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各位大神,9 P& {8 m. X; A3 \4 \% w
大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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18.1 Dielectric voltage-withstand2 K3 H# C6 w! {' ?! q2 W
18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
Z8 C3 a8 k, F ~! p18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied# ?# o4 U! ?, z+ Z
between live parts and accessible non-current-carrying metal parts, including parts accessible only during1 J8 |: K, L' k
relamping.
. g1 ]: a+ d! r# |0 z% g2 b18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice* l7 w* \! S* l1 L. |
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
5 N7 B; }: A2 V- N N) ]1.414 times the AC potential denoted above.
% k; R+ S; `0 l) u+ w x18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
9 y& }) }: l h2 ntest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the/ F+ P3 J, Y( V6 u
ON position.
* A: U, t+ ]9 C; V! m& e18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
# B4 C+ J1 S0 odecorative parts not likely to become energized shall not be required to be in place.
; v) ~( {1 D) m, z4 n% w& s/ p18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
; w& `9 w7 F1 K7 D3 f$ \9 F' mbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
5 ]2 S& ^, i- c" n+ R' N- frearranged for the purpose of the test to reduce the likelihood of solid state component damage while
* L! N; Q9 p* s( ]" `retaining the representative dielectric stress on the circuit.; _* r5 u1 T1 N$ s: k
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