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各位大神,2 k% P6 h; H1 [) }
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)# @/ P6 h1 Z. E @
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18.1 Dielectric voltage-withstand
7 o0 U& N0 F5 H- G7 N# K$ [18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.) F% r: m. A4 U- [5 b1 F: n
18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied- t7 X. R6 Z9 H$ p" b& m9 J
between live parts and accessible non-current-carrying metal parts, including parts accessible only during9 i: S/ z/ r* X* X7 I( s* H' A
relamping.
2 o6 G( a; E4 U1 x$ ]: k+ l1 `18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
' e* c) V6 Y' n& I5 H- z" jthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
( @( n$ W& D: C: l1.414 times the AC potential denoted above.- Q( R" \) E. M2 V9 `
18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required# G' R6 U- a+ G5 [& ?, a
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the7 F# ~. j! A! Z2 F' u
ON position.& \8 P2 t1 `3 v7 |
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
, e* x. s' Y2 \) Sdecorative parts not likely to become energized shall not be required to be in place.7 d/ J8 z# \" e9 W
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can. Q3 r' B3 @0 r5 N
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be6 C y8 a4 A3 |2 X% u4 h
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while6 M7 w3 X# e7 j1 W: a+ }$ f% ^
retaining the representative dielectric stress on the circuit.
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