% k# `be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be# a3 G! c$ `! {3 N/ U2 S$ L
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while+ q& }8 G1 B5 n* T$ N$ z$ a
retaining the representative dielectric stress on the circuit.3 a6 f) I( w I, J
% _2 d9 O$ B+ M+ D5 d
|
|